WO2004102109A3 - Fourier domain low-coherence interferometry for light scattering spectroscopy apparatus and method - Google Patents

Fourier domain low-coherence interferometry for light scattering spectroscopy apparatus and method Download PDF

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Publication number
WO2004102109A3
WO2004102109A3 PCT/US2004/014070 US2004014070W WO2004102109A3 WO 2004102109 A3 WO2004102109 A3 WO 2004102109A3 US 2004014070 W US2004014070 W US 2004014070W WO 2004102109 A3 WO2004102109 A3 WO 2004102109A3
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WO
WIPO (PCT)
Prior art keywords
light scattering
fourier domain
depth
spectroscopy apparatus
scattering spectroscopy
Prior art date
Application number
PCT/US2004/014070
Other languages
French (fr)
Other versions
WO2004102109A2 (en
Inventor
Adam Wax
Original Assignee
Univ Duke
Adam Wax
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Univ Duke, Adam Wax filed Critical Univ Duke
Priority to US10/576,506 priority Critical patent/US20080318850A1/en
Publication of WO2004102109A2 publication Critical patent/WO2004102109A2/en
Publication of WO2004102109A3 publication Critical patent/WO2004102109A3/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
    • G01N15/0211—Investigating a scatter or diffraction pattern

Abstract

An apparatus and method for obtaining depth-resolved spectra for the purpose of determining the size of scatterers by measuring their elastic scattering properties. Depth resolution is achieved by using a white light source (100) in a Michelson interferometer (10) and dispersing a mixed signal and reference fields. The measured spectrum is Fourier transformed to obtain an axial spatial cross-correlation between the signal and reference fields with near 1 mm depth-resolution. The spectral dependence of scattering by the sample (108) is determined by windowing the spectrum to measure the scattering amplitude as a function of wavenumber.
PCT/US2004/014070 2003-05-06 2004-05-06 Fourier domain low-coherence interferometry for light scattering spectroscopy apparatus and method WO2004102109A2 (en)

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US10/576,506 US20080318850A1 (en) 2003-12-03 2004-05-06 Glycopegylated Factor Ix

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US10/429,756 US7102758B2 (en) 2003-05-06 2003-05-06 Fourier domain low-coherence interferometry for light scattering spectroscopy apparatus and method
US10/429,756 2003-05-06

Publications (2)

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WO2004102109A2 WO2004102109A2 (en) 2004-11-25
WO2004102109A3 true WO2004102109A3 (en) 2006-04-13

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PCT/US2004/014070 WO2004102109A2 (en) 2003-05-06 2004-05-06 Fourier domain low-coherence interferometry for light scattering spectroscopy apparatus and method

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US (2) US7102758B2 (en)
WO (1) WO2004102109A2 (en)

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Publication number Publication date
WO2004102109A2 (en) 2004-11-25
US7102758B2 (en) 2006-09-05
US20040223162A1 (en) 2004-11-11
USRE42497E1 (en) 2011-06-28

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