WO2005054955A3 - Lithographic apparatus and device manufacturing method - Google Patents

Lithographic apparatus and device manufacturing method Download PDF

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Publication number
WO2005054955A3
WO2005054955A3 PCT/EP2004/013310 EP2004013310W WO2005054955A3 WO 2005054955 A3 WO2005054955 A3 WO 2005054955A3 EP 2004013310 W EP2004013310 W EP 2004013310W WO 2005054955 A3 WO2005054955 A3 WO 2005054955A3
Authority
WO
WIPO (PCT)
Prior art keywords
joint
device manufacturing
lithographic apparatus
lens
support
Prior art date
Application number
PCT/EP2004/013310
Other languages
French (fr)
Other versions
WO2005054955A2 (en
Inventor
Bob Streefkerk
Johannes Jacobus Mat Baselmans
Paul Graupner
Jan Haisma
Nicodemus Hattu
Christaan Alexander Hoogendam
Erik Roelof Loopstra
Johannes Catharinus Hu Mulkens
Bernard Gellrich
Original Assignee
Asml Netherlands Bv
Zeiss Carl Smt Ag
Bob Streefkerk
Johannes Jacobus Mat Baselmans
Paul Graupner
Jan Haisma
Nicodemus Hattu
Christaan Alexander Hoogendam
Erik Roelof Loopstra
Johannes Catharinus Hu Mulkens
Bernard Gellrich
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv, Zeiss Carl Smt Ag, Bob Streefkerk, Johannes Jacobus Mat Baselmans, Paul Graupner, Jan Haisma, Nicodemus Hattu, Christaan Alexander Hoogendam, Erik Roelof Loopstra, Johannes Catharinus Hu Mulkens, Bernard Gellrich filed Critical Asml Netherlands Bv
Publication of WO2005054955A2 publication Critical patent/WO2005054955A2/en
Publication of WO2005054955A3 publication Critical patent/WO2005054955A3/en

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70341Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/7095Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient

Abstract

The joint between the lens (21) and its support (22) comprises an inorganic layer or a direct bond and is thus liquid tight which prevents deformation by the immersion liquid. The joint can be made either warm or cold. Solders, glue, and glue protection can all be used in the formation of this joint. The lens (21) and its support (22) are preferably made of quartz.
PCT/EP2004/013310 2003-11-24 2004-11-24 Lithographic apparatus and device manufacturing method WO2005054955A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/719,683 2003-11-24
US10/719,683 US7545481B2 (en) 2003-11-24 2003-11-24 Lithographic apparatus and device manufacturing method

Publications (2)

Publication Number Publication Date
WO2005054955A2 WO2005054955A2 (en) 2005-06-16
WO2005054955A3 true WO2005054955A3 (en) 2006-01-05

Family

ID=34591399

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2004/013310 WO2005054955A2 (en) 2003-11-24 2004-11-24 Lithographic apparatus and device manufacturing method

Country Status (4)

Country Link
US (2) US7545481B2 (en)
CN (1) CN1906541A (en)
TW (1) TWI261150B (en)
WO (1) WO2005054955A2 (en)

