WO2002045092A1 - Analyseur de defauts - Google Patents

Analyseur de defauts Download PDF

Info

Publication number
WO2002045092A1
WO2002045092A1 PCT/JP2001/010041 JP0110041W WO0245092A1 WO 2002045092 A1 WO2002045092 A1 WO 2002045092A1 JP 0110041 W JP0110041 W JP 0110041W WO 0245092 A1 WO0245092 A1 WO 0245092A1
Authority
WO
WIPO (PCT)
Prior art keywords
reduced
fail
logical data
analysis device
test result
Prior art date
Application number
PCT/JP2001/010041
Other languages
English (en)
French (fr)
Inventor
Hiroaki Fukuda
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2000361121A external-priority patent/JP4146074B2/ja
Priority claimed from JP2000361119A external-priority patent/JP4187401B2/ja
Priority claimed from JP2000361120A external-priority patent/JP4294848B2/ja
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to DE10196980T priority Critical patent/DE10196980T5/de
Priority to KR10-2003-7007125A priority patent/KR20030048483A/ko
Priority to US10/432,807 priority patent/US7079971B2/en
Publication of WO2002045092A1 publication Critical patent/WO2002045092A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5604—Display of error information
PCT/JP2001/010041 2000-11-28 2001-11-16 Analyseur de defauts WO2002045092A1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DE10196980T DE10196980T5 (de) 2000-11-28 2001-11-16 Fehleranalysevorrichtung
KR10-2003-7007125A KR20030048483A (ko) 2000-11-28 2001-11-16 오류 분석장치
US10/432,807 US7079971B2 (en) 2000-11-28 2001-11-16 Fail analysis device

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP2000-361120 2000-11-28
JP2000-361121 2000-11-28
JP2000361121A JP4146074B2 (ja) 2000-11-28 2000-11-28 フェイル解析装置
JP2000361119A JP4187401B2 (ja) 2000-11-28 2000-11-28 フェイル解析装置
JP2000-361119 2000-11-28
JP2000361120A JP4294848B2 (ja) 2000-11-28 2000-11-28 フェイル解析装置

Publications (1)

Publication Number Publication Date
WO2002045092A1 true WO2002045092A1 (fr) 2002-06-06

Family

ID=27345280

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2001/010041 WO2002045092A1 (fr) 2000-11-28 2001-11-16 Analyseur de defauts

Country Status (6)

Country Link
US (1) US7079971B2 (ja)
KR (1) KR20030048483A (ja)
CN (1) CN100437832C (ja)
DE (1) DE10196980T5 (ja)
TW (1) TW533422B (ja)
WO (1) WO2002045092A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010044837A (ja) * 2008-08-15 2010-02-25 Yokogawa Electric Corp 半導体メモリ検査装置

