WO2005062029A3 - A tape manufacturing system - Google Patents

A tape manufacturing system Download PDF

Info

Publication number
WO2005062029A3
WO2005062029A3 PCT/US2004/037133 US2004037133W WO2005062029A3 WO 2005062029 A3 WO2005062029 A3 WO 2005062029A3 US 2004037133 W US2004037133 W US 2004037133W WO 2005062029 A3 WO2005062029 A3 WO 2005062029A3
Authority
WO
WIPO (PCT)
Prior art keywords
tape
manufacturing system
inspection unit
indexer
imager
Prior art date
Application number
PCT/US2004/037133
Other languages
French (fr)
Other versions
WO2005062029A2 (en
Inventor
Jodi L Reeves
Yunfei Qiao
Original Assignee
Superpower Inc
Jodi L Reeves
Yunfei Qiao
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Superpower Inc, Jodi L Reeves, Yunfei Qiao filed Critical Superpower Inc
Publication of WO2005062029A2 publication Critical patent/WO2005062029A2/en
Publication of WO2005062029A3 publication Critical patent/WO2005062029A3/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details

Abstract

A tape manufacturing system and a tape-surface-inspection unit are disclosed. The tape-surface-inspection unit is capable of continuously characterizing the surface of a non-transparent tape that is usable with or without a tape manufacturing system. The tape-surface-inspection unit includes a surface illuminator, an imager, an image processor, a tape guide, and, optionally, an indexer. The surface illuminator provides a tape surface located by the tape guide in a manner that allows the imager to capture images for characterization by the image processor. The indexer facilitates a correlation of locations along the tape and a characterization of the locations on the tape. The tape manufacturing system, in addition to at least one tape-surface-inspection unit, includes a tape-processing unit, a tape handler, and a controller.
PCT/US2004/037133 2003-12-09 2004-11-05 A tape manufacturing system WO2005062029A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/730,961 2003-12-09
US10/730,961 US7146034B2 (en) 2003-12-09 2003-12-09 Tape manufacturing system

Publications (2)

Publication Number Publication Date
WO2005062029A2 WO2005062029A2 (en) 2005-07-07
WO2005062029A3 true WO2005062029A3 (en) 2005-09-09

Family

ID=34634274

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2004/037133 WO2005062029A2 (en) 2003-12-09 2004-11-05 A tape manufacturing system

Country Status (2)

Country Link
US (2) US7146034B2 (en)
WO (1) WO2005062029A2 (en)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050220986A1 (en) * 2004-04-01 2005-10-06 Superpower, Inc. Superconductor fabrication processes
US7623699B2 (en) * 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
JP2007200870A (en) * 2006-01-26 2007-08-09 Ls Cable Ltd Method of producing substrate for superconductive cables
EP2089691B1 (en) * 2006-10-02 2018-12-05 Coatings Foreign IP Co. LLC Method for comparing appearances of an alternate coating to a target coating
GB2449213B (en) 2007-05-18 2011-06-29 Kraft Foods R & D Inc Improvements in or relating to beverage preparation machines and beverage cartridges
US8175739B2 (en) 2007-07-26 2012-05-08 3M Innovative Properties Company Multi-unit process spatial synchronization
US8616870B2 (en) * 2010-03-30 2013-12-31 Oracle International Corporation Optical media production system and method for controlling same
US8755589B2 (en) 2011-09-06 2014-06-17 The Gates Corporation Measurement of belt wear through edge detection of a raster image
US10341555B2 (en) * 2011-12-02 2019-07-02 Chromologic Llc Characterization of a physical object based on its surface roughness
US9098914B2 (en) 2013-03-11 2015-08-04 Gates Corporation Enhanced analysis for image-based serpentine belt wear evaluation
CN106338522B (en) * 2016-09-06 2019-08-13 苏州新材料研究所有限公司 A kind of high-temperature superconductor band surface defect quality control method and detection system
US10109313B1 (en) 2017-09-14 2018-10-23 International Business Machines Corporation Tape drive system with tape surface inspection unit
CN109604116B (en) * 2018-11-29 2021-04-09 安徽荣泽科技有限公司 Full-automatic special adhesive tape coating machine
IT201900001069A1 (en) * 2019-01-24 2020-07-24 Futura Spa Device for the production of logs of paper material.
CN110987940A (en) * 2019-12-02 2020-04-10 广东汇博机器人技术有限公司 Automatic visual detection system and method for ceramic valve core

