WO2001067156A3 - Tunable fabry-perot filter - Google Patents

Tunable fabry-perot filter Download PDF

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Publication number
WO2001067156A3
WO2001067156A3 PCT/US2001/006676 US0106676W WO0167156A3 WO 2001067156 A3 WO2001067156 A3 WO 2001067156A3 US 0106676 W US0106676 W US 0106676W WO 0167156 A3 WO0167156 A3 WO 0167156A3
Authority
WO
WIPO (PCT)
Prior art keywords
membrane
pattern
tethers
reflector
filter
Prior art date
Application number
PCT/US2001/006676
Other languages
French (fr)
Other versions
WO2001067156A2 (en
Inventor
Dale C Flanders
Original Assignee
Axsun Tech Inc
Dale C Flanders
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Axsun Tech Inc, Dale C Flanders filed Critical Axsun Tech Inc
Priority to AU2001245386A priority Critical patent/AU2001245386A1/en
Publication of WO2001067156A2 publication Critical patent/WO2001067156A2/en
Publication of WO2001067156A3 publication Critical patent/WO2001067156A3/en

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/02Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the intensity of light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/26Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/001Optical devices or arrangements for the control of light using movable or deformable optical elements based on interference in an adjustable optical cavity
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S359/00Optical: systems and elements
    • Y10S359/90Methods

Abstract

A tunable Fabry-Perot filter includes an optical cavity bounded by a stationary reflector and a deformable or movable membrane reflector. A second electrostatic cavity outside of the optical cavity includes a pair of electrodes, one of which is mechanically coupled to the movable membrane reflector. Voltage applied to the electrodes across the electrostatic cavity causes deflection of the membrane, thereby changing the length of the optical cavity and tuning the filter. The filter with the movable membrane can be formed by micro device photolithographic and fabrication processes from a semiconductor material in an integrated device structure. The membrane can include an inner movable membrane portion connected within an outer body portion by a pattern of tethers. The pattern can be such that straight or radial tethers connect the inner membrane with the outer body. Alternatively, a tether pattern with tethers arranged in a substantially spiral pattern can be used.
PCT/US2001/006676 2000-03-03 2001-03-01 Tunable fabry-perot filter WO2001067156A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2001245386A AU2001245386A1 (en) 2000-03-03 2001-03-01 Tunable fabry-perot filter

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US18678000P 2000-03-03 2000-03-03
US60/186,780 2000-03-03
US09/649,168 US6373632B1 (en) 2000-03-03 2000-08-25 Tunable Fabry-Perot filter
US09/649,168 2000-08-25

Publications (2)

Publication Number Publication Date
WO2001067156A2 WO2001067156A2 (en) 2001-09-13
WO2001067156A3 true WO2001067156A3 (en) 2002-01-31

Family

ID=26882403

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2001/006676 WO2001067156A2 (en) 2000-03-03 2001-03-01 Tunable fabry-perot filter

Country Status (3)

Country Link
US (1) US6373632B1 (en)
AU (1) AU2001245386A1 (en)
WO (1) WO2001067156A2 (en)

Cited By (1)

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CN107171047A (en) * 2017-05-03 2017-09-15 电子科技大学 Ultra-wide tunable resonator