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US7228475B2 (en) * 2004-09-30 2007-06-05 Advantest Corporation Program, test apparatus and testing method
JP5000104B2 (ja) * 2005-06-22 2012-08-15 浜松ホトニクス株式会社 半導体不良解析装置、不良解析方法、不良解析プログラム、及び不良解析システム
JP5005893B2 (ja) * 2005-06-22 2012-08-22 浜松ホトニクス株式会社 半導体不良解析装置、不良解析方法、及び不良解析プログラム
JP4463173B2 (ja) * 2005-09-14 2010-05-12 株式会社アドバンテスト 試験装置、試験方法、プログラム、及び記録媒体
KR101199771B1 (ko) * 2005-12-19 2012-11-09 삼성전자주식회사 모드별 논리적 어드레스를 설정하는 반도체 메모리 테스트장치 및 방법
JP4931483B2 (ja) * 2006-06-14 2012-05-16 ルネサスエレクトロニクス株式会社 半導体不良解析装置、不良解析方法、及び不良解析プログラム
JP5091430B2 (ja) * 2006-06-14 2012-12-05 ルネサスエレクトロニクス株式会社 半導体不良解析装置、不良解析方法、及び不良解析プログラム
JP5087236B2 (ja) * 2006-06-14 2012-12-05 ルネサスエレクトロニクス株式会社 半導体不良解析装置、不良解析方法、及び不良解析プログラム
JP2008082976A (ja) * 2006-09-28 2008-04-10 Fujitsu Ltd Ｆｂｍ生成装置、ｆｂｍ生成方法
JP2008299953A (ja) * 2007-05-31 2008-12-11 Toshiba Corp 半導体メモリの不良解析方法および不良解析システム
US20100163756A1 (en) * 2008-12-31 2010-07-01 Custom Test Systems, Llc. Single event upset (SEU) testing system and method
JP5658451B2 (ja) * 2009-11-30 2015-01-28 ソニー株式会社 情報処理装置、情報処理方法及びそのプログラム
JP2011129218A (ja) * 2009-12-18 2011-06-30 Toshiba Corp 不良解析方法、不良解析装置および不良解析プログラム
CN101738556B (zh) * 2009-12-24 2012-08-29 卡斯柯信号有限公司 一种新型故障信息显示处理系统
JP2012038368A (ja) * 2010-08-04 2012-02-23 Toshiba Corp 不良解析装置及び不良解析方法
WO2012125719A2 (en) 2011-03-14 2012-09-20 Rambus Inc. Methods and apparatus for testing inaccessible interface circuits in a semiconductor device
KR101869095B1 (ko) * 2011-08-23 2018-06-19 삼성전자주식회사 휴대단말기의 표시 방법 및 장치
JP2014038672A (ja) * 2012-08-13 2014-02-27 Toshiba Corp 半導体装置の不良解析システムおよび半導体記憶装置
CN103678375A (zh) * 2012-09-17 2014-03-26 鸿富锦精密工业（深圳）有限公司 测试状态呈现及异常索引系统与方法
KR102154075B1 (ko) * 2013-10-21 2020-09-09 삼성전자주식회사 반도체 소자의 검사 방법 및 반도체 검사 시스템
US9791508B2 (en) * 2016-01-20 2017-10-17 The Boeing Company Detecting and displaying flaws in a device under test
CN107610738A (zh) * 2017-09-29 2018-01-19 北京中电华大电子设计有限责任公司 一种高效的存储器失效分析方法
CN112037844B (zh) * 2019-06-04 2022-12-06 长鑫存储技术有限公司 可变保持时间模式分析方法、装置、设备及可读存储介质

Citations (2)

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Publication number Priority date Publication date Assignee Title
JPH10308099A (ja) * 1997-04-30 1998-11-17 Hitachi Chiyou Lsi Syst:Kk メモリ不良解析表示システム
JPH11134897A (ja) * 1997-10-31 1999-05-21 Ando Electric Co Ltd Ｉｃ試験のフェイルメモリ解析装置

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JP3995768B2 (ja) * 1997-10-02 2007-10-24 株式会社ルネサステクノロジ 不良解析方法及びその装置
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JP2001357697A (ja) * 2000-06-13 2001-12-26 Advantest Corp フェイル解析装置
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10308099A (ja) * 1997-04-30 1998-11-17 Hitachi Chiyou Lsi Syst:Kk メモリ不良解析表示システム
JPH11134897A (ja) * 1997-10-31 1999-05-21 Ando Electric Co Ltd Ｉｃ試験のフェイルメモリ解析装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010044837A (ja) * 2008-08-15 2010-02-25 Yokogawa Electric Corp 半導体メモリ検査装置

Also Published As

Publication number Publication date
CN100437832C (zh) 2008-11-26
TW533422B (en) 2003-05-21
US20040153274A1 (en) 2004-08-05
KR20030048483A (ko) 2003-06-19
US7079971B2 (en) 2006-07-18
CN1488149A (zh) 2004-04-07
DE10196980T5 (de) 2004-04-22

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