WO2003083760A3 - Methods and devices relating to estimating classifier performance - Google Patents

Methods and devices relating to estimating classifier performance Download PDF

Info

Publication number
WO2003083760A3
WO2003083760A3 PCT/US2003/009657 US0309657W WO03083760A3 WO 2003083760 A3 WO2003083760 A3 WO 2003083760A3 US 0309657 W US0309657 W US 0309657W WO 03083760 A3 WO03083760 A3 WO 03083760A3
Authority
WO
WIPO (PCT)
Prior art keywords
methods
devices
feature
classifier performance
estimating
Prior art date
Application number
PCT/US2003/009657
Other languages
French (fr)
Other versions
WO2003083760A2 (en
Inventor
Cole Coryell Harris
Original Assignee
Quasar International Inc
Cole Coryell Harris
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Quasar International Inc, Cole Coryell Harris filed Critical Quasar International Inc
Priority to JP2003581108A priority Critical patent/JP2005524131A/en
Priority to AU2003220578A priority patent/AU2003220578A1/en
Priority to EP03716892A priority patent/EP1495444A4/en
Publication of WO2003083760A2 publication Critical patent/WO2003083760A2/en
Publication of WO2003083760A3 publication Critical patent/WO2003083760A3/en

Links

Classifications

    • G—PHYSICS
    • G16—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
    • G16H—HEALTHCARE INFORMATICS, i.e. INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR THE HANDLING OR PROCESSING OF MEDICAL OR HEALTHCARE DATA
    • G16H10/00—ICT specially adapted for the handling or processing of patient-related medical or healthcare data
    • G16H10/40—ICT specially adapted for the handling or processing of patient-related medical or healthcare data for data related to laboratory analysis, e.g. patient specimen analysis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/211—Selection of the most significant subset of features
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/217—Validation; Performance evaluation; Active pattern learning techniques
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G—PHYSICS
    • G16—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
    • G16H—HEALTHCARE INFORMATICS, i.e. INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR THE HANDLING OR PROCESSING OF MEDICAL OR HEALTHCARE DATA
    • G16H50/00—ICT specially adapted for medical diagnosis, medical simulation or medical data mining; ICT specially adapted for detecting, monitoring or modelling epidemics or pandemics
    • G16H50/70—ICT specially adapted for medical diagnosis, medical simulation or medical data mining; ICT specially adapted for detecting, monitoring or modelling epidemics or pandemics for mining of medical data, e.g. analysing previous cases of other patients

Abstract

Methods and devices, including methods and devices for estimating classifier performance such as generalization performance, are disclosed. One method includes providing multiple samples (10). Each sample is characterized by one or more features. This method also includes associating a feature variability with at least one of the one or more features on a feature-by-feature basis (20); and computing a first probability of misclassification (30) by a first classifier using the feature variability. Devices, including integrated circuits (ICs) and field programmable gate arrays (FPGAs), that are configured for use in carrying out the present methods are also disclosed.
PCT/US2003/009657 2002-03-28 2003-03-28 Methods and devices relating to estimating classifier performance WO2003083760A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2003581108A JP2005524131A (en) 2002-03-28 2003-03-28 Method and apparatus for classifier performance estimation
AU2003220578A AU2003220578A1 (en) 2002-03-28 2003-03-28 Methods and devices relating to estimating classifier performance
EP03716892A EP1495444A4 (en) 2002-03-28 2003-03-28 Methods and devices relating to estimating classifier performance

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/109,094 2002-03-28
US10/109,094 US7561971B2 (en) 2002-03-28 2002-03-28 Methods and devices relating to estimating classifier performance

Publications (2)

Publication Number Publication Date
WO2003083760A2 WO2003083760A2 (en) 2003-10-09
WO2003083760A3 true WO2003083760A3 (en) 2003-12-04

Family

ID=28453009

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/009657 WO2003083760A2 (en) 2002-03-28 2003-03-28 Methods and devices relating to estimating classifier performance

Country Status (5)