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6407851B1 (en) 2000-08-01 2002-06-18 Mohammed N. Islam Micromechanical optical switch
GB2359636B (en) * 2000-02-22 2002-05-01 Marconi Comm Ltd Wavelength selective optical filter
US6795605B1 (en) * 2000-08-01 2004-09-21 Cheetah Omni, Llc Micromechanical optical switch
US20020127760A1 (en) * 2000-08-02 2002-09-12 Jer-Liang Yeh Method and apparatus for micro electro-mechanical systems and their manufacture
US6797591B1 (en) * 2000-09-14 2004-09-28 Analog Devices, Inc. Method for forming a semiconductor device and a semiconductor device formed by the method
US6556338B2 (en) * 2000-11-03 2003-04-29 Intpax, Inc. MEMS based variable optical attenuator (MBVOA)
US6721098B2 (en) * 2000-12-22 2004-04-13 Axsun Technologies, Inc. Triple electrode MOEMS tunable filter and fabrication process therefor
US6721473B1 (en) 2001-02-02 2004-04-13 Cheetah Omni, Llc Variable blazed grating based signal processing
US7145704B1 (en) 2003-11-25 2006-12-05 Cheetah Omni, Llc Optical logic gate based optical router
US6509972B2 (en) * 2001-03-15 2003-01-21 Axsun Technologies, Inc. Tunable filter system with out-of-band reference
GB2375184A (en) * 2001-05-02 2002-11-06 Marconi Caswell Ltd Wavelength selectable optical filter
JP4306149B2 (en) * 2001-05-28 2009-07-29 株式会社デンソー Manufacturing method of semiconductor device
US6781735B2 (en) * 2001-07-23 2004-08-24 Liji Huang Fabry-Perot cavity manufactured with bulk micro-machining process applied on supporting substrate
AU2002352866A1 (en) * 2001-11-26 2003-06-10 Wisconsin Alumni Research Foundation Stress control of semiconductor microstructures for thin film growth
EP1451954A2 (en) * 2001-12-10 2004-09-01 E.I. Du Pont De Nemours And Company Wavelength division multiplexing optical performance monitors
US6818564B1 (en) 2001-12-20 2004-11-16 Analog Devices, Inc. Method for etching a tapered bore in a silicon substrate, and a semiconductor wafer comprising the substrate
US7370185B2 (en) * 2003-04-30 2008-05-06 Hewlett-Packard Development Company, L.P. Self-packaged optical interference display device having anti-stiction bumps, integral micro-lens, and reflection-absorbing layers
KR100489801B1 (en) * 2002-12-10 2005-05-16 한국전자통신연구원 Tunable wavelength optical filter and method of manufacturing the same
US7531842B2 (en) * 2002-12-20 2009-05-12 Analog Devices, Inc. Method for etching a tapered bore in a silicon substrate, and a semiconductor wafer comprising the substrate
US20070035855A1 (en) * 2003-03-03 2007-02-15 Dickensheets David L Miniature confocal optical device, system, and method
US6996312B2 (en) * 2003-04-29 2006-02-07 Rosemount, Inc. Tunable fabry-perot filter
US7447891B2 (en) * 2003-04-30 2008-11-04 Hewlett-Packard Development Company, L.P. Light modulator with concentric control-electrode structure
US7072093B2 (en) * 2003-04-30 2006-07-04 Hewlett-Packard Development Company, L.P. Optical interference pixel display with charge control
JP4916647B2 (en) * 2003-05-23 2012-04-18 サムスン エレクトロニクス カンパニー リミテッド External cavity semiconductor laser and manufacturing method thereof
JP3770326B2 (en) * 2003-10-01 2006-04-26 セイコーエプソン株式会社 Analysis equipment
US7061618B2 (en) 2003-10-17 2006-06-13 Axsun Technologies, Inc. Integrated spectroscopy system
KR100533535B1 (en) * 2003-11-13 2005-12-06 한국전자통신연구원 Thermally actuated wavelength tunable optical filter
KR100595999B1 (en) * 2003-12-22 2006-07-07 한국전자통신연구원 Wavelength tunable optical filter
US20050238067A1 (en) * 2004-04-26 2005-10-27 Choi Youngmin A Simple fiber optic cavity
US7110122B2 (en) * 2004-07-21 2006-09-19 Hewlett-Packard Development Company, L.P. Interferometer calibration methods and apparatus
US6980346B1 (en) 2004-09-15 2005-12-27 Hewlett-Packard Development Company, L.P. Display device
US20060072632A1 (en) * 2004-09-29 2006-04-06 Axsun Technologies, Inc. Semiconductor laser with tilted fabry-perot tunable filter
US7324569B2 (en) * 2004-09-29 2008-01-29 Axsun Technologies, Inc. Method and system for spectral stitching of tunable semiconductor sources
US7157712B2 (en) * 2004-09-29 2007-01-02 Axsun Technologies, Inc. Method and system for noise control in semiconductor spectroscopy system
EP1794855A1 (en) * 2004-09-29 2007-06-13 Axsun Technologies, Inc. Method and system for noise control in semiconductor spectroscopy system
JP4557730B2 (en) * 2005-01-28 2010-10-06 アンリツ株式会社 Optical spectrum analyzer
US7375812B2 (en) * 2005-02-22 2008-05-20 Axsun Technologies, Inc. Method and system for reducing parasitic spectral noise in tunable semiconductor source spectroscopy system
US7415049B2 (en) * 2005-03-28 2008-08-19 Axsun Technologies, Inc. Laser with tilted multi spatial mode resonator tuning element
US7619805B2 (en) * 2005-03-29 2009-11-17 Hewlett-Packard Development Company, L.P. Light modulator device
