WO2005034032A3 - Detecting one or more photons from their interactions with probe photons in a matter system - Google Patents
Detecting one or more photons from their interactions with probe photons in a matter system Download PDFInfo
- Publication number
- WO2005034032A3 WO2005034032A3 PCT/US2004/032013 US2004032013W WO2005034032A3 WO 2005034032 A3 WO2005034032 A3 WO 2005034032A3 US 2004032013 W US2004032013 W US 2004032013W WO 2005034032 A3 WO2005034032 A3 WO 2005034032A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- photons
- energy level
- matter system
- detecting
- interactions
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N10/00—Quantum computing, i.e. information processing based on quantum-mechanical phenomena
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04789267A EP1668573A2 (en) | 2003-10-03 | 2004-09-28 | Detecting one or more photons from their interactions with probe photons in a matter system |
JP2006534063A JP2007507717A (en) | 2003-10-03 | 2004-09-28 | Apparatus or method for detecting one or more photons from the interaction of one or more photons with a probe photon in a matter system |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/678,437 US7002133B2 (en) | 2003-04-11 | 2003-10-03 | Detecting one or more photons from their interactions with probe photons in a matter system |
US10/678,437 | 2003-10-03 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2005034032A2 WO2005034032A2 (en) | 2005-04-14 |
WO2005034032A3 true WO2005034032A3 (en) | 2005-08-18 |
Family
ID=34422147
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2004/032013 WO2005034032A2 (en) | 2003-10-03 | 2004-09-28 | Detecting one or more photons from their interactions with probe photons in a matter system |
Country Status (4)
Country | Link |
---|---|
US (1) | US7002133B2 (en) |
EP (1) | EP1668573A2 (en) |
JP (1) | JP2007507717A (en) |
WO (1) | WO2005034032A2 (en) |
Families Citing this family (45)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5345170A (en) * | 1992-06-11 | 1994-09-06 | Cascade Microtech, Inc. | Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
US6232789B1 (en) * | 1997-05-28 | 2001-05-15 | Cascade Microtech, Inc. | Probe holder for low current measurements |
US5729150A (en) * | 1995-12-01 | 1998-03-17 | Cascade Microtech, Inc. | Low-current probe card with reduced triboelectric current generating cables |
US5914613A (en) | 1996-08-08 | 1999-06-22 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
US6002263A (en) * | 1997-06-06 | 1999-12-14 | Cascade Microtech, Inc. | Probe station having inner and outer shielding |
US6034533A (en) * | 1997-06-10 | 2000-03-07 | Tervo; Paul A. | Low-current pogo probe card |
US6256882B1 (en) * | 1998-07-14 | 2001-07-10 | Cascade Microtech, Inc. | Membrane probing system |
US6578264B1 (en) * | 1999-06-04 | 2003-06-17 | Cascade Microtech, Inc. | Method for constructing a membrane probe using a depression |
US6445202B1 (en) * | 1999-06-30 | 2002-09-03 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
US6838890B2 (en) * | 2000-02-25 | 2005-01-04 | Cascade Microtech, Inc. | Membrane probing system |
US6965226B2 (en) | 2000-09-05 | 2005-11-15 | Cascade Microtech, Inc. | Chuck for holding a device under test |
US6914423B2 (en) | 2000-09-05 | 2005-07-05 | Cascade Microtech, Inc. | Probe station |
DE10143173A1 (en) | 2000-12-04 | 2002-06-06 | Cascade Microtech Inc | Wafer probe has contact finger array with impedance matching network suitable for wide band |
AU2002327490A1 (en) * | 2001-08-21 | 2003-06-30 | Cascade Microtech, Inc. | Membrane probing system |
US6836135B2 (en) * | 2001-08-31 | 2004-12-28 | Cascade Microtech, Inc. | Optical testing device |
US6777964B2 (en) * | 2002-01-25 | 2004-08-17 | Cascade Microtech, Inc. | Probe station |
US6951846B2 (en) * | 2002-03-07 | 2005-10-04 | The United States Of America As Represented By The Secretary Of The Army | Artemisinins with improved stability and bioavailability for therapeutic drug development and application |
US6724205B1 (en) * | 2002-11-13 | 2004-04-20 | Cascade Microtech, Inc. | Probe for combined signals |
US7250779B2 (en) * | 2002-11-25 | 2007-07-31 | Cascade Microtech, Inc. | Probe station with low inductance path |
US6861856B2 (en) * | 2002-12-13 | 2005-03-01 | Cascade Microtech, Inc. | Guarded tub enclosure |
US7560726B2 (en) * | 2003-02-11 | 2009-07-14 | Hewlett-Packard Development Company, L.P. | Quantum information processing using electromagnetically induced transparency |
US7221172B2 (en) * | 2003-05-06 | 2007-05-22 | Cascade Microtech, Inc. | Switched suspended conductor and connection |