Country Link
US (3) US7561971B2 (en)
EP (1) EP1495444A4 (en)
JP (1) JP2005524131A (en)
AU (1) AU2003220578A1 (en)
WO (1) WO2003083760A2 (en)

Families Citing this family (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7561971B2 (en) * 2002-03-28 2009-07-14 Exagen Diagnostics, Inc. Methods and devices relating to estimating classifier performance
JP3733094B2 (en) * 2002-08-22 2006-01-11 トヨタ自動車株式会社 Pass / fail judgment device, pass / fail judgment program, and pass / fail judgment method
WO2005042786A2 (en) * 2003-11-03 2005-05-12 Exagen Diagnostics Compositions and methods for glioma classification
EP1756308A1 (en) * 2004-04-23 2007-02-28 Exagen Diagnostics, Inc. Compositions and methods for breast cancer prognosis
WO2005106043A2 (en) * 2004-04-23 2005-11-10 Exagen Diagnostics, Inc. Breast cancer gene expression biomarkers
US7565333B2 (en) 2005-04-08 2009-07-21 Caterpillar Inc. Control system and method
US7877239B2 (en) 2005-04-08 2011-01-25 Caterpillar Inc Symmetric random scatter process for probabilistic modeling system for product design
US8364610B2 (en) * 2005-04-08 2013-01-29 Caterpillar Inc. Process modeling and optimization method and system
US8209156B2 (en) 2005-04-08 2012-06-26 Caterpillar Inc. Asymmetric random scatter process for probabilistic modeling system for product design
WO2006119494A2 (en) * 2005-05-04 2006-11-09 Exagen Diagnostics, Inc. Acute myelogenous leukemia biomarkers
US7487134B2 (en) * 2005-10-25 2009-02-03 Caterpillar Inc. Medical risk stratifying method and system
US7499842B2 (en) 2005-11-18 2009-03-03 Caterpillar Inc. Process model based virtual sensor and method
US7505949B2 (en) * 2006-01-31 2009-03-17 Caterpillar Inc. Process model error correction method and system
US8478506B2 (en) 2006-09-29 2013-07-02 Caterpillar Inc. Virtual sensor based engine control system and method
US7483774B2 (en) 2006-12-21 2009-01-27 Caterpillar Inc. Method and system for intelligent maintenance
US20080183449A1 (en) * 2007-01-31 2008-07-31 Caterpillar Inc. Machine parameter tuning method and system
US20080199084A1 (en) * 2007-02-19 2008-08-21 Seiko Epson Corporation Category Classification Apparatus and Category Classification Method
US7787969B2 (en) 2007-06-15 2010-08-31 Caterpillar Inc Virtual sensor system and method
US7831416B2 (en) 2007-07-17 2010-11-09 Caterpillar Inc Probabilistic modeling system for product design
US7788070B2 (en) 2007-07-30 2010-08-31 Caterpillar Inc. Product design optimization method and system
US7542879B2 (en) 2007-08-31 2009-06-02 Caterpillar Inc. Virtual sensor based control system and method
US8036764B2 (en) 2007-11-02 2011-10-11 Caterpillar Inc. Virtual sensor network (VSN) system and method
US8224468B2 (en) * 2007-11-02 2012-07-17 Caterpillar Inc. Calibration certificate for virtual sensor network (VSN)
US20140324677A1 (en) * 2008-05-19 2014-10-30 Jpmorgan Chase Bank, N.A. Method and system for detecting, monitoring and investigating first party fraud
US8086640B2 (en) 2008-05-30 2011-12-27 Caterpillar Inc. System and method for improving data coverage in modeling systems
US7917333B2 (en) 2008-08-20 2011-03-29 Caterpillar Inc. Virtual sensor network (VSN) based control system and method
US8897544B2 (en) 2009-12-10 2014-11-25 Indiana University Research And Technology Corp. System and method for segmentation of three-dimensional image data
EP2524337B1 (en) 2010-01-12 2022-10-26 Rigel Pharmaceuticals, Inc. Mode of action screening method
US8396875B2 (en) * 2010-06-17 2013-03-12 Microsoft Corporation Online stratified sampling for classifier evaluation
US20120022959A1 (en) * 2010-07-23 2012-01-26 Steve Yankovich Event-relevant content machine
US8693788B2 (en) 2010-08-06 2014-04-08 Mela Sciences, Inc. Assessing features for classification
US8873843B2 (en) * 2011-05-31 2014-10-28 Nec Laboratories America, Inc. Fast methods of learning distance metric for classification and retrieval
US8793004B2 (en) 2011-06-15 2014-07-29 Caterpillar Inc. Virtual sensor system and method for generating output parameters
WO2017183548A1 (en) * 2016-04-22 2017-10-26 日本電気株式会社 Information processing system, information processing method, and recording medium
US10832130B2 (en) * 2016-09-19 2020-11-10 Google Llc Recommending a document for a user to access
RU2665244C1 (en) 2017-06-06 2018-08-28 Общество С Ограниченной Ответственностью "Яндекс" Metric generalized parameter forming for a/b testing methods and system
CN109218255B (en) * 2017-06-30 2021-06-04 中国电信股份有限公司 Safety protection method, control system and safety protection system
JP2021528643A (en) * 2018-06-22 2021-10-21 イーエヌデータクト ゲーエムベーハーｉＮＤＴａｃｔ ＧｍｂＨ Sensor placement structure, use of sensor placement structure, and how to detect solid-borne sound
CN109344852A (en) * 2018-08-01 2019-02-15 迈克医疗电子有限公司 Image-recognizing method and device, analysis instrument and storage medium
US11509674B1 (en) 2019-09-18 2022-11-22 Rapid7, Inc. Generating machine learning data in salient regions of a feature space
US11853853B1 (en) 2019-09-18 2023-12-26 Rapid7, Inc. Providing human-interpretable explanation for model-detected anomalies
US20210150335A1 (en) * 2019-11-20 2021-05-20 International Business Machines Corporation Predictive model performance evaluation
CN112101458B (en) * 2020-09-16 2024-04-19 河海大学常州校区 Characteristic measurement method and device based on field function-signal-to-noise ratio

