WO2004044539A3 - Non-contact surface conductivity measurement probe - Google Patents

Non-contact surface conductivity measurement probe Download PDF

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Publication number
WO2004044539A3
WO2004044539A3 PCT/US2003/036029 US0336029W WO2004044539A3 WO 2004044539 A3 WO2004044539 A3 WO 2004044539A3 US 0336029 W US0336029 W US 0336029W WO 2004044539 A3 WO2004044539 A3 WO 2004044539A3
Authority
WO
WIPO (PCT)
Prior art keywords
detector
circuit
sensor
surface conductivity
contact surface
Prior art date
Application number
PCT/US2003/036029
Other languages
French (fr)
Other versions
WO2004044539A2 (en
WO2004044539B1 (en
Inventor
Kent Kinman Tam
Original Assignee
Northrop Grumman Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Northrop Grumman Corp filed Critical Northrop Grumman Corp
Priority to AU2003291492A priority Critical patent/AU2003291492A1/en
Priority to CA002505827A priority patent/CA2505827A1/en
Priority to EP03768895A priority patent/EP1561120A2/en
Priority to BR0316269-9A priority patent/BR0316269A/en
Priority to JP2004552107A priority patent/JP2006506621A/en
Publication of WO2004044539A2 publication Critical patent/WO2004044539A2/en
Publication of WO2004044539A3 publication Critical patent/WO2004044539A3/en
Publication of WO2004044539B1 publication Critical patent/WO2004044539B1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/023—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance where the material is placed in the field of a coil

Abstract

A non-contact probe (100) for determining the conductivity of coating materials is disclosed. The probe (10) includes a free running oscillator (40) operating at a selected frequency, a sensor made up of an LC circuit, a detector for detecting a change in the the LC circuit in response to change in the sensor coil (44) induction, and a microprocessor (68) for converting the detected changes in the signal to surface conductivity data. The detector may be a frequency detector that detects changes in the resonant frequency of the LC circuit or the detector may be a magnitude detector that detects changes in the signal magnitude of the LC oscillator (40). The sensor is the coil inductor (44) of the LC circuit. Inductance of the sensor coil is variable depending on conductivity of the material near the sensor coil.
PCT/US2003/036029 2002-11-13 2003-11-12 Non-contact surface conductivity measurement probe WO2004044539A2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
AU2003291492A AU2003291492A1 (en) 2002-11-13 2003-11-12 Non-contact surface conductivity measurement probe
CA002505827A CA2505827A1 (en) 2002-11-13 2003-11-12 Non-contact surface conductivity measurement probe
EP03768895A EP1561120A2 (en) 2002-11-13 2003-11-12 Non-contact surface conductivity measurement probe
BR0316269-9A BR0316269A (en) 2002-11-13 2003-11-12 Non-contact surface conductivity probe for conductivity measurement of a material
JP2004552107A JP2006506621A (en) 2002-11-13 2003-11-12 Non-contact type surface conductivity measurement probe

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/293,648 2002-11-13
US10/293,648 US6819120B2 (en) 2002-11-13 2002-11-13 Non-contact surface conductivity measurement probe

Publications (3)

Publication Number Publication Date
WO2004044539A2 WO2004044539A2 (en) 2004-05-27
WO2004044539A3 true WO2004044539A3 (en) 2004-07-15
WO2004044539B1 WO2004044539B1 (en) 2004-08-26

Family

ID=32312156

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/036029 WO2004044539A2 (en) 2002-11-13 2003-11-12 Non-contact surface conductivity measurement probe

Country Status (8)

Country Link
US (1) US6819120B2 (en)
EP (1) EP1561120A2 (en)
JP (1) JP2006506621A (en)
AU (1) AU2003291492A1 (en)
BR (1) BR0316269A (en)
CA (1) CA2505827A1 (en)
RU (1) RU2005118104A (en)
WO (1) WO2004044539A2 (en)