US7492172B2 (en) | 2003-05-23 | 2009-02-17 | Cascade Microtech, Inc. | Chuck for holding a device under test |
US7057404B2 (en) | 2003-05-23 | 2006-06-06 | Sharp Laboratories Of America, Inc. | Shielded probe for testing a device under test |
US7250626B2 (en) | 2003-10-22 | 2007-07-31 | Cascade Microtech, Inc. | Probe testing structure |
JP4047795B2 (en) * | 2003-10-31 | 2008-02-13 | 株式会社東芝 | Quantum calculation method and quantum computer |
US7427868B2 (en) | 2003-12-24 | 2008-09-23 | Cascade Microtech, Inc. | Active wafer probe |
US7187188B2 (en) * | 2003-12-24 | 2007-03-06 | Cascade Microtech, Inc. | Chuck with integrated wafer support |
US7330041B2 (en) * | 2004-06-14 | 2008-02-12 | Cascade Microtech, Inc. | Localizing a temperature of a device for testing |
DE202005021386U1 (en) * | 2004-07-07 | 2007-11-29 | Cascade Microtech, Inc., Beaverton | Probe with a sensor with membrane suspension |
US7420381B2 (en) | 2004-09-13 | 2008-09-02 | Cascade Microtech, Inc. | Double sided probing structures |
FR2879381B1 (en) * | 2004-12-15 | 2008-12-26 | Thales Sa | QUANTUM QUANTUM DISTRIBUTION SYSTEM OF CONTINUOUSLY VARIABLE ENCRYPTION KEY |
US7535247B2 (en) | 2005-01-31 | 2009-05-19 | Cascade Microtech, Inc. | Interface for testing semiconductors |
US7656172B2 (en) | 2005-01-31 | 2010-02-02 | Cascade Microtech, Inc. | System for testing semiconductors |
US20070294047A1 (en) * | 2005-06-11 | 2007-12-20 | Leonard Hayden | Calibration system |
US7403028B2 (en) | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
US7764072B2 (en) | 2006-06-12 | 2010-07-27 | Cascade Microtech, Inc. | Differential signal probing system |
US7723999B2 (en) | 2006-06-12 | 2010-05-25 | Cascade Microtech, Inc. | Calibration structures for differential signal probing |
US7876114B2 (en) | 2007-08-08 | 2011-01-25 | Cascade Microtech, Inc. | Differential waveguide probe |
US7888957B2 (en) | 2008-10-06 | 2011-02-15 | Cascade Microtech, Inc. | Probing apparatus with impedance optimized interface |
US8410806B2 (en) | 2008-11-21 | 2013-04-02 | Cascade Microtech, Inc. | Replaceable coupon for a probing apparatus |
US8319503B2 (en) | 2008-11-24 | 2012-11-27 | Cascade Microtech, Inc. | Test apparatus for measuring a characteristic of a device under test |
DE102010023362B9 (en) | 2010-06-11 | 2013-01-10 | Forschungsverbund Berlin E.V. | Method and device for precise performance determination below the quantum noise limit |
FI122887B (en) * | 2010-09-20 | 2012-08-31 | Aalto Korkeakoulusaeaetioe | Method and apparatus for detecting individual microwave photons in a metallic waveguide |
CN112393810B (en) | 2019-08-16 | 2022-02-18 | 华为技术有限公司 | Single photon detection device and method |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3469897B2 (en) | 1992-10-15 | 2003-11-25 | 財団法人微生物化学研究会 | New amino acid derivatives |
WO2003040899A2 (en) * | 2001-11-06 | 2003-05-15 | The Johns Hopkins University | Techniques for performing logic operations using quantum states of single photons |
-
2003
- 2003-10-03 US US10/678,437 patent/US7002133B2/en not_active Expired - Lifetime
-
2004
- 2004-09-28 EP EP04789267A patent/EP1668573A2/en not_active Withdrawn
- 2004-09-28 WO PCT/US2004/032013 patent/WO2005034032A2/en active Application Filing
- 2004-09-28 JP JP2006534063A patent/JP2007507717A/en active Pending
Non-Patent Citations (4)
Title |
---|
IMOTO N ET AL: "Quantum nondemolition measurement of the photon number via the optical Kerr effect", PHYSICAL REVIEW A (GENERAL PHYSICS) USA, vol. 32, no. 4, October 1985 (1985-10-01), pages 2287 - 2292, XP002320120, ISSN: 0556-2791 * |
MIN YAN ET AL: "Nonlinear absorption by quantum interference in cold atoms", OPTICS LETTERS OPT. SOC. AMERICA USA, vol. 26, no. 8, 15 April 2001 (2001-04-15), pages 548 - 550, XP002320903, ISSN: 0146-9592 * |
OPATRNY T ET AL: "Coupled cavities for enhancing the cross-phase-modulation in electromagnetically induced transparency", PHYSICAL REVIEW A (ATOMIC, MOLECULAR, AND OPTICAL PHYSICS) APS THROUGH AIP USA, vol. 64, no. 2, 9 July 2001 (2001-07-09), pages 023805/1 - 9, XP002320902, ISSN: 1050-2947 * |
SCHMIDT H ET AL: "Giant Kerr nonlinearities obtained by electromagnetically induced transparency", OPTICS LETTERS OPT. SOC. AMERICA USA, vol. 21, no. 23, 1 December 1996 (1996-12-01), pages 1936 - 1938, XP002320121, ISSN: 0146-9592 * |
Also Published As
Publication number | Publication date |
---|---|
US7002133B2 (en) | 2006-02-21 |
JP2007507717A (en) | 2007-03-29 |
US20040200950A1 (en) | 2004-10-14 |
EP1668573A2 (en) | 2006-06-14 |
WO2005034032A2 (en) | 2005-04-14 |
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