WO2003063245A3 - Process condition sensing wafer and data analysis system - Google Patents
Process condition sensing wafer and data analysis system Download PDFInfo
- Publication number
- WO2003063245A3 WO2003063245A3 PCT/US2003/000751 US0300751W WO03063245A3 WO 2003063245 A3 WO2003063245 A3 WO 2003063245A3 US 0300751 W US0300751 W US 0300751W WO 03063245 A3 WO03063245 A3 WO 03063245A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- conditions
- data analysis
- analysis system
- process condition
- sensing wafer
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003563004A JP4719933B2 (en) | 2002-01-24 | 2003-01-08 | Processing status detection wafer and data analysis system |
KR1020047011508A KR101019076B1 (en) | 2002-01-24 | 2003-01-08 | Process condition sensing wafer and data analysis system |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/056,906 | 2002-01-24 | ||
US10/056,906 US6889568B2 (en) | 2002-01-24 | 2002-01-24 | Process condition sensing wafer and data analysis system |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2003063245A2 WO2003063245A2 (en) | 2003-07-31 |
WO2003063245A3 true WO2003063245A3 (en) | 2003-11-13 |
Family
ID=27609343
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2003/000751 WO2003063245A2 (en) | 2002-01-24 | 2003-01-08 | Process condition sensing wafer and data analysis system |
Country Status (5)
Country | Link |
---|---|
US (4) | US6889568B2 (en) |
JP (1) | JP4719933B2 (en) |
KR (1) | KR101019076B1 (en) |
TW (1) | TWI259547B (en) |
WO (1) | WO2003063245A2 (en) |
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2002
- 2002-01-24 US US10/056,906 patent/US6889568B2/en not_active Expired - Lifetime
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2003
- 2003-01-08 JP JP2003563004A patent/JP4719933B2/en not_active Expired - Lifetime
- 2003-01-08 KR KR1020047011508A patent/KR101019076B1/en active IP Right Grant
- 2003-01-08 WO PCT/US2003/000751 patent/WO2003063245A2/en active Application Filing
- 2003-01-16 TW TW092100893A patent/TWI259547B/en not_active IP Right Cessation
- 2003-10-14 US US10/685,550 patent/US7360463B2/en not_active Expired - Fee Related
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2008
- 2008-04-21 US US12/106,998 patent/US7819033B2/en not_active Expired - Fee Related
-
2010
- 2010-10-25 US US12/911,682 patent/US9165846B2/en active Active
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US9165846B2 (en) | 2015-10-20 |
US20080228419A1 (en) | 2008-09-18 |
TW200302543A (en) | 2003-08-01 |
US20040074323A1 (en) | 2004-04-22 |
JP2005516400A (en) | 2005-06-02 |
WO2003063245A2 (en) | 2003-07-31 |
US20040031340A1 (en) | 2004-02-19 |
US6889568B2 (en) | 2005-05-10 |
KR20040086295A (en) | 2004-10-08 |
JP4719933B2 (en) | 2011-07-06 |
US7360463B2 (en) | 2008-04-22 |
US7819033B2 (en) | 2010-10-26 |
KR101019076B1 (en) | 2011-03-07 |
US20150006108A9 (en) | 2015-01-01 |
TWI259547B (en) | 2006-08-01 |
US20110040527A1 (en) | 2011-02-17 |
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