WO2003025656A1 - Digital control scanning method and apparatus - Google Patents
Digital control scanning method and apparatus Download PDFInfo
- Publication number
- WO2003025656A1 WO2003025656A1 PCT/JP2001/007598 JP0107598W WO03025656A1 WO 2003025656 A1 WO2003025656 A1 WO 2003025656A1 JP 0107598 W JP0107598 W JP 0107598W WO 03025656 A1 WO03025656 A1 WO 03025656A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- micro
- point
- real image
- light source
- light
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
- G02B26/0841—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD the reflecting element being moved or deformed by electrostatic means
Abstract
By using a micro light beam deflecting device (DMD) (4) which has a plurality of two-dimensionally arranged micro mirrors inclanable with digital signals, the inclination of each micro mirror on the DMD (4) is scanned, the real image of a light source (a point light source, surface a light source) is formed on the micro mirrors, the real image is formed by an objective lens (2) to illuminate a point or a micro area in the space of a sample (1). The real image of a fluorescent light or a scattered light from the point or micro area is formed by the scanning by the objective lens (2) on the inclined micro mirrors and picked up by a charge coupled device (CCD) (5).
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2001/007598 WO2003025656A1 (en) | 2001-09-03 | 2001-09-03 | Digital control scanning method and apparatus |
JP2003529228A JP3634343B2 (en) | 2001-09-03 | 2001-09-03 | Digitally controlled scanning method and apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2001/007598 WO2003025656A1 (en) | 2001-09-03 | 2001-09-03 | Digital control scanning method and apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2003025656A1 true WO2003025656A1 (en) | 2003-03-27 |
Family
ID=11737693
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2001/007598 WO2003025656A1 (en) | 2001-09-03 | 2001-09-03 | Digital control scanning method and apparatus |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP3634343B2 (en) |
WO (1) | WO2003025656A1 (en) |
Cited By (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005024596A (en) * | 2003-06-30 | 2005-01-27 | Susumu Terakawa | Confocal scanning microscope |
JP2005148296A (en) * | 2003-11-13 | 2005-06-09 | Olympus Corp | Light source apparatus of microscope |
JP2005275206A (en) * | 2004-03-26 | 2005-10-06 | Olympus Corp | Optical scan type observation device |
JP2006003747A (en) * | 2004-06-18 | 2006-01-05 | Olympus Corp | Optical scanning type observation apparatus |
JP2006017706A (en) * | 2005-06-14 | 2006-01-19 | Hayashi Soken:Kk | Biochip on-line analytical system |
JP2006133499A (en) * | 2004-11-05 | 2006-05-25 | Shimadzu Corp | Confocal scanner and confocal microscope |
JP2006154126A (en) * | 2004-11-26 | 2006-06-15 | Cmet Inc | Optical beam control device and beam lithographic apparatus |
WO2006104184A1 (en) * | 2005-03-29 | 2006-10-05 | National University Corporation, Hamamatsu University School Of Medicine | Dlp type slit scanning microscope |
JP2008164841A (en) * | 2006-12-27 | 2008-07-17 | Olympus Corp | Confocal laser scanning type microscope |
JP2009244319A (en) * | 2008-03-28 | 2009-10-22 | V Technology Co Ltd | Method of forming pattern and pattern formation apparatus |
JP2010044272A (en) * | 2008-08-14 | 2010-02-25 | Omron Corp | Laser radiation device |
JP2012256062A (en) * | 2012-08-02 | 2012-12-27 | Omron Corp | Laser irradiation device |
CN104040322A (en) * | 2011-12-06 | 2014-09-10 | Ccs株式会社 | Lighting Device For Inspection And Lighting Method For Inspection |
JP2016188923A (en) * | 2015-03-30 | 2016-11-04 | ウシオ電機株式会社 | Exposure apparatus and exposure method |
CN107121422A (en) * | 2017-06-21 | 2017-09-01 | 中国科学院苏州生物医学工程技术研究所 | A kind of parallel confocal microscopic imaging device and method based on digital micromirror array |
WO2019159933A1 (en) * | 2018-02-19 | 2019-08-22 | 京セラ株式会社 | Electromagnetic wave detection device and information acquisition system |
JP2019144219A (en) * | 2018-02-19 | 2019-08-29 | 京セラ株式会社 | Electromagnetic wave detection device and information acquisition system |
JP2021503096A (en) * | 2017-10-02 | 2021-02-04 | ナノトロニクス イメージング インコーポレイテッドNanotronics Imaging,Inc. | Devices and methods for reducing vignetting in microscopic imaging |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2315065B1 (en) | 2009-10-26 | 2015-05-13 | Olympus Corporation | Microscope |
US9081176B2 (en) | 2010-04-05 | 2015-07-14 | Osaka University | Observation system and observation method |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5587832A (en) * | 1993-10-20 | 1996-12-24 | Biophysica Technologies, Inc. | Spatially light modulated confocal microscope and method |
EP0911667A1 (en) * | 1997-10-22 | 1999-04-28 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Programmable spatially light modulated microscope and microscopy method |