US7733553B2 (en) * 2005-09-21 2010-06-08 Hewlett-Packard Development Company, L.P. Light modulator with tunable optical state
US20070090732A1 (en) * 2005-10-25 2007-04-26 The Charles Stark Draper Laboratory, Inc. Systems, methods and devices relating to actuatably moveable machines
US7566582B2 (en) * 2005-10-25 2009-07-28 The Charles Stark Draper Laboratory, Inc. Systems, methods and devices relating to actuatably moveable machines
US20070211257A1 (en) * 2006-03-09 2007-09-13 Kearl Daniel A Fabry-Perot Interferometer Composite and Method
US7741751B2 (en) * 2006-06-30 2010-06-22 Hewlett-Packard Development Company, L.P. MEMS device having distance stops
CN101246026B (en) * 2006-10-24 2011-08-17 美国微光学公司 Method and device for optical sensor inquiry system
EP1927831B1 (en) * 2006-11-30 2010-04-28 Siemens Aktiengesellschaft Method for reducing fringe interference of light
DE102008045634A1 (en) 2008-09-03 2010-03-04 Ludwig-Maximilians-Universität München Wavelength tunable light source
US8670129B2 (en) 2009-09-03 2014-03-11 Axsun Technologies, Inc. Filtered ASE swept source for OCT medical imaging
US8526472B2 (en) 2009-09-03 2013-09-03 Axsun Technologies, Inc. ASE swept source with self-tracking filter for OCT medical imaging
US8665450B2 (en) * 2009-10-02 2014-03-04 Axsun Technologies, Inc. Integrated dual swept source for OCT medical imaging
US10371499B2 (en) 2010-12-27 2019-08-06 Axsun Technologies, Inc. Laser swept source with controlled mode locking for OCT medical imaging
US20120162662A1 (en) 2010-12-27 2012-06-28 Axsun Technologies, Inc. Actively Mode Locked Laser Swept Source for OCT Medical Imaging
US8687666B2 (en) 2010-12-28 2014-04-01 Axsun Technologies, Inc. Integrated dual swept source for OCT medical imaging
US8582619B2 (en) 2011-03-15 2013-11-12 Lightlab Imaging, Inc. Methods, systems, and devices for timing control in electromagnetic radiation sources
US8660164B2 (en) 2011-03-24 2014-02-25 Axsun Technologies, Inc. Method and system for avoiding package induced failure in swept semiconductor source
US9164240B2 (en) 2011-03-31 2015-10-20 Lightlab Imaging, Inc. Optical buffering methods, apparatus, and systems for increasing the repetition rate of tunable light sources
US8855149B2 (en) 2011-08-11 2014-10-07 Ludwig-Maximilians-Universität München Dynamical Fabry-Pérot tuneable filter device
US9441944B2 (en) 2012-05-16 2016-09-13 Axsun Technologies Llc Regenerative mode locked laser swept source for OCT medical imaging
CA2880034C (en) * 2012-07-27 2021-01-05 Thorlabs, Inc. Tunable short cavity laser sensor
US8994954B2 (en) 2012-12-28 2015-03-31 Axsun Technologies, Inc. System and method for stabilizing mode locked swept laser for OCT medical imaging
JP6118986B2 (en) 2013-01-30 2017-04-26 サンテック株式会社 Optical tomographic image display device for ophthalmology
JP6098197B2 (en) * 2013-02-05 2017-03-22 セイコーエプソン株式会社 Optical filter device, optical module, and electronic apparatus
JP6159095B2 (en) 2013-02-05 2017-07-05 株式会社Subaru Displacement measuring device and displacement measuring method
US9203215B2 (en) 2013-07-03 2015-12-01 Inphenix, Inc. Wavelength-tunable vertical cavity surface emitting laser for swept source optical coherence tomography system
US10359551B2 (en) 2013-08-12 2019-07-23 Axsun Technologies, Inc. Dielectric-enhanced metal coatings for MEMS tunable filters
WO2015081130A1 (en) * 2013-11-26 2015-06-04 Inphenix, Inc. Wavelength tunable mems-fabry perot filter
US10869623B2 (en) 2014-05-28 2020-12-22 Santec Corporation Non-invasive optical measurement of blood analyte
US10548520B2 (en) 2015-04-01 2020-02-04 Santec Corporation Non-invasive optical measurement of blood analyte
JP6713149B2 (en) 2015-06-01 2020-06-24 サンテック株式会社 Optical coherence tomography system for combining two wavelengths
US10677580B2 (en) 2016-04-27 2020-06-09 Santec Corporation Optical coherence tomography system using polarization switching
US9993153B2 (en) 2016-07-06 2018-06-12 Santec Corporation Optical coherence tomography system and method with multiple apertures
US10426337B2 (en) 2017-06-01 2019-10-01 Santec Corporation Flow imaging in an optical coherence tomography (OCT) system
US10408600B2 (en) 2017-06-22 2019-09-10 Santec Corporation Optical coherence tomography with a fizeau-type interferometer
US10206567B2 (en) 2017-07-12 2019-02-19 Santec Corporation Dual wavelength resampling system and method
US10502546B2 (en) 2017-11-07 2019-12-10 Santec Corporation Systems and methods for variable-range fourier domain imaging
US11213200B2 (en) 2018-03-22 2022-01-04 Santec Corporation Topographical imaging using combined sensing inputs
US11067671B2 (en) 2018-04-17 2021-07-20 Santec Corporation LIDAR sensing arrangements
US10838047B2 (en) 2018-04-17 2020-11-17 Santec Corporation Systems and methods for LIDAR scanning of an environment over a sweep of wavelengths
WO2021056251A1 (en) * 2019-09-25 2021-04-01 深圳市海谱纳米光学科技有限公司 Tunable optical filtering apparatus