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US8937704B2 (en) 2003-07-31 2015-01-20 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method involving a resistivity sensor
US8941810B2 (en) 2005-12-30 2015-01-27 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US9104117B2 (en) 2004-07-07 2015-08-11 Bob Streefkerk Lithographic apparatus having a liquid detection system
US9250537B2 (en) 2004-07-12 2016-02-02 Nikon Corporation Immersion exposure apparatus and method with detection of liquid on members of the apparatus
US9256136B2 (en) 2010-04-22 2016-02-09 Asml Netherlands B.V. Fluid handling structure, lithographic apparatus and device manufacturing method involving gas supply
US9366972B2 (en) 2002-11-12 2016-06-14 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US9429495B2 (en) 2004-06-04 2016-08-30 Carl Zeiss Smt Gmbh System for measuring the image quality of an optical imaging system
US9477160B2 (en) 2003-05-13 2016-10-25 Asml Netherland B.V. Lithographic apparatus and device manufacturing method
US9482966B2 (en) 2002-11-12 2016-11-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
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Publication number Priority date Publication date Assignee Title
DE60335595D1 (en) * 2002-11-12 2011-02-17 Asml Netherlands Bv Immersion lithographic apparatus and method of making a device
US7110081B2 (en) 2002-11-12 2006-09-19 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
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US10503084B2 (en) 2002-11-12 2019-12-10 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
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US7948604B2 (en) * 2002-12-10 2011-05-24 Nikon Corporation Exposure apparatus and method for producing device
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US7242455B2 (en) * 2002-12-10 2007-07-10 Nikon Corporation Exposure apparatus and method for producing device
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DE10261775A1 (en) * 2002-12-20 2004-07-01 Carl Zeiss Smt Ag Device for the optical measurement of an imaging system
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ATE426914T1 (en) * 2003-04-07 2009-04-15 Nikon Corp EXPOSURE APPARATUS AND METHOD FOR PRODUCING AN APPARATUS
KR20110104084A (en) 2003-04-09 2011-09-21 가부시키가이샤 니콘 Immersion lithography fluid control system
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JP4656057B2 (en) * 2003-04-10 2011-03-23 株式会社ニコン Electro-osmotic element for immersion lithography equipment
WO2004090634A2 (en) * 2003-04-10 2004-10-21 Nikon Corporation Environmental system including vaccum scavange for an immersion lithography apparatus
SG139736A1 (en) 2003-04-11 2008-02-29 Nikon Corp Apparatus having an immersion fluid system configured to maintain immersion fluid in a gap adjacent an optical assembly
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KR101369582B1 (en) 2003-04-17 2014-03-04 가부시키가이샤 니콘 Optical arrangement of autofocus elements for use with immersion lithography
CN100437358C (en) * 2003-05-15 2008-11-26 株式会社尼康 Exposure apparatus and device manufacturing method
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EP1672682A4 (en) 2003-10-08 2008-10-15 Zao Nikon Co Ltd Substrate transporting apparatus and method, exposure apparatus and method, and device producing method
EP1672681B8 (en) 2003-10-08 2011-09-21 Miyagi Nikon Precision Co., Ltd. Exposure apparatus, substrate carrying method, exposure method, and method for producing device
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JPWO2005057635A1 (en) * 2003-12-15 2007-07-05 株式会社ニコン Projection exposure apparatus, stage apparatus, and exposure method
US20070081133A1 (en) * 2004-12-14 2007-04-12 Niikon Corporation Projection exposure apparatus and stage unit, and exposure method
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US7589822B2 (en) 2004-02-02 2009-09-15 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
KR101227211B1 (en) 2004-02-03 2013-01-28 가부시키가이샤 니콘 Exposure apparatus and method of producing device
