WO2002037340A3 - System and method for test generation with dynamic constraints using static analysis - Google Patents

System and method for test generation with dynamic constraints using static analysis Download PDF

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Publication number
WO2002037340A3
WO2002037340A3 PCT/IL2001/001011 IL0101011W WO0237340A3 WO 2002037340 A3 WO2002037340 A3 WO 2002037340A3 IL 0101011 W IL0101011 W IL 0101011W WO 0237340 A3 WO0237340 A3 WO 0237340A3
Authority
WO
WIPO (PCT)
Prior art keywords
dynamic
constraints
constraint
test generation
testing
Prior art date
Application number
PCT/IL2001/001011
Other languages
French (fr)
Other versions
WO2002037340A2 (en
Inventor
Amos Noy
Original Assignee
Verisity Ltd
Amos Noy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Verisity Ltd, Amos Noy filed Critical Verisity Ltd
Priority to AU2002214229A priority Critical patent/AU2002214229A1/en
Priority to EP01982688A priority patent/EP1374103A2/en
Priority to IL15569201A priority patent/IL155692A0/en
Priority to JP2002540016A priority patent/JP2004513435A/en
Publication of WO2002037340A2 publication Critical patent/WO2002037340A2/en
Priority to IL155692A priority patent/IL155692A/en
Publication of WO2002037340A3 publication Critical patent/WO2002037340A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation

Abstract

A system and method for testing the quality of a simulation model for the DUT (device under test) with dynamic constraint solving and test generation for the testing and verification process. The present invention provides such dynamic constraint solving through the creation of a sequence of instructions in a 'generator mini-language (GML). These instructions are then executed in order to provide a correct random solution to any given set of dynamic constraints. the process of execution is preferably performed by a constraint resolution engine, optionally and more preferably implimented as software, which manages the requirements imposed by the constraints on the execution, while simultaneously enabling a random solution to the set of constraints to be provided. Such a constraint resolution engine may optionally be viewed as a type of state machine, in which the individual elements of the state machine are more preferably represented by one or more dynamic graph(s).
PCT/IL2001/001011 2000-11-03 2001-10-31 System and method for test generation with dynamic constraints using static analysis WO2002037340A2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
AU2002214229A AU2002214229A1 (en) 2000-11-03 2001-10-31 System and method for test generation with dynamic constraints using static analysis
EP01982688A EP1374103A2 (en) 2000-11-03 2001-10-31 System and method for test generation with dynamic constraints using static analysis
IL15569201A IL155692A0 (en) 2000-11-03 2001-10-31 System and method for test generation with dynamic constraints using static analysis
JP2002540016A JP2004513435A (en) 2000-11-03 2001-10-31 System and method for dynamic constrained test generation using static analysis
IL155692A IL155692A (en) 2000-11-03 2003-04-30 System and method for test generation with dynamic constraints using static analysis

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US24514600P 2000-11-03 2000-11-03
US60/245,146 2000-11-03
US09/799,066 2001-03-06
US09/799,066 US6684359B2 (en) 2000-11-03 2001-03-06 System and method for test generation with dynamic constraints using static analysis

Publications (2)

Publication Number Publication Date
WO2002037340A2 WO2002037340A2 (en) 2002-05-10
WO2002037340A3 true WO2002037340A3 (en) 2003-10-16

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IL2001/001011 WO2002037340A2 (en) 2000-11-03 2001-10-31 System and method for test generation with dynamic constraints using static analysis

Country Status (6)

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US (1) US6684359B2 (en)
EP (1) EP1374103A2 (en)
JP (1) JP2004513435A (en)
AU (1) AU2002214229A1 (en)
IL (1) IL155692A0 (en)
WO (1) WO2002037340A2 (en)

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Also Published As

Publication number Publication date
JP2004513435A (en) 2004-04-30
EP1374103A2 (en) 2004-01-02
IL155692A0 (en) 2003-11-23
US6684359B2 (en) 2004-01-27
US20020166089A1 (en) 2002-11-07
WO2002037340A2 (en) 2002-05-10
AU2002214229A1 (en) 2002-05-15

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