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4203128A (en) * 1976-11-08 1980-05-13 Wisconsin Alumni Research Foundation Electrostatically deformable thin silicon membranes
US4859060A (en) * 1985-11-26 1989-08-22 501 Sharp Kabushiki Kaisha Variable interferometric device and a process for the production of the same
CH681047A5 (en) * 1991-11-25 1992-12-31 Landis & Gyr Betriebs Ag Measuring parameter, esp. pressure difference, using Fabry-Perot detector - controlling optical length of detector according to output parameter to determine working point on graph
US5430574A (en) * 1994-07-25 1995-07-04 Litton Systems, Inc. Rugged optical filter and switch for communication networks
US5757562A (en) * 1996-01-31 1998-05-26 Compagnie Industrielle Des Lasers Cilas Mirror with reflection coefficient variable spatially in amplitude and in phase
WO1999034484A2 (en) * 1997-12-29 1999-07-08 Coretek, Inc. Microelectromechanically, tunable, confocal, vcsel and fabry-perot filter
FR2777124A1 (en) * 1998-08-06 1999-10-08 Commissariat Energie Atomique Microlaser mosaic image projection

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2336930A1 (en) * 1973-07-20 1975-02-06 Battelle Institut E V INFRARED MODULATOR (II.)
US5022745A (en) * 1989-09-07 1991-06-11 Massachusetts Institute Of Technology Electrostatically deformable single crystal dielectrically coated mirror
US5291502A (en) 1992-09-04 1994-03-01 The Board Of Trustees Of The Leland Stanford, Jr. University Electrostatically tunable optical device and optical interconnect for processors
FI94804C (en) 1994-02-17 1995-10-25 Vaisala Oy Electrically adjustable surface micromechanical Fabry-Perot interferometer for optical material analysis
FI103216B (en) 1995-07-07 1999-05-14 Vaisala Oyj Method for controlling a short Fabry-Perot interferometer in an ND IR measuring device
US5739945A (en) 1995-09-29 1998-04-14 Tayebati; Parviz Electrically tunable optical filter utilizing a deformable multi-layer mirror
US5629951A (en) * 1995-10-13 1997-05-13 Chang-Hasnain; Constance J. Electrostatically-controlled cantilever apparatus for continuous tuning of the resonance wavelength of a fabry-perot cavity
FR2768812B1 (en) 1997-09-19 1999-10-22 Commissariat Energie Atomique FABRY-PEROT INTERFEROMETER TUNABLE INTEGRATED
US5914804A (en) * 1998-01-28 1999-06-22 Lucent Technologies Inc Double-cavity micromechanical optical modulator with plural multilayer mirrors