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US8054448B2 (en) * 2004-05-04 2011-11-08 Nikon Corporation Apparatus and method for providing fluid for immersion lithography
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CN101819386B (en) 2004-06-09 2013-10-09 尼康股份有限公司 Exposure apparatus and device manufacturing method
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US7481867B2 (en) 2004-06-16 2009-01-27 Edwards Limited Vacuum system for immersion photolithography
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US7405805B2 (en) * 2004-12-28 2008-07-29 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
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US20090262316A1 (en) * 2005-01-31 2009-10-22 Nikon Corporation Exposure apparatus and method for producing device
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US7282701B2 (en) * 2005-02-28 2007-10-16 Asml Netherlands B.V. Sensor for use in a lithographic apparatus
US7684010B2 (en) * 2005-03-09 2010-03-23 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method, seal structure, method of removing an object and a method of sealing
USRE43576E1 (en) 2005-04-08 2012-08-14 Asml Netherlands B.V. Dual stage lithographic apparatus and device manufacturing method
US7535644B2 (en) * 2005-08-12 2009-05-19 Asml Netherlands B.V. Lens element, lithographic apparatus, device manufacturing method, and device manufactured thereby
US7357768B2 (en) * 2005-09-22 2008-04-15 William Marshall Recliner exerciser
JP4514225B2 (en) 2005-11-16 2010-07-28 キヤノン株式会社 Exposure apparatus and device manufacturing method
US20070124987A1 (en) * 2005-12-05 2007-06-07 Brown Jeffrey K Electronic pest control apparatus
KR100768849B1 (en) * 2005-12-06 2007-10-22 엘지전자 주식회사 Power supply apparatus and method for line conection type fuel cell system
US7893047B2 (en) * 2006-03-03 2011-02-22 Arch Chemicals, Inc. Biocide composition comprising pyrithione and pyrrole derivatives
DE102006021797A1 (en) 2006-05-09 2007-11-15 Carl Zeiss Smt Ag Optical imaging device with thermal damping
DE102006050653A1 (en) 2006-10-24 2008-04-30 Carl Zeiss Smt Ag Method for connecting an optical element with a fitting on at least one connecting site used in semiconductor lithography comprises indirectly or directly positioning the element and the fitting during connection using a support element
US8817226B2 (en) 2007-02-15 2014-08-26 Asml Holding N.V. Systems and methods for insitu lens cleaning using ozone in immersion lithography
US8654305B2 (en) * 2007-02-15 2014-02-18 Asml Holding N.V. Systems and methods for insitu lens cleaning in immersion lithography
US8237911B2 (en) 2007-03-15 2012-08-07 Nikon Corporation Apparatus and methods for keeping immersion fluid adjacent to an optical assembly during wafer exchange in an immersion lithography machine
US7969555B2 (en) * 2007-03-16 2011-06-28 Industry-Academic Cooperation Foundation, Yonsei University Lens structure, optical system having the same, and lithography method using the optical system
KR101448152B1 (en) * 2008-03-26 2014-10-07 삼성전자주식회사 Distance measuring sensor having vertical photogate and three dimensional color image sensor having the same
JP5097166B2 (en) * 2008-05-28 2012-12-12 エーエスエムエル ネザーランズ ビー.ブイ. Lithographic apparatus and method of operating the apparatus
US8946514B2 (en) * 2009-12-28 2015-02-03 E.I. Du Pont De Nemours And Company Sorghum fertility restorer genotypes and methods of marker-assisted selection
CN102998906B (en) * 2011-09-08 2015-01-21 上海微电子装备有限公司 Support structure of lithography machine and manufacture method
CN104090345B (en) * 2014-07-28 2016-03-30 中国科学院光电技术研究所 A kind of heavy caliber lens assembling device
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CN109714504B (en) * 2017-10-25 2021-03-05 佳能株式会社 Image pickup apparatus
US11415893B2 (en) 2017-10-30 2022-08-16 Asml Holding N. V. Assembly for use in semiconductor photolithography and method of manufacturing same
CN109085688B (en) * 2018-09-30 2021-02-19 江西联创电子有限公司 Imaging device and lens system

