WO2005031789A3 - Method, system and device for microscopic examination employing fib-prepared sample grasping element - Google Patents

Method, system and device for microscopic examination employing fib-prepared sample grasping element Download PDF

Info

Publication number
WO2005031789A3
WO2005031789A3 PCT/US2004/031482 US2004031482W WO2005031789A3 WO 2005031789 A3 WO2005031789 A3 WO 2005031789A3 US 2004031482 W US2004031482 W US 2004031482W WO 2005031789 A3 WO2005031789 A3 WO 2005031789A3
Authority
WO
WIPO (PCT)
Prior art keywords
grasping element
microscopic examination
substrate
prepared sample
fib
Prior art date
Application number
PCT/US2004/031482
Other languages
French (fr)
Other versions
WO2005031789A2 (en
Inventor
George Skidmore
Matthew D Ellis
Aaron Geisberger
Kenneth Bray
Kimberly Tuck
Robert Folaron
Original Assignee
Zyvex Corp
George Skidmore
Matthew D Ellis
Aaron Geisberger
Kenneth Bray
Kimberly Tuck
Robert Folaron
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zyvex Corp, George Skidmore, Matthew D Ellis, Aaron Geisberger, Kenneth Bray, Kimberly Tuck, Robert Folaron filed Critical Zyvex Corp
Priority to EP04785036A priority Critical patent/EP1671346A2/en
Priority to JP2006528252A priority patent/JP2007506981A/en
Priority to KR1020067007692A priority patent/KR100984608B1/en
Priority to CN2004800311077A priority patent/CN1871684B/en
Publication of WO2005031789A2 publication Critical patent/WO2005031789A2/en
Publication of WO2005031789A3 publication Critical patent/WO2005031789A3/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/18—Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel
    • H01J37/185—Means for transferring objects between different enclosures of different pressure or atmosphere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/32—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring the deformation in a solid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/286—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/32—Polishing; Etching
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/305—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating or etching
    • H01J37/3053—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating or etching for evaporating or etching
    • H01J37/3056—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating or etching for evaporating or etching for microworking, e.g. etching of gratings, trimming of electrical components
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/286—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising
    • G01N2001/2873—Cutting or cleaving
    • G01N2001/2886—Laser cutting, e.g. tissue catapult
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/32—Micromanipulators structurally combined with microscopes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2007—Holding mechanisms
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/204—Means for introducing and/or outputting objects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30—Electron or ion beam tubes for processing objects
    • H01J2237/317—Processing objects on a microscale
    • H01J2237/3174—Etching microareas
    • H01J2237/31745—Etching microareas for preparing specimen to be viewed in microscopes or analyzed in microanalysers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30—Electron or ion beam tubes for processing objects
    • H01J2237/317—Processing objects on a microscale
    • H01J2237/31749—Focused ion beam

Abstract

A method including, in one embodiment, severing a sample at least partially from a substrate by cutting the substrate with a focused ion beam (FIB), capturing the substrate sample by activating a grasping element (155), and separating the captured sample from the substrate. The captured sample may be separated from the substrate and transported to an electron microscope (190) for examination.
PCT/US2004/031482 2003-09-23 2004-09-23 Method, system and device for microscopic examination employing fib-prepared sample grasping element WO2005031789A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP04785036A EP1671346A2 (en) 2003-09-23 2004-09-23 Method, system and device for microscopic examination employing fib-prepared sample grasping element
JP2006528252A JP2007506981A (en) 2003-09-23 2004-09-23 Method, system, and apparatus for microscopy using an element that grips a sample prepared with FIB
KR1020067007692A KR100984608B1 (en) 2003-09-23 2004-09-23 Method, system and device for microscopic examination employing fib-prepared sample grasping element
CN2004800311077A CN1871684B (en) 2003-09-23 2004-09-23 Method, system and device for microscopic examination employing fib-prepared sample grasping element

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US50502603P 2003-09-23 2003-09-23
US60/505,026 2003-09-23
US54684004P 2004-02-23 2004-02-23
US60/546,840 2004-02-23

Publications (2)

Publication Number Publication Date
WO2005031789A2 WO2005031789A2 (en) 2005-04-07
WO2005031789A3 true WO2005031789A3 (en) 2005-05-06

Family

ID=34396231

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2004/031482 WO2005031789A2 (en) 2003-09-23 2004-09-23 Method, system and device for microscopic examination employing fib-prepared sample grasping element

Country Status (6)

Country Link
US (2) US7227140B2 (en)
EP (1) EP1671346A2 (en)
JP (1) JP2007506981A (en)
KR (1) KR100984608B1 (en)
CN (1) CN1871684B (en)
WO (1) WO2005031789A2 (en)

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US20070187623A1 (en) 2007-08-16
WO2005031789A2 (en) 2005-04-07
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JP2007506981A (en) 2007-03-22
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