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5909190A (en) * 1997-10-30 1999-06-01 Raytheon Company Clutter rejection using adaptive estimation of clutter probability density function

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6182058B1 (en) * 1997-02-28 2001-01-30 Silicon Graphics, Inc. Bayes rule based and decision tree hybrid classifier
US6201989B1 (en) * 1997-03-13 2001-03-13 Biomax Technologies Inc. Methods and apparatus for detecting the rejection of transplanted tissue
US6882990B1 (en) * 1999-05-01 2005-04-19 Biowulf Technologies, Llc Methods of identifying biological patterns using multiple data sets
US6238342B1 (en) * 1998-05-26 2001-05-29 Riverside Research Institute Ultrasonic tissue-type classification and imaging methods and apparatus
US6317517B1 (en) * 1998-11-30 2001-11-13 Regents Of The University Of California Statistical pattern recognition
US7363165B2 (en) * 2000-05-04 2008-04-22 The Board Of Trustees Of The Leland Stanford Junior University Significance analysis of microarrays
US6974667B2 (en) * 2000-06-14 2005-12-13 Gene Logic, Inc. Gene expression profiles in liver cancer
JP2005506140A (en) * 2001-10-16 2005-03-03 ザ・ユニバーシティー・オブ・シカゴ Computer-aided 3D lesion detection method
US7561971B2 (en) * 2002-03-28 2009-07-14 Exagen Diagnostics, Inc. Methods and devices relating to estimating classifier performance

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5909190A (en) * 1997-10-30 1999-06-01 Raytheon Company Clutter rejection using adaptive estimation of clutter probability density function