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58202448A (en) * 1982-05-21 1983-11-25 Hitachi Ltd Exposing device
JPH06124873A (en) * 1992-10-09 1994-05-06 Canon Inc Liquid-soaking type projection exposure apparatus
US5610683A (en) * 1992-11-27 1997-03-11 Canon Kabushiki Kaisha Immersion type projection exposure apparatus
US20010055826A1 (en) * 2000-06-16 2001-12-27 Keiko Chiba Method for manufacturing optical element, optical element, optical system using optical element, optical apparatus and exposure apparatus using optical system, and method for manufacturing device
US6417974B1 (en) * 1999-06-26 2002-07-09 Karl-Heinz Schuster Objective, in particular an objective for a semiconductor lithography projection exposure machine, and a production method

Family Cites Families (104)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE206607C (en)
DE242880C (en)
US396705A (en) * 1889-01-22 Emil meyer
DE221563C (en)
DE224448C (en)
US3253331A (en) * 1962-12-06 1966-05-31 Westinghouse Electric Corp Glass-metallizing technique
GB1242527A (en) * 1967-10-20 1971-08-11 Kodak Ltd Optical instruments
US3573975A (en) * 1968-07-10 1971-04-06 Ibm Photochemical fabrication process
US4200794A (en) * 1978-11-08 1980-04-29 Control Data Corporation Micro lens array and micro deflector assembly for fly's eye electron beam tubes using silicon components and techniques of fabrication and assembly
NL7904283A (en) * 1979-05-31 1980-12-02 Philips Nv COUPLING ELEMENT WITH A LIGHT SOURCE AND A LENS-SHAPED ELEMENT.
ATE1462T1 (en) 1979-07-27 1982-08-15 Werner W. Dr. Tabarelli OPTICAL LITHOGRAPHY PROCESS AND DEVICE FOR COPYING A PATTERN ONTO A SEMICONDUCTOR DISC.
FR2474708B1 (en) 1980-01-24 1987-02-20 Dme HIGH-RESOLUTION MICROPHOTOLITHOGRAPHY PROCESS
JPS5754317A (en) 1980-09-19 1982-03-31 Hitachi Ltd Method and device for forming pattern
US4346164A (en) * 1980-10-06 1982-08-24 Werner Tabarelli Photolithographic method for the manufacture of integrated circuits
US4509852A (en) * 1980-10-06 1985-04-09 Werner Tabarelli Apparatus for the photolithographic manufacture of integrated circuit elements
US4390273A (en) * 1981-02-17 1983-06-28 Censor Patent-Und Versuchsanstalt Projection mask as well as a method and apparatus for the embedding thereof and projection printing system
JPS57153433A (en) * 1981-03-18 1982-09-22 Hitachi Ltd Manufacturing device for semiconductor
DD206607A1 (en) 1982-06-16 1984-02-01 Mikroelektronik Zt Forsch Tech METHOD AND DEVICE FOR ELIMINATING INTERFERENCE EFFECTS
DD242880A1 (en) 1983-01-31 1987-02-11 Kuch Karl Heinz DEVICE FOR PHOTOLITHOGRAPHIC STRUCTURAL TRANSMISSION
DD221563A1 (en) 1983-09-14 1985-04-24 Mikroelektronik Zt Forsch Tech IMMERSIONS OBJECTIVE FOR THE STEP-BY-STEP PROJECTION IMAGING OF A MASK STRUCTURE
DD224448A1 (en) 1984-03-01 1985-07-03 Zeiss Jena Veb Carl DEVICE FOR PHOTOLITHOGRAPHIC STRUCTURAL TRANSMISSION
NL8501773A (en) * 1985-06-20 1987-01-16 Philips Nv METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES
JPS6265326A (en) 1985-09-18 1987-03-24 Hitachi Ltd Exposure device
JPS62121417A (en) 1985-11-22 1987-06-02 Hitachi Ltd Liquid-immersion objective lens device
JPS63157419A (en) 1986-12-22 1988-06-30 Toshiba Corp Fine pattern transfer apparatus
US5040020A (en) * 1988-03-31 1991-08-13 Cornell Research Foundation, Inc. Self-aligned, high resolution resonant dielectric lithography
JPH03209479A (en) 1989-09-06 1991-09-12 Sanee Giken Kk Exposure method
NL8902271A (en) * 1989-09-12 1991-04-02 Philips Nv METHOD FOR CONNECTING TWO BODIES.
US5121256A (en) * 1991-03-14 1992-06-09 The Board Of Trustees Of The Leland Stanford Junior University Lithography system employing a solid immersion lens
JPH04305917A (en) 1991-04-02 1992-10-28 Nikon Corp Adhesion type exposure device
JPH04305915A (en) 1991-04-02 1992-10-28 Nikon Corp Adhesion type exposure device
US5428482A (en) * 1991-11-04 1995-06-27 General Signal Corporation Decoupled mount for optical element and stacked annuli assembly
US5436766A (en) * 1992-09-04 1995-07-25 Lockheed Missiles & Space Company, Inc. Bond between a rigid refractive element and a surrounding housing structure in an optical system containing a liquid refractive element
JP2520833B2 (en) 1992-12-21 1996-07-31 東京エレクトロン株式会社 Immersion type liquid treatment device
JPH07220990A (en) 1994-01-28 1995-08-18 Hitachi Ltd Pattern forming method and exposure apparatus therefor