EP0916981A1 (en) * | 1997-11-17 | 1999-05-19 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Confocal spectroscopy system and method |
US5923466A (en) * | 1993-10-20 | 1999-07-13 | Biophysica Technologies, Inc. | Light modulated confocal optical instruments and method |
US6144489A (en) * | 1996-02-22 | 2000-11-07 | Isis Innovation Limited | Confocal microscope |
-
2001
- 2001-09-03 JP JP2003529228A patent/JP3634343B2/en not_active Expired - Fee Related
- 2001-09-03 WO PCT/JP2001/007598 patent/WO2003025656A1/en active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5587832A (en) * | 1993-10-20 | 1996-12-24 | Biophysica Technologies, Inc. | Spatially light modulated confocal microscope and method |
US5923466A (en) * | 1993-10-20 | 1999-07-13 | Biophysica Technologies, Inc. | Light modulated confocal optical instruments and method |
US6144489A (en) * | 1996-02-22 | 2000-11-07 | Isis Innovation Limited | Confocal microscope |
EP0911667A1 (en) * | 1997-10-22 | 1999-04-28 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Programmable spatially light modulated microscope and microscopy method |
EP0916981A1 (en) * | 1997-11-17 | 1999-05-19 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Confocal spectroscopy system and method |
Cited By (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005024596A (en) * | 2003-06-30 | 2005-01-27 | Susumu Terakawa | Confocal scanning microscope |
JP2005148296A (en) * | 2003-11-13 | 2005-06-09 | Olympus Corp | Light source apparatus of microscope |
JP2005275206A (en) * | 2004-03-26 | 2005-10-06 | Olympus Corp | Optical scan type observation device |
JP4593141B2 (en) * | 2004-03-26 | 2010-12-08 | オリンパス株式会社 | Optical scanning observation device |
JP2006003747A (en) * | 2004-06-18 | 2006-01-05 | Olympus Corp | Optical scanning type observation apparatus |
JP2006133499A (en) * | 2004-11-05 | 2006-05-25 | Shimadzu Corp | Confocal scanner and confocal microscope |
JP4499538B2 (en) * | 2004-11-26 | 2010-07-07 | シーメット株式会社 | Light beam control apparatus and stereolithography apparatus |
JP2006154126A (en) * | 2004-11-26 | 2006-06-15 | Cmet Inc | Optical beam control device and beam lithographic apparatus |
WO2006104184A1 (en) * | 2005-03-29 | 2006-10-05 | National University Corporation, Hamamatsu University School Of Medicine | Dlp type slit scanning microscope |
JP2006276377A (en) * | 2005-03-29 | 2006-10-12 | Hamamatsu Univ School Of Medicine | Dlp type slit optical scanning microscope |
JP4538633B2 (en) * | 2005-03-29 | 2010-09-08 | 国立大学法人浜松医科大学 | DLP slit optical scanning microscope |
JP2006017706A (en) * | 2005-06-14 | 2006-01-19 | Hayashi Soken:Kk | Biochip on-line analytical system |
JP2008164841A (en) * | 2006-12-27 | 2008-07-17 | Olympus Corp | Confocal laser scanning type microscope |
JP2009244319A (en) * | 2008-03-28 | 2009-10-22 | V Technology Co Ltd | Method of forming pattern and pattern formation apparatus |
JP2010044272A (en) * | 2008-08-14 | 2010-02-25 | Omron Corp | Laser radiation device |
US9494422B2 (en) | 2011-12-06 | 2016-11-15 | Ccs Inc. | Lighting device for inspection and lighting method for inspection |
CN104040322A (en) * | 2011-12-06 | 2014-09-10 | Ccs株式会社 | Lighting Device For Inspection And Lighting Method For Inspection |
JP2012256062A (en) * | 2012-08-02 | 2012-12-27 | Omron Corp | Laser irradiation device |
JP2016188923A (en) * | 2015-03-30 | 2016-11-04 | ウシオ電機株式会社 | Exposure apparatus and exposure method |
CN107121422A (en) * | 2017-06-21 | 2017-09-01 | 中国科学院苏州生物医学工程技术研究所 | A kind of parallel confocal microscopic imaging device and method based on digital micromirror array |
JP2021503096A (en) * | 2017-10-02 | 2021-02-04 | ナノトロニクス イメージング インコーポレイテッドNanotronics Imaging,Inc. | Devices and methods for reducing vignetting in microscopic imaging |
JP7054266B2 (en) | 2017-10-02 | 2022-04-13 | ナノトロニクス イメージング インコーポレイテッド | Devices and methods for reducing vignetting in microscopic imaging |
JP2022084859A (en) * | 2017-10-02 | 2022-06-07 | ナノトロニクス イメージング インコーポレイテッド | Apparatus and method for reducing vignetting in microscopic imaging |
US11880028B2 (en) | 2017-10-02 | 2024-01-23 | Nanotronics Imaging, Inc. | Apparatus and method to reduce vignetting in microscopic imaging |
JP7427266B2 (en) | 2017-10-02 | 2024-02-05 | ナノトロニクス イメージング インコーポレイテッド | Apparatus and method for reducing vignetting in microscopic imaging |
WO2019159933A1 (en) * | 2018-02-19 | 2019-08-22 | 京セラ株式会社 | Electromagnetic wave detection device and information acquisition system |
JP2019144219A (en) * | 2018-02-19 | 2019-08-29 | 京セラ株式会社 | Electromagnetic wave detection device and information acquisition system |
JP7260966B2 (en) | 2018-02-19 | 2023-04-19 | 京セラ株式会社 | Electromagnetic wave detector |
Also Published As
Publication number | Publication date |
---|---|
JP3634343B2 (en) | 2005-03-30 |
JPWO2003025656A1 (en) | 2004-12-24 |
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