WO2004034097A3 - Apparatus and method to inspect objects - Google Patents

Apparatus and method to inspect objects Download PDF

Info

Publication number
WO2004034097A3
WO2004034097A3 PCT/US2003/031330 US0331330W WO2004034097A3 WO 2004034097 A3 WO2004034097 A3 WO 2004034097A3 US 0331330 W US0331330 W US 0331330W WO 2004034097 A3 WO2004034097 A3 WO 2004034097A3
Authority
WO
WIPO (PCT)
Prior art keywords
lens
pair
pairs
plane
optical axis
Prior art date
Application number
PCT/US2003/031330
Other languages
French (fr)
Other versions
WO2004034097A2 (en
Inventor
David M Berg
Walter E Johnson
Original Assignee
Melles Griot Inc
David M Berg
Walter E Johnson
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Melles Griot Inc, David M Berg, Walter E Johnson filed Critical Melles Griot Inc
Priority to AU2003282918A priority Critical patent/AU2003282918A1/en
Publication of WO2004034097A2 publication Critical patent/WO2004034097A2/en
Publication of WO2004034097A3 publication Critical patent/WO2004034097A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires

Abstract

This apparatus and method to inspect objects uses a plurality of pairs of plane mirrors, a lens, a single image sensing means, and illuminating means. The pairs of plane mirrors are arranged in a radially symmetrical pattern about the optical axis of the lens. The object to be viewed (typically a cylindrical object) is placed with its axis coincident with the optical axis of the lens and illuminated by the illumination means. Light travels from the object to the first or outer plane reflective surface of each pair, then to the second or inner plane reflective surface of each pair, and then to the lens that forms an image on the image sensing means. By the symmetry of the arrangement, each pair of reflective surfaces provides a similar image of the object, only from a different direction. These images can provide a complete view around the circumference of the object with overlap between adjacent views.
PCT/US2003/031330 2002-10-04 2003-10-02 Apparatus and method to inspect objects WO2004034097A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2003282918A AU2003282918A1 (en) 2002-10-04 2003-10-02 Apparatus and method to inspect objects

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/264,737 US20040066505A1 (en) 2002-10-04 2002-10-04 Apparatus and method to inspect objects
US10/264,737 2002-10-04

Publications (2)

Publication Number Publication Date
WO2004034097A2 WO2004034097A2 (en) 2004-04-22
WO2004034097A3 true WO2004034097A3 (en) 2005-01-06

Family

ID=32042314

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/031330 WO2004034097A2 (en) 2002-10-04 2003-10-02 Apparatus and method to inspect objects

Country Status (3)

Country Link
US (1) US20040066505A1 (en)
AU (1) AU2003282918A1 (en)
WO (1) WO2004034097A2 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070146692A1 (en) * 2005-12-23 2007-06-28 Xerox Corporation Fiber optic specular surface flaw detection
AT504163B1 (en) * 2006-05-16 2008-10-15 Profactor Res And Solutions Gm ARRANGEMENT AND APPROACH TO THE EXAMINATION OF OBJECTS
US9370799B2 (en) 2011-05-17 2016-06-21 Gii Acquisition, Llc Method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis
US9697596B2 (en) 2011-05-17 2017-07-04 Gii Acquisition, Llc Method and system for optically inspecting parts
US8570504B2 (en) * 2011-05-17 2013-10-29 Gii Acquisition, Llc Method and system for optically inspecting parts
US10088431B2 (en) 2011-05-17 2018-10-02 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US10094785B2 (en) 2011-05-17 2018-10-09 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US9575013B2 (en) 2011-05-17 2017-02-21 Gii Acquisition, Llc Non-contact method and system for inspecting a manufactured part at an inspection station having a measurement axis
US10184858B2 (en) * 2012-02-07 2019-01-22 CommScope Connectivity Belgium BVBA Visually inspecting optical fibers
US10207297B2 (en) 2013-05-24 2019-02-19 GII Inspection, LLC Method and system for inspecting a manufactured part at an inspection station
US10300510B2 (en) 2014-08-01 2019-05-28 General Inspection Llc High speed method and system for inspecting a stream of parts
DE102019135129B3 (en) * 2019-12-19 2021-05-20 Lisa Dräxlmaier GmbH TESTING SYSTEM FOR VISUAL CHECKING OF AN ELECTRICAL CABLE