JPH08316124A (en) * 1995-05-19 1996-11-29 Hitachi Ltd Method and apparatus for projection exposing
EP0780345A1 (en) * 1995-12-22 1997-06-25 Corning Incorporated Optical element for UV transmission
US5754893A (en) * 1996-01-26 1998-05-19 Asahi Kogaku Kogyo Kabushiki Kaisha Lens barrel having waterproof coating
US6104687A (en) * 1996-08-26 2000-08-15 Digital Papyrus Corporation Method and apparatus for coupling an optical lens to a disk through a coupling medium having a relatively high index of refraction
US5825043A (en) * 1996-10-07 1998-10-20 Nikon Precision Inc. Focusing and tilting adjustment system for lithography aligner, manufacturing apparatus or inspection apparatus
JP3612920B2 (en) 1997-02-14 2005-01-26 ソニー株式会社 Exposure apparatus for producing an optical recording medium master
JPH10255319A (en) 1997-03-12 1998-09-25 Hitachi Maxell Ltd Master disk exposure device and method therefor
EP1014429A4 (en) * 1997-04-18 2000-07-19 Nikon Corp Method and device for exposure control, method and device for exposure, and method of manufacture of device
JP3747566B2 (en) 1997-04-23 2006-02-22 株式会社ニコン Immersion exposure equipment
JP3817836B2 (en) 1997-06-10 2006-09-06 株式会社ニコン EXPOSURE APPARATUS, ITS MANUFACTURING METHOD, EXPOSURE METHOD, AND DEVICE MANUFACTURING METHOD
US5900354A (en) * 1997-07-03 1999-05-04 Batchelder; John Samuel Method for optical inspection and lithography
DE19735760A1 (en) * 1997-08-18 1999-02-25 Zeiss Carl Fa Soldering an optical component to a metal mounting
US6147817A (en) * 1997-12-11 2000-11-14 Nippon Sheet Glass Co., Ltd. Optical module
JPH11176727A (en) 1997-12-11 1999-07-02 Nikon Corp Projection aligner
EP1039511A4 (en) 1997-12-12 2005-03-02 Nikon Corp Projection exposure method and projection aligner
DE19755356A1 (en) * 1997-12-12 1999-06-17 Zeiss Carl Fa VUV-resistant connection technology for lenses and frames
AU2747999A (en) 1998-03-26 1999-10-18 Nikon Corporation Projection exposure method and system
DE19818962A1 (en) * 1998-04-28 1999-11-04 Degussa Method for connecting two solid bodies and the component produced in this way
EP1098360A4 (en) * 1998-06-15 2004-09-15 Nikon Corp Position sensing method, position sensor, exposure method, exposure apparatus, and production process thereof, and device and device manufacturing method
JP2000058436A (en) 1998-08-11 2000-02-25 Nikon Corp Projection aligner and exposure method
TWI242111B (en) * 1999-04-19 2005-10-21 Asml Netherlands Bv Gas bearings for use in vacuum chambers and their application in lithographic projection apparatus
US6448568B1 (en) * 1999-07-30 2002-09-10 Applied Materials, Inc. Electron beam column using high numerical aperture photocathode source illumination
JP4504479B2 (en) 1999-09-21 2010-07-14 オリンパス株式会社 Immersion objective lens for microscope
FR2803047B1 (en) * 1999-12-23 2002-07-19 Opticom Innovation HYBRID OPTOCOUPLING COMPONENT
JP2001272604A (en) * 2000-03-27 2001-10-05 Olympus Optical Co Ltd Immersion objective lens and optical device using the same
KR100714927B1 (en) * 2000-04-25 2007-05-07 에이에스엠엘 유에스, 인크. Apparatus, system, and method for precision positioning and alignment of a lens in an optical system
TW591653B (en) * 2000-08-08 2004-06-11 Koninkl Philips Electronics Nv Method of manufacturing an optically scannable information carrier
KR100866818B1 (en) * 2000-12-11 2008-11-04 가부시키가이샤 니콘 Projection optical system and exposure apparatus comprising the same
WO2002091078A1 (en) * 2001-05-07 2002-11-14 Massachusetts Institute Of Technology Methods and apparatus employing an index matching medium
US6600547B2 (en) * 2001-09-24 2003-07-29 Nikon Corporation Sliding seal
EP1446703A2 (en) * 2001-11-07 2004-08-18 Applied Materials, Inc. Optical spot grid array printer
DE10229818A1 (en) * 2002-06-28 2004-01-15 Carl Zeiss Smt Ag Focus detection method and imaging system with focus detection system
US7092069B2 (en) * 2002-03-08 2006-08-15 Carl Zeiss Smt Ag Projection exposure method and projection exposure system
DE10210899A1 (en) 2002-03-08 2003-09-18 Zeiss Carl Smt Ag Refractive projection lens for immersion lithography
US6775076B2 (en) * 2002-06-15 2004-08-10 Intel Corporation Micro optical bench for mounting precision aligned optics, optical assembly and method of mounting optics
TWI242691B (en) 2002-08-23 2005-11-01 Nikon Corp Projection optical system and method for photolithography and exposure apparatus and method using same
US7701652B2 (en) * 2002-09-20 2010-04-20 Mems Optical, Inc. Optical element/device mounting process and apparatus
