WO2004049256A3 - Ray tracing kernel calibration - Google Patents

Ray tracing kernel calibration Download PDF

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Publication number
WO2004049256A3
WO2004049256A3 PCT/US2003/036252 US0336252W WO2004049256A3 WO 2004049256 A3 WO2004049256 A3 WO 2004049256A3 US 0336252 W US0336252 W US 0336252W WO 2004049256 A3 WO2004049256 A3 WO 2004049256A3
Authority
WO
WIPO (PCT)
Prior art keywords
ray tracing
tracing kernel
azimuth
coordinate
computing
Prior art date
Application number
PCT/US2003/036252
Other languages
French (fr)
Other versions
WO2004049256A2 (en
Inventor
Lionell K Griffith
Original Assignee
Digitome Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/687,180 external-priority patent/US7430271B2/en
Application filed by Digitome Corp filed Critical Digitome Corp
Priority to AU2003295507A priority Critical patent/AU2003295507A1/en
Publication of WO2004049256A2 publication Critical patent/WO2004049256A2/en
Publication of WO2004049256A3 publication Critical patent/WO2004049256A3/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00—2D [Two Dimensional] image generation
    • G06T11/003—Reconstruction from projections, e.g. tomography
    • G06T11/005—Specific pre-processing for tomographic reconstruction, e.g. calibration, source positioning, rebinning, scatter correction, retrospective gating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2211/00—Image generation
    • G06T2211/40—Computed tomography
    • G06T2211/436—Limited angle

Abstract

A ray tracing kernel calibration procedure for the film simulation mode of digitized tomosynthesis in which the coordinate of the source position with respect to an energy source, e.g., x-ray radiation, is determined. Shadow images of registration markers are used to aid in computing the azimuth; computing the elevation angle; and using the elevation angle and azimuth to compute the coordinate of source position with respect to the sensor.
PCT/US2003/036252 2002-11-13 2003-11-12 Ray tracing kernel calibration WO2004049256A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2003295507A AU2003295507A1 (en) 2002-11-13 2003-11-12 Ray tracing kernel calibration

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US42580802P 2002-11-13 2002-11-13
US60/425,808 2002-11-13
US10/687,180 2003-10-15
US10/687,180 US7430271B2 (en) 2000-11-13 2003-10-15 Ray tracing kernel

Publications (2)

Publication Number Publication Date
WO2004049256A2 WO2004049256A2 (en) 2004-06-10
WO2004049256A3 true WO2004049256A3 (en) 2004-11-04

Family

ID=32397067

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/036252 WO2004049256A2 (en) 2002-11-13 2003-11-12 Ray tracing kernel calibration

Country Status (2)

Country Link
AU (1) AU2003295507A1 (en)
WO (1) WO2004049256A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20140048658A (en) * 2012-10-16 2014-04-24 삼성전자주식회사 Apparatus and method for calibration
CN111175322B (en) * 2020-01-09 2022-08-16 昆山市建设工程质量检测中心 Slurry anchor lap joint quality detection method based on X-ray digital imaging technology

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5687209A (en) * 1995-04-11 1997-11-11 Hewlett-Packard Co. Automatic warp compensation for laminographic circuit board inspection
US6289235B1 (en) * 1998-03-05 2001-09-11 Wake Forest University Method and system for creating three-dimensional images using tomosynthetic computed tomography

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5687209A (en) * 1995-04-11 1997-11-11 Hewlett-Packard Co. Automatic warp compensation for laminographic circuit board inspection
US6289235B1 (en) * 1998-03-05 2001-09-11 Wake Forest University Method and system for creating three-dimensional images using tomosynthetic computed tomography

Also Published As

Publication number Publication date
AU2003295507A8 (en) 2004-06-18
AU2003295507A1 (en) 2004-06-18
WO2004049256A2 (en) 2004-06-10

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