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3825351A (en) * 1973-01-19 1974-07-23 Hatachi Electronics Co Ltd Automatic surface inspection device for running object
US4110047A (en) * 1975-03-18 1978-08-29 Konishiroku Photo Industry Co., Ltd. Inspection apparatus for automatically detecting the unevenness or the flaws of a coating
US4671663A (en) * 1984-12-19 1987-06-09 Erwin Sick Gmbh Optik-Elektronik Optical fault seeking apparatus
EP0284630A1 (en) * 1987-03-27 1988-10-05 Aluminum Company Of America Method for detection of surface defects
US4836680A (en) * 1987-01-17 1989-06-06 Troester Josef Flatness measuring device for strip-shaped rolled material
US5383776A (en) * 1992-12-31 1995-01-24 Hoechst Celanese Corporation Apparatus for analyzing polymer defects
US5828449A (en) * 1997-02-26 1998-10-27 Acuity Imaging, Llc Ring illumination reflective elements on a generally planar surface
US6055446A (en) * 1994-09-09 2000-04-25 Martin Marietta Energy Systems, Inc. Continuous lengths of oxide superconductors
US6190752B1 (en) * 1997-11-13 2001-02-20 Board Of Trustees Of The Leland Stanford Junior University Thin films having rock-salt-like structure deposited on amorphous surfaces
WO2001056128A2 (en) * 2000-01-20 2001-08-02 American Superconductor Corporation Pre-treatments for the encapsulation of superconducting composites
WO2003082566A1 (en) * 2002-03-28 2003-10-09 The Regents Of The University Of California Buffer layers on metal alloy substrates for superconducting tapes

