WO2003065064A3 - Predictive, adaptive power supply for an integrated circuit under test - Google Patents

Predictive, adaptive power supply for an integrated circuit under test Download PDF

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Publication number
WO2003065064A3
WO2003065064A3 PCT/US2003/002581 US0302581W WO03065064A3 WO 2003065064 A3 WO2003065064 A3 WO 2003065064A3 US 0302581 W US0302581 W US 0302581W WO 03065064 A3 WO03065064 A3 WO 03065064A3
Authority
WO
WIPO (PCT)
Prior art keywords
dut
input terminal
power input
current
clock signal
Prior art date
Application number
PCT/US2003/002581
Other languages
French (fr)
Other versions
WO2003065064A2 (en
Inventor
Benjamin N Eldridge
Charles A Miller
Original Assignee
Formfactor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/062,999 external-priority patent/US7342405B2/en
Application filed by Formfactor Inc filed Critical Formfactor Inc
Priority to KR1020047011685A priority Critical patent/KR101024872B1/en
Priority to JP2003564605A priority patent/JP2005516226A/en
Priority to EP03707580A priority patent/EP1470432B1/en
Priority to DE60317876T priority patent/DE60317876T2/en
Publication of WO2003065064A2 publication Critical patent/WO2003065064A2/en
Publication of WO2003065064A3 publication Critical patent/WO2003065064A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture

Abstract

A main power source supplies current through path impedance to a power terminal of an integrated circuit device under test (DUT). The DUT's demand for current at the power input terminal temporarily increases following edges of a clock signal applied to the DUT during a test as transistors within the IC switch in response to the clock signal edges. To limit variation (noise) in voltage at the power input terminal, an auxiliary power supply supplies an additional current pulse to the power input terminal to meet the increased demand during each cycle of the clock signal. The magnitude of the current pulse is a function of a predicted increase in current demand during that clock cycle, and of the magnitude of an adaption signal controlled by a feedback circuit provided to limit variation in voltage developed at the DUT's power input terminal.
PCT/US2003/002581 2002-01-30 2003-01-29 Predictive, adaptive power supply for an integrated circuit under test WO2003065064A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1020047011685A KR101024872B1 (en) 2002-01-30 2003-01-29 Predictive, adaptive power supply for an integrated circuit under test
JP2003564605A JP2005516226A (en) 2002-01-30 2003-01-29 Predictive adaptive power supply for integrated circuits under test.
EP03707580A EP1470432B1 (en) 2002-01-30 2003-01-29 Predictive, adaptive power supply for an integrated circuit under test
DE60317876T DE60317876T2 (en) 2002-01-30 2003-01-29 PREDICTIVE, ADAPTIVE POWER SUPPLY FOR AN INTEGRATED CIRCUIT IN THE TEST

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US10/062,999 US7342405B2 (en) 2000-01-18 2002-01-30 Apparatus for reducing power supply noise in an integrated circuit
US10/062,999 2002-01-30
US10/206,276 US6657455B2 (en) 2000-01-18 2002-07-25 Predictive, adaptive power supply for an integrated circuit under test
US10/206,276 2002-07-25

Publications (2)

Publication Number Publication Date
WO2003065064A2 WO2003065064A2 (en) 2003-08-07
WO2003065064A3 true WO2003065064A3 (en) 2003-10-16

Family

ID=27667769

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/002581 WO2003065064A2 (en) 2002-01-30 2003-01-29 Predictive, adaptive power supply for an integrated circuit under test

Country Status (6)

Country Link
US (4) US6657455B2 (en)
EP (1) EP1470432B1 (en)
JP (1) JP2005516226A (en)
KR (1) KR101024872B1 (en)
CN (1) CN100454216C (en)
WO (1) WO2003065064A2 (en)

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Also Published As

Publication number Publication date
US20070257696A1 (en) 2007-11-08
KR20040079960A (en) 2004-09-16
US20060022699A1 (en) 2006-02-02
US7714603B2 (en) 2010-05-11
CN100454216C (en) 2009-01-21
EP1470432A2 (en) 2004-10-27
WO2003065064A2 (en) 2003-08-07
US7245120B2 (en) 2007-07-17
US20020186037A1 (en) 2002-12-12
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