US6788477B2 (en) * 2002-10-22 2004-09-07 Taiwan Semiconductor Manufacturing Co., Ltd. Apparatus for method for immersion lithography
JP3977324B2 (en) 2002-11-12 2007-09-19 エーエスエムエル ネザーランズ ビー.ブイ. Lithographic apparatus
CN101713932B (en) 2002-11-12 2012-09-26 Asml荷兰有限公司 Lithographic apparatus and device manufacturing method
SG121822A1 (en) 2002-11-12 2006-05-26 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
CN101349876B (en) 2002-11-12 2010-12-01 Asml荷兰有限公司 Immersion lithographic apparatus and device manufacturing method
DE60335595D1 (en) 2002-11-12 2011-02-17 Asml Netherlands Bv Immersion lithographic apparatus and method of making a device
SG131766A1 (en) 2002-11-18 2007-05-28 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
TWI255971B (en) 2002-11-29 2006-06-01 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
DE10258718A1 (en) * 2002-12-09 2004-06-24 Carl Zeiss Smt Ag Projection lens, in particular for microlithography, and method for tuning a projection lens
JP4232449B2 (en) 2002-12-10 2009-03-04 株式会社ニコン Exposure method, exposure apparatus, and device manufacturing method
SG2011031200A (en) 2002-12-10 2014-09-26 Nippon Kogaku Kk Exposure apparatus and device manufacturing method
AU2003302831A1 (en) 2002-12-10 2004-06-30 Nikon Corporation Exposure method, exposure apparatus and method for manufacturing device
WO2004053957A1 (en) 2002-12-10 2004-06-24 Nikon Corporation Surface position detection apparatus, exposure method, and device porducing method
SG150388A1 (en) 2002-12-10 2009-03-30 Nikon Corp Exposure apparatus and method for producing device
US6992750B2 (en) * 2002-12-10 2006-01-31 Canon Kabushiki Kaisha Exposure apparatus and method
KR101157002B1 (en) 2002-12-10 2012-06-21 가부시키가이샤 니콘 Exposure apparatus and method for manufacturing device
EP1571694A4 (en) 2002-12-10 2008-10-15 Nikon Corp Exposure apparatus and method for manufacturing device
DE10257766A1 (en) 2002-12-10 2004-07-15 Carl Zeiss Smt Ag Method for setting a desired optical property of a projection lens and microlithographic projection exposure system
JP4352874B2 (en) 2002-12-10 2009-10-28 株式会社ニコン Exposure apparatus and device manufacturing method
WO2004053950A1 (en) 2002-12-10 2004-06-24 Nikon Corporation Exposure apparatus and method for manufacturing device
KR20050085026A (en) 2002-12-10 2005-08-29 가부시키가이샤 니콘 Optical device and projection exposure apparatus using such optical device
EP1571698A4 (en) 2002-12-10 2006-06-21 Nikon Corp Exposure apparatus, exposure method and method for manufacturing device
WO2004055803A1 (en) 2002-12-13 2004-07-01 Koninklijke Philips Electronics N.V. Liquid removal in a method and device for irradiating spots on a layer
USRE46433E1 (en) 2002-12-19 2017-06-13 Asml Netherlands B.V. Method and device for irradiating spots on a layer
ATE335272T1 (en) 2002-12-19 2006-08-15 Koninkl Philips Electronics Nv METHOD AND ARRANGEMENT FOR IRRADIATION OF A LAYER USING A LIGHT POINT
US6781670B2 (en) * 2002-12-30 2004-08-24 Intel Corporation Immersion lithography
US7326522B2 (en) 2004-02-11 2008-02-05 Asml Netherlands B.V. Device manufacturing method and a substrate
US6954256B2 (en) 2003-08-29 2005-10-11 Asml Netherlands B.V. Gradient immersion lithography
US7545481B2 (en) * 2003-11-24 2009-06-09 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7394521B2 (en) 2003-12-23 2008-07-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7589818B2 (en) 2003-12-23 2009-09-15 Asml Netherlands B.V. Lithographic apparatus, alignment apparatus, device manufacturing method, and a method of converting an apparatus
US7050146B2 (en) 2004-02-09 2006-05-23 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58202448A (en) * 1982-05-21 1983-11-25 Hitachi Ltd Exposing device
JPH06124873A (en) * 1992-10-09 1994-05-06 Canon Inc Liquid-soaking type projection exposure apparatus
US5610683A (en) * 1992-11-27 1997-03-11 Canon Kabushiki Kaisha Immersion type projection exposure apparatus
US6417974B1 (en) * 1999-06-26 2002-07-09 Karl-Heinz Schuster Objective, in particular an objective for a semiconductor lithography projection exposure machine, and a production method
US20010055826A1 (en) * 2000-06-16 2001-12-27 Keiko Chiba Method for manufacturing optical element, optical element, optical system using optical element, optical apparatus and exposure apparatus using optical system, and method for manufacturing device