Family Cites Families (81)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US33387A (en) * 1861-10-01 Improvement in printing-presses
US528986A (en) * 1894-11-13 Ironing-machine
US36488A (en) * 1862-09-16 Improved apparatus for testing coal-oil
US4396976A (en) * 1972-09-11 1983-08-02 Hyatt Gilbert P System for interfacing a computer to a machine
GB1474191A (en) * 1974-01-21 1977-05-18 Nat Res Dev Measurement of surface roughness
US4049052A (en) * 1976-04-05 1977-09-20 Otis Engineering Corporation Subsurface annulus safety valve
US4079482A (en) * 1976-05-27 1978-03-21 Yeh Chan H Electronic data processing of Chinese characters
US4145140A (en) * 1977-06-15 1979-03-20 Hitoshi Fujii Measurement of surface roughness
US4281342A (en) * 1978-03-29 1981-07-28 Hitachi, Ltd. Mark detecting system using image pickup device
IT1108255B (en) * 1978-10-24 1985-12-02 Fiat Spa PROCEDURE AND DEVICE FOR CHECKING THE ROUGHNESS OF THE SURFACE OF A PIECE WHICH HAS BEEN SUBJECTED TO A MECHANICAL PROCESSING
US4247907A (en) * 1978-11-27 1981-01-27 International Business Machines Corporation Method and apparatus for typing characters and optically readable binary representations thereof on same page
US4344127A (en) * 1980-08-28 1982-08-10 The Bendix Corporation Microprocessor based process control system
US4449052A (en) 1981-11-30 1984-05-15 International Business Machines Corporation Method of printing and detecting optimum bar code test patterns
FR2528189B1 (en) * 1982-06-04 1985-07-26 Ropelato Michel MODULAR DEVICE FOR STEERING INDUSTRIAL PROCESSES
JPS59222098A (en) * 1983-05-30 1984-12-13 Kanaasu Data Kk Electric device drive control system
JPH064352B2 (en) * 1984-08-08 1994-01-19 東京電気株式会社 Label printer
US4673818A (en) * 1985-11-25 1987-06-16 Polaroid Corporation Roughness measuring apparatus
USRE33387E (en) 1985-11-26 1990-10-16 International Business Machines Corporation Atomic force microscope and method for imaging surfaces with atomic resolution
US4978219A (en) * 1988-05-06 1990-12-18 Brother Kogyo Kabushiki Kaisha Surface roughness measuring apparatus utilizing deflectable laser beams
US4889367A (en) * 1988-10-07 1989-12-26 Frito-Lay, Inc. Multi-readable information system
US5586275A (en) * 1989-05-04 1996-12-17 Texas Instruments Incorporated Devices and systems with parallel logic unit operable on data memory locations, and methods
US5289004A (en) * 1990-03-27 1994-02-22 Olympus Optical Co., Ltd. Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light
US5153418A (en) * 1990-10-30 1992-10-06 Omniplanar, Inc. Multiple resolution machine readable symbols
US5189292A (en) * 1990-10-30 1993-02-23 Omniplanar, Inc. Finder pattern for optically encoded machine readable symbols
US5170044A (en) * 1990-11-09 1992-12-08 Pitney Bowes Inc. Error tolerant 3x3 bit-map coding of binary data and method of decoding
CA2074728A1 (en) * 1990-11-28 1992-05-29 Takeo Fujimoto Method for recording data, and printed body printed by the method, and data recording medium, and method for reading data from data recording the medium
WO1992011612A1 (en) * 1990-12-21 1992-07-09 Minnesota Mining And Manufacturing Company Two-channel xor bar code and optical reader
US5189490A (en) * 1991-09-27 1993-02-23 University Of Hartford Method and apparatus for surface roughness measurement using laser diffraction pattern
US5351200A (en) * 1991-11-22 1994-09-27 Westinghouse Electric Corporation Process facility monitor using fuzzy logic
US5296693A (en) * 1991-12-16 1994-03-22 Canon Kabushiki Kaisha Ink intrusion resistant digital code
GB9211539D0 (en) * 1992-06-01 1992-07-15 Ducost Eng Ltd Control of paint spraying machines and the like
US5519212A (en) * 1992-08-07 1996-05-21 Digital Instruments, Incorporated Tapping atomic force microscope with phase or frequency detection
US5412980A (en) * 1992-08-07 1995-05-09 Digital Instruments, Inc. Tapping atomic force microscope
USRE36488E (en) 1992-08-07 2000-01-11 Veeco Instruments Inc. Tapping atomic force microscope with phase or frequency detection
US5288986A (en) * 1992-09-17 1994-02-22 Motorola, Inc. Binary code matrix having data and parity bits
US5298731A (en) * 1992-12-23 1994-03-29 International Business Machines Corporation Method for printing and reading for orthogonal bar code patterns
US5334844A (en) * 1993-04-05 1994-08-02 Space Systems/Loral, Inc. Optical illumination and inspection system for wafer and solar cell defects
US5304787A (en) * 1993-06-01 1994-04-19 Metamedia Corporation Locating 2-D bar codes
JP3356522B2 (en) * 1994-01-19 2002-12-16 富士通株式会社 Cleaning method, method of manufacturing semiconductor device using the method, and method of manufacturing liquid crystal display device
US5468945A (en) * 1994-02-25 1995-11-21 Intermec Corporation Method and apparatus for locating and decoding a postnet forwarding bar code in a field of postnet bar codes
JP3402512B2 (en) * 1994-05-23 2003-05-06 セイコーインスツルメンツ株式会社 Scanning probe microscope
JP3523688B2 (en) * 1994-07-06 2004-04-26 オリンパス株式会社 Probe device for sample measurement
US5526116A (en) * 1994-11-07 1996-06-11 Zygo Corporation Method and apparatus for profiling surfaces using diffractive optics which impinges the beams at two different incident angles
US6032861A (en) * 1995-01-03 2000-03-07 Lemelson; Jerome H. Method and apparatus for encoding and decoding bar codes with primary and secondary information and method of using such bar codes
US5563401A (en) * 1995-01-03 1996-10-08 Lemelson; Jerome H. Bar codes and methods
US6543691B1 (en) 1995-01-03 2003-04-08 Jerome H. Lemelson Method and apparatus for encoding and decoding bar codes with primary and secondary information and method of using such bar codes
US5608527A (en) * 1995-03-08 1997-03-04 Optical Dimensions, Llc Apparatus and method for dynamic measurement of surface roughness
US6451450B1 (en) * 1995-04-10 2002-09-17 Ut-Battelle, Llc Method of depositing a protective layer over a biaxially textured alloy substrate and composition therefrom
US5741377A (en) * 1995-04-10 1998-04-21 Martin Marietta Energy Systems, Inc. Structures having enhanced biaxial texture and method of fabricating same
US5872080A (en) * 1995-04-19 1999-02-16 The Regents Of The University Of California High temperature superconducting thick films
US6562781B1 (en) * 1995-11-30 2003-05-13 Hamilton Civic Hospitals Research Development Inc. Glycosaminoglycan-antithrombin III/heparin cofactor II conjugates
DE29602545U1 (en) * 1996-02-14 1996-06-05 Bosch Gmbh Robert Device with a display device
US5726912A (en) * 1996-09-06 1998-03-10 Honeywell Iac Control system monitor
US5980078A (en) 1997-02-14 1999-11-09 Fisher-Rosemount Systems, Inc. Process control system including automatic sensing and automatic configuration of devices
US6246054B1 (en) * 1997-06-10 2001-06-12 Olympus Optical Co., Ltd. Scanning probe microscope suitable for observing the sidewalls of steps in a specimen and measuring the tilt angle of the sidewalls
US5956134A (en) * 1997-07-11 1999-09-21 Semiconductor Technologies & Instruments, Inc. Inspection system and method for leads of semiconductor devices
US5964966A (en) * 1997-09-19 1999-10-12 Lockheed Martin Energy Research Corporation Method of forming biaxially textured alloy substrates and devices thereon
US6027564A (en) * 1997-09-23 2000-02-22 American Superconductor Corporation Low vacuum vapor process for producing epitaxial layers
US6022832A (en) * 1997-09-23 2000-02-08 American Superconductor Corporation Low vacuum vapor process for producing superconductor articles with epitaxial layers
US5898106A (en) * 1997-09-25 1999-04-27 Digital Instruments, Inc. Method and apparatus for obtaining improved vertical metrology measurements
US6458223B1 (en) * 1997-10-01 2002-10-01 American Superconductor Corporation Alloy materials
EP0918042A1 (en) * 1997-11-20 1999-05-26 Balzers Hochvakuum AG Substrate coated with at least a MgO-layer
US6159610A (en) * 1998-06-12 2000-12-12 Ut-Battelle, Llc Buffer layers on metal surfaces having biaxial texture as superconductor substrates
US6236044B1 (en) 1998-08-21 2001-05-22 Trw Inc. Method and apparatus for inspection of a substrate by use of a ring illuminator
US6427345B1 (en) * 1998-11-10 2002-08-06 Veeco Instruments, Inc. Method and apparatus for a line based, two-dimensional characterization of a three-dimensional surface
GB9827912D0 (en) * 1998-12-19 1999-02-10 Univ Manchester Detecting nucleic acids
US6248009B1 (en) * 1999-02-18 2001-06-19 Ebara Corporation Apparatus for cleaning substrate
US6475311B1 (en) * 1999-03-31 2002-11-05 American Superconductor Corporation Alloy materials
US6562761B1 (en) 2000-02-09 2003-05-13 American Superconductor Corporation Coated conductor thick film precursor
KR100336696B1 (en) 1999-12-08 2002-05-13 고연완 Apparatus and method for detecting polarization
US6339047B1 (en) * 2000-01-20 2002-01-15 American Semiconductor Corp. Composites having high wettability
EP1122799A1 (en) * 2000-02-01 2001-08-08 Zentrum für Funktionswerkstoffe, Gemeinnützige Gesellschaft mbH Stainless steel substrate for superconducting films
US6447714B1 (en) * 2000-05-15 2002-09-10 Ut-Battelle, Llc Method for forming biaxially textured articles by powder metallurgy
US6331199B1 (en) * 2000-05-15 2001-12-18 Ut-Battelle, Llc Biaxially textured articles formed by powder metallurgy
US6383989B2 (en) * 2000-06-21 2002-05-07 The Regents Of The University Of California Architecture for high critical current superconducting tapes
WO2002002333A1 (en) * 2000-06-30 2002-01-10 Silverbrook Research Pty Ltd Print cartridge with air filtering means
JP4713012B2 (en) * 2000-10-31 2011-06-29 財団法人国際超電導産業技術研究センター Tape-shaped oxide superconductor
US20030036483A1 (en) * 2000-12-06 2003-02-20 Arendt Paul N. High temperature superconducting thick films
KR100388675B1 (en) * 2000-12-18 2003-06-25 삼성전자주식회사 Air conditioner having pressure controlling unit and its control method
US6599348B2 (en) * 2001-06-01 2003-07-29 Celanese International Corporation Methods for reducing entrainment of solids and liquids
US6610414B2 (en) * 2001-08-16 2003-08-26 Ut-Battelle, Llc Biaxially textured articles formed by power metallurgy

