WO2005008195A3 - Quantification of optical properties in scattering media using fractal analysis of photon distribution measurements - Google Patents
Quantification of optical properties in scattering media using fractal analysis of photon distribution measurements Download PDFInfo
- Publication number
- WO2005008195A3 WO2005008195A3 PCT/IB2004/002303 IB2004002303W WO2005008195A3 WO 2005008195 A3 WO2005008195 A3 WO 2005008195A3 IB 2004002303 W IB2004002303 W IB 2004002303W WO 2005008195 A3 WO2005008195 A3 WO 2005008195A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- optical property
- medium
- distribution
- optical properties
- quantification
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4707—Forward scatter; Low angle scatter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4709—Backscatter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4792—Polarisation of scatter light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
- G01N2021/4797—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium time resolved, e.g. analysis of ballistic photons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4785—Standardising light scatter apparatus; Standards therefor
Abstract
An optical property of a turbid medium to be tested is determined. A light measurement device (15) is used to obtain photon distribution data regarding a parameter from light exiting from the medium (one example is the time-of-flight intensity distribution). A fractal element analyzer (16) receives the distribution data and produces a count of a number of points of the distribution in a partition element for each data point in the distribution, for each of the partition element sizes. An optical property estimator (18) receives the count and compares characteristics of a relationship of the optical property of the medium to be tested to characteristics of a relationship of the optical property obtained for a plurality of calibration media (having known optical properties) to output a value for the optical property of the medium.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US48725003P | 2003-07-16 | 2003-07-16 | |
US60/487,250 | 2003-07-16 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2005008195A2 WO2005008195A2 (en) | 2005-01-27 |
WO2005008195A3 true WO2005008195A3 (en) | 2006-04-06 |
Family
ID=34079357
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/IB2004/002303 WO2005008195A2 (en) | 2003-07-16 | 2004-07-15 | Quantification of optical properties in scattering media using fractal analysis of photon distribution measurements |
Country Status (1)
Country | Link |
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WO (1) | WO2005008195A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007522894A (en) | 2004-02-20 | 2007-08-16 | アリベックス インコーポレイテッド | Portable x-ray equipment |
US7224769B2 (en) | 2004-02-20 | 2007-05-29 | Aribex, Inc. | Digital x-ray camera |
CN102883658B (en) | 2009-11-19 | 2016-06-22 | 调节成像公司 | The method and apparatus analyzing turbid media for using structured lighting to detect via unit piece |
EP3401678B1 (en) | 2012-11-07 | 2020-04-08 | Modulated Imaging Inc. | Efficient modulated imaging |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5029475A (en) * | 1989-05-22 | 1991-07-09 | Agency Of Industrial Science And Technology | Measuring spatial distribution of spacings between point scatterers |
US5640247A (en) * | 1993-12-01 | 1997-06-17 | Hamamatsu Photonics K.K. | Method for measuring internal information in a scattering medium and apparatus for the same |
US5752519A (en) * | 1993-02-26 | 1998-05-19 | Benaron; David A. | Device and method for detection, localization, and characterization of inhomogeneities in turbid media |
US20020057433A1 (en) * | 2000-09-20 | 2002-05-16 | Menguc M. Pinar | Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation |
US6422998B1 (en) * | 1999-09-20 | 2002-07-23 | Ut-Battelle, Llc | Fractal analysis of time varying data |
US20040038264A1 (en) * | 2002-05-14 | 2004-02-26 | Souza Glauco R. | Fractal dimension analysis of nanoparticle aggregates using angle dependent light scattering for the detection and characterization of nucleic acids and proteins |
US20040181153A1 (en) * | 2003-03-12 | 2004-09-16 | Hall David Jonathan | Method and apparatus for combining continuous wave and time domain optical imaging |
-
2004
- 2004-07-15 WO PCT/IB2004/002303 patent/WO2005008195A2/en active Application Filing
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5029475A (en) * | 1989-05-22 | 1991-07-09 | Agency Of Industrial Science And Technology | Measuring spatial distribution of spacings between point scatterers |
US5752519A (en) * | 1993-02-26 | 1998-05-19 | Benaron; David A. | Device and method for detection, localization, and characterization of inhomogeneities in turbid media |
US5640247A (en) * | 1993-12-01 | 1997-06-17 | Hamamatsu Photonics K.K. | Method for measuring internal information in a scattering medium and apparatus for the same |
US6422998B1 (en) * | 1999-09-20 | 2002-07-23 | Ut-Battelle, Llc | Fractal analysis of time varying data |
US20020057433A1 (en) * | 2000-09-20 | 2002-05-16 | Menguc M. Pinar | Non-intrusive method and apparatus for characterizing particles based on scattering matrix elements measurements using elliptically polarized radiation |
US20040038264A1 (en) * | 2002-05-14 | 2004-02-26 | Souza Glauco R. | Fractal dimension analysis of nanoparticle aggregates using angle dependent light scattering for the detection and characterization of nucleic acids and proteins |
US20040181153A1 (en) * | 2003-03-12 | 2004-09-16 | Hall David Jonathan | Method and apparatus for combining continuous wave and time domain optical imaging |
Also Published As
Publication number | Publication date |
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WO2005008195A2 (en) | 2005-01-27 |
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