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 008, no. 051 (P - 259) 8 March 1984 (1984-03-08) *
PATENT ABSTRACTS OF JAPAN vol. 018, no. 414 (E - 1587) 3 August 1994 (1994-08-03) *

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9366972B2 (en) 2002-11-12 2016-06-14 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US9482966B2 (en) 2002-11-12 2016-11-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US9477160B2 (en) 2003-05-13 2016-10-25 Asml Netherland B.V. Lithographic apparatus and device manufacturing method
US8937704B2 (en) 2003-07-31 2015-01-20 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method involving a resistivity sensor
US9285686B2 (en) 2003-07-31 2016-03-15 Asml Netherlands B.V. Lithographic apparatus involving an immersion liquid supply system with an aperture
US9568840B2 (en) 2004-04-14 2017-02-14 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US9429495B2 (en) 2004-06-04 2016-08-30 Carl Zeiss Smt Gmbh System for measuring the image quality of an optical imaging system
US9104117B2 (en) 2004-07-07 2015-08-11 Bob Streefkerk Lithographic apparatus having a liquid detection system
US9250537B2 (en) 2004-07-12 2016-02-02 Nikon Corporation Immersion exposure apparatus and method with detection of liquid on members of the apparatus
US9436096B2 (en) 2005-12-30 2016-09-06 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8947631B2 (en) 2005-12-30 2015-02-03 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8941810B2 (en) 2005-12-30 2015-01-27 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US9256136B2 (en) 2010-04-22 2016-02-09 Asml Netherlands B.V. Fluid handling structure, lithographic apparatus and device manufacturing method involving gas supply

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