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4203128A (en) * 1976-11-08 1980-05-13 Wisconsin Alumni Research Foundation Electrostatically deformable thin silicon membranes
US4859060A (en) * 1985-11-26 1989-08-22 501 Sharp Kabushiki Kaisha Variable interferometric device and a process for the production of the same
CH681047A5 (en) * 1991-11-25 1992-12-31 Landis & Gyr Betriebs Ag Measuring parameter, esp. pressure difference, using Fabry-Perot detector - controlling optical length of detector according to output parameter to determine working point on graph
US5430574A (en) * 1994-07-25 1995-07-04 Litton Systems, Inc. Rugged optical filter and switch for communication networks
US5757562A (en) * 1996-01-31 1998-05-26 Compagnie Industrielle Des Lasers Cilas Mirror with reflection coefficient variable spatially in amplitude and in phase
WO1999034484A2 (en) * 1997-12-29 1999-07-08 Coretek, Inc. Microelectromechanically, tunable, confocal, vcsel and fabry-perot filter
FR2777124A1 (en) * 1998-08-06 1999-10-08 Commissariat Energie Atomique Microlaser mosaic image projection

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
ARATANI K ET AL: "SURFACE MICROMACHINED TUNEABLE INTERFEROMETER ARRAY", SENSORS AND ACTUATORS A, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, vol. A43, no. 1/3, 1 May 1994 (1994-05-01), pages 17 - 23, XP000454081, ISSN: 0924-4247 *
DEHE A ET AL: "III-V compound semiconductor micromachined actuators for long resonator tunable Fabry-Perot detectors", SENSORS AND ACTUATORS A, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, vol. 68, no. 1-3, 15 June 1998 (1998-06-15), pages 365 - 371, XP004139861, ISSN: 0924-4247 *
JERMAN J H ET AL: "A MINIATURE FABRY-PEROT INTERFEROMETER WITH A CORRUGATED SILICON DIAPHRAGM SUPPORT", SENSORS AND ACTUATORS A, ELSEVIER SEQUOIA S.A., LAUSANNE, CH, vol. A29, no. 2, November 1991 (1991-11-01), pages 151 - 158, XP000241462, ISSN: 0924-4247 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107171047A (en) * 2017-05-03 2017-09-15 电子科技大学 Ultra-wide tunable resonator

Also Published As

Publication number Publication date
US6373632B1 (en) 2002-04-16
AU2001245386A1 (en) 2001-09-17
WO2001067156A2 (en) 2001-09-13

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