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3825351A (en) * 1973-01-19 1974-07-23 Hatachi Electronics Co Ltd Automatic surface inspection device for running object
US4110047A (en) * 1975-03-18 1978-08-29 Konishiroku Photo Industry Co., Ltd. Inspection apparatus for automatically detecting the unevenness or the flaws of a coating
US4671663A (en) * 1984-12-19 1987-06-09 Erwin Sick Gmbh Optik-Elektronik Optical fault seeking apparatus
US4836680A (en) * 1987-01-17 1989-06-06 Troester Josef Flatness measuring device for strip-shaped rolled material
EP0284630A1 (en) * 1987-03-27 1988-10-05 Aluminum Company Of America Method for detection of surface defects
US5383776A (en) * 1992-12-31 1995-01-24 Hoechst Celanese Corporation Apparatus for analyzing polymer defects
US6055446A (en) * 1994-09-09 2000-04-25 Martin Marietta Energy Systems, Inc. Continuous lengths of oxide superconductors
US5828449A (en) * 1997-02-26 1998-10-27 Acuity Imaging, Llc Ring illumination reflective elements on a generally planar surface
US6190752B1 (en) * 1997-11-13 2001-02-20 Board Of Trustees Of The Leland Stanford Junior University Thin films having rock-salt-like structure deposited on amorphous surfaces
WO2001056128A2 (en) * 2000-01-20 2001-08-02 American Superconductor Corporation Pre-treatments for the encapsulation of superconducting composites
WO2003082566A1 (en) * 2002-03-28 2003-10-09 The Regents Of The University Of California Buffer layers on metal alloy substrates for superconducting tapes