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US6815958B2 (en) * 2003-02-07 2004-11-09 Multimetrixs, Llc Method and apparatus for measuring thickness of thin films with improved accuracy
US20050007106A1 (en) * 2003-05-23 2005-01-13 Jentek Sensors, Inc. Hybrid wound/etched winding constructs for scanning and monitoring
US7243038B2 (en) * 2004-03-04 2007-07-10 Dowtech, Inc. Method and apparatus for testing circuit boards
US7190177B2 (en) * 2004-08-18 2007-03-13 The Curators Of The University Of Missouri Method and apparatus for nondestructive sample inspection
DE202004019489U1 (en) * 2004-12-17 2005-05-25 Cherry Gmbh Inductive sensor unit
US20060139041A1 (en) * 2004-12-23 2006-06-29 Nystrom Michael J System and method of testing and utilizing a fluid stream
US7443177B1 (en) * 2005-05-31 2008-10-28 Iowa State University Research Foundation, Inc. Characterization of conductor by alternating current potential-drop method with a four-point probe
US7528598B2 (en) * 2005-06-22 2009-05-05 Jentek Sensors, Inc. Fastener and fitting based sensing methods
WO2007059433A2 (en) * 2005-11-14 2007-05-24 Lehighton Electronics Sheet conductance/resistance measurement system
CN101324652B (en) * 2007-06-11 2011-07-13 中芯国际集成电路制造(上海)有限公司 Method and device for testing reliability
US20090002002A1 (en) * 2007-06-30 2009-01-01 Wen-Bi Hsu Electrical Testing System
KR101196904B1 (en) * 2007-07-13 2012-11-05 이노베티브 프로덕티비티 인코포레이티드 Test patch system and method
EP2250491A4 (en) * 2008-03-07 2013-06-26 California Inst Of Techn Effective-inductance-change based magnetic particle sensing
US8410948B2 (en) * 2008-05-12 2013-04-02 John Vander Horst Recreational vehicle holding tank sensor probe
US9599591B2 (en) 2009-03-06 2017-03-21 California Institute Of Technology Low cost, portable sensor for molecular assays
RU2463588C1 (en) * 2011-04-15 2012-10-10 Государственное образовательное учреждение высшего профессионального образования Иркутский государственный университет Sensor for contactless measurement of electric charge of moving mineral particles (versions)
JP2012237594A (en) 2011-05-10 2012-12-06 Micronics Japan Co Ltd Insulation measuring probe unit and insulation measuring apparatus
JP5622203B2 (en) * 2011-11-18 2014-11-12 レーザーテック株式会社 Solar cell measuring apparatus and measuring method
US9103652B2 (en) 2012-06-21 2015-08-11 International Business Machines Corporation Non-contact sheet conductivity measurements implementing a rotating magnetic braking system
US9721854B2 (en) 2012-12-05 2017-08-01 International Business Machines Corporation Structure and method for in-line defect non-contact tests
US9000774B2 (en) 2013-03-14 2015-04-07 International Business Machines Corporation Non-contact conductivity measurement
US10466287B2 (en) * 2016-05-13 2019-11-05 The Board Of Trustees Of Western Michigan University Printed wireless inductive-capacitive (LC) sensor for heavy metal detection
US10852344B2 (en) * 2017-12-12 2020-12-01 Micron Technology, Inc. Inductive testing probe apparatus for testing semiconductor die and related systems and methods
US10557897B2 (en) 2018-01-19 2020-02-11 International Business Machines Corporation Non-contact conductivity and magnetic susceptibility measurement with parallel dipole line trap system
WO2019202092A1 (en) * 2018-04-18 2019-10-24 Universiteit Twente System and method for measuring conductivity
KR20220009931A (en) * 2018-09-24 2022-01-25 라이프 디텍션 테크놀로지스, 인크. Systems and methods for detecting physical changes without physical contact
JP7266906B2 (en) * 2020-08-31 2023-05-01 セニック・インコーポレイテッド Measuring method, measuring device and ingot growth system for graphite-containing article
CN114485978B (en) * 2022-02-14 2022-10-25 湖南大学 Non-contact temperature measurement method and device based on material conductivity-temperature characteristic

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US5508610A (en) * 1992-12-03 1996-04-16 Georgia Tech Research Corporation Electrical conductivity tester and methods thereof for accurately measuring time-varying and steady state conductivity using phase shift detection
US5514337A (en) * 1994-01-11 1996-05-07 American Research Corporation Of Virginia Chemical sensor using eddy current or resonant electromagnetic circuit detection
US6184694B1 (en) * 1996-08-16 2001-02-06 The Boeing Company Portable paint thickness gauge for composite materials using resonant cavities at x-band
US6448795B1 (en) * 1999-02-12 2002-09-10 Alexei Ermakov Three coil apparatus for inductive measurements of conductance
US6462538B2 (en) * 1999-12-10 2002-10-08 Sharp Kabushiki Kaisha Eddy current detection type thin film electrical resistance meter

Also Published As

Publication number Publication date
CA2505827A1 (en) 2004-05-27
BR0316269A (en) 2005-10-11
WO2004044539A2 (en) 2004-05-27
JP2006506621A (en) 2006-02-23
AU2003291492A1 (en) 2004-06-03
RU2005118104A (en) 2006-01-20
US6819120B2 (en) 2004-11-16
US20040100277A1 (en) 2004-05-27
EP1561120A2 (en) 2005-08-10
AU2003291492A8 (en) 2004-06-03
WO2004044539B1 (en) 2004-08-26

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