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5644400A (en) * 1996-03-29 1997-07-01 Lam Research Corporation Method and apparatus for determining the center and orientation of a wafer-like object
US6611344B1 (en) * 1998-11-30 2003-08-26 Rahmonic Resources Pte Ltd Apparatus and method to measure three dimensional data

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3073210A (en) * 1959-01-19 1963-01-15 Joseph W Packard Prismatic reflecting device
US4511222A (en) * 1980-02-04 1985-04-16 The Charles Stark Draper Laboratory, Inc. Inspection periscope
DE3822303A1 (en) * 1987-12-10 1989-06-22 Birkle Gebhard DEVICE FOR OPTICALLY SCANNING THE SURFACE OF AN OBJECT WHOSE SURFACE IS REFLECTABLE OR SCATTERABLE AND METHOD FOR THEREFORE
US6122048A (en) * 1994-08-26 2000-09-19 Pressco Technology Inc. Integral field lens illumination for video inspection
US5592286A (en) * 1995-03-08 1997-01-07 Alltrista Corporation Container flange inspection system using an annular lens
US5699152A (en) * 1995-04-03 1997-12-16 Alltrista Corporation Electro-optical inspection system and method
JPH09196856A (en) * 1996-01-23 1997-07-31 Tsubakimoto Chain Co Surface inspecting method, and device and prism therefor
US5933231A (en) * 1996-07-10 1999-08-03 Industrial Technology Institute Method and system for measuring cavities and probe for use therein
US6441972B1 (en) * 2000-06-13 2002-08-27 Jon R. Lesniak Optical image separator

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5644400A (en) * 1996-03-29 1997-07-01 Lam Research Corporation Method and apparatus for determining the center and orientation of a wafer-like object
US6611344B1 (en) * 1998-11-30 2003-08-26 Rahmonic Resources Pte Ltd Apparatus and method to measure three dimensional data

Also Published As

Publication number Publication date
US20040066505A1 (en) 2004-04-08
AU2003282918A1 (en) 2004-05-04
AU2003282918A8 (en) 2004-05-04
WO2004034097A2 (en) 2004-04-22

Similar Documents

Publication Publication Date Title
US10670497B2 (en) Device and method for analysis of tyres comprising first and second image acquistion systems
WO2004034097A3 (en) Apparatus and method to inspect objects
KR950016899A (en) Processes and apparatus for optical inspection of the transparent part of the container, especially the agar part of the bottle
US20040165759A1 (en) Coaxial narrow angle dark field lighting
CA2156461A1 (en) Optical inspection of container finish dimensional parameters
EP0362679A3 (en) Inside surface inspection system and method therefor
WO1999026052A3 (en) Automatic lens inspection system
WO2007133330A3 (en) Substrate illumination and inspection system
CN1965222A (en) Appliance for controlling transparent or reflective elements
US10634618B2 (en) Apparatus and a method for inspecting a light transmissible optical component
EP1293834A3 (en) Illumination apparatus
CN105486690A (en) Optical detection device
US7880798B2 (en) Apparatus and method for optically converting a three-dimensional object into a two-dimensional planar image
ITMI20091351A1 (en) OPTICAL SURFACE DETECTION SYSTEM
WO2008136432A1 (en) Surface inspecting apparatus
KR20170097110A (en) Apparatus for controlling tyres in a production line
CN101443649A (en) Surface inspection device
CN203117124U (en) Check device for optical eyeglasses
JP6454913B2 (en) Inspection method for cap having bridge and inspection device for the cap
ATE438846T1 (en) INSPECTION DEVICE FOR BOTTLES
EP1770435A4 (en) Imaging apparatus
JPH10274591A (en) Transparent object magnifying observation device
KR20130108971A (en) Inspection of defects in a contact lens
KR101520636B1 (en) Optical Method and Apparatus of Image Acquisition and Illumination on Irregular Surface
CN113962238B (en) Light supplementing light source and identification code scanning device

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LU MC NL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
122 Ep: pct application non-entry in european phase
NENP Non-entry into the national phase

Ref country code: JP

WWW Wipo information: withdrawn in national office

Country of ref document: JP