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
LAY S.R. ET AL.: "Robust construction of radial basis function networks for classification", IEEE INTERNATIONAL CONFERENCE ON NEURAL NETWORKS, vol. 3, August 1993 (1993-08-01), pages 1859 - 1864, XP010111802 *
MUSAVI M.T. ET AL.: "Improving the performance of probabilistic neural networks", INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS IJCNN, vol. 1, 7 June 1992 (1992-06-07) - 11 June 1992 (1992-06-11), pages 595 - 600, XP010060217 *
RAUDYS S.: "Linear classifiers in perceptron design", PROCEEDINGS OF THE 13TH INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION, vol. 3, 25 August 1996 (1996-08-25) - 29 August 1996 (1996-08-29), pages 763 - 767, XP002968590 *

Also Published As

Publication number Publication date
US20100198764A1 (en) 2010-08-05
US20090276384A1 (en) 2009-11-05
US7698071B2 (en) 2010-04-13
AU2003220578A1 (en) 2003-10-13
JP2005524131A (en) 2005-08-11
EP1495444A2 (en) 2005-01-12
WO2003083760A2 (en) 2003-10-09
US7561971B2 (en) 2009-07-14
EP1495444A4 (en) 2008-04-09
US20030187584A1 (en) 2003-10-02
AU2003220578A8 (en) 2003-10-13

Similar Documents

Publication Publication Date Title
WO2003083760A3 (en) Methods and devices relating to estimating classifier performance
ATE512465T1 (en) STRESSED SEMICONDUCTOR DEVICE STRUCTURES USING GRANULAR SEMICONDUCTOR MATERIAL
EP2400533A3 (en) Diamond field effect transistor and process for producing the same
WO2005041503A3 (en) Method and apparatus for two-stage packet classification using most specific filter matching and transport level sharing
WO2005048309A3 (en) Delta-geometry timing prediction in integrated circuit fabrication
AU2003235902A1 (en) Semiconductor substrate manufacturing method and semiconductor device manufacturing method, and semiconductor substrate and semiconductor device manufactured by the methods
WO2005020292A3 (en) Methods and systems for improved integrated circuit functional simulation
TW200601498A (en) Cmos logic gate fabricated on hybrid crystal orientations and method of forming thereof
TW200727404A (en) Integrated circuit and method for its manufacture
ITTO20010411A0 (en) METHOD AND DEVICE FOR PERFORMING HIGH PROCESSIVE AND HIGH BIOLOGICAL VALUE TEST AND ASSAY ON CELLS AND/OR COMPOUNDS.
WO2002073521A3 (en) Automatic algorithm generation
AU2003207185A1 (en) Organic semiconductor structure, process for producing the same, and organic semiconductor device
WO2007014294A3 (en) Solutions integrated circuit integration of alternative active area materials
EP0872883A3 (en) Method for estimating yield of integrated circuit device
EP1398836A3 (en) Thin film semiconductor device and manufacturing method
TW200617369A (en) Method to inspect a wafer
ATE458219T1 (en) METHOD FOR DATA PROCESSING WITH MODULAR POTENTIATION AND ASSOCIATED DEVICE
DE60311408D1 (en) Electro-optical device, manufacturing method thereof and electronic device
TW200746340A (en) Substrate processing system and method therefor
BR0305303A (en) Manufacturing process of electronic devices using microfluidic channels
WO2006110832A3 (en) System for extracting relevant data from an intellectual property database
WO2006036578A3 (en) Method for finding paths in video
WO2007087769A3 (en) Optoelectronic semiconductor component with current spreading layer
WO2004038787A3 (en) Using scatterometry to optimize circuit structure manufacturing processes
EP1329950A3 (en) Magnetoresistive integrated circuit device and method of manufacturing the same

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NI NO NZ OM PH PL PT RO RU SC SD SE SG SK SL TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LU MC NL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
WWE Wipo information: entry into national phase

Ref document number: 2003581108

Country of ref document: JP

WWE Wipo information: entry into national phase

Ref document number: 2003716892

Country of ref document: EP

WWP Wipo information: published in national office

Ref document number: 2003716892

Country of ref document: EP