Also Published As

Publication number Publication date
US20050123186A1 (en) 2005-06-09
US7146034B2 (en) 2006-12-05
US7805173B2 (en) 2010-09-28
WO2005062029A2 (en) 2005-07-07
US20070093376A1 (en) 2007-04-26

Similar Documents

Publication Publication Date Title
WO2005062029A3 (en) A tape manufacturing system
WO2005120043A3 (en) Portable electronic device with adjustable image capture orientation and method therefore
GB2376588B (en) Image capture device with handwritten annotation
WO2002054169A3 (en) A data input device
WO2002080376A9 (en) A method for timing control
WO2007072376A3 (en) Color matching for display system for shops
EP1583371A4 (en) Light source estimating device, light source estimating method, and imaging device and image processing method
WO2002015560A3 (en) A system and method for capturing an image
WO2006017280A3 (en) System and method for automatically annotating images in an image-capture device
CA2546758A1 (en) A system and a method for detecting a damaged or missing machine part
DE60326480D1 (en) ENDOSCOPIC PICTURE GENERATION SYSTEM WITH REMOVABLE PULLEY DEVICE
WO2006110324A3 (en) Method and apparatus for providing strobed imaged capture
TW200733005A (en) Image capture apparatus calibration system and method there
EP1601185A3 (en) Noise reduction device and method using a shaded image in an electronic camera
WO2004004828A3 (en) Image processing system for use with a patient positioning device
EP1985981A3 (en) Information processing apparatus and method
FR2882245B1 (en) METHOD FOR DETERMINING THE 3D DISPLACEMENT OF A PATIENT POSITIONED ON A TABLE OF AN IMAGING DEVICE
AU2003270796A1 (en) Image capture device
TW200641723A (en) Decreasing aliasing in electronic images
TW200719077A (en) Digital image capturing device
TW200726216A (en) Automatic focusing methods and image capture devices utilizing the same
AU2003275171A1 (en) Image capture device
DE60323486D1 (en) IMAGE PROCESSING DEVICE
EP2031865A3 (en) Image input apparatus, and image input method
EP1431921A3 (en) Image layout processing apparatus, method, and program

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): GM KE LS MW MZ NA SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
122 Ep: pct application non-entry in european phase