WO2005065438A3 - Cantilever microprobes for contacting components and methods for making such probes - Google Patents
Cantilever microprobes for contacting components and methods for making such probes Download PDFInfo
- Publication number
- WO2005065438A3 WO2005065438A3 PCT/US2005/000088 US2005000088W WO2005065438A3 WO 2005065438 A3 WO2005065438 A3 WO 2005065438A3 US 2005000088 W US2005000088 W US 2005000088W WO 2005065438 A3 WO2005065438 A3 WO 2005065438A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- structures
- cantilever
- probes
- directed
- methods
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06727—Cantilever beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06744—Microprobes, i.e. having dimensions as IC details
Abstract
Applications Claiming Priority (20)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US53394703P | 2003-12-31 | 2003-12-31 | |
US53393303P | 2003-12-31 | 2003-12-31 | |
US60/533,947 | 2003-12-31 | ||
US60/533,933 | 2003-12-31 | ||
US53686504P | 2004-01-15 | 2004-01-15 | |
US60/536,865 | 2004-01-15 | ||
US54051104P | 2004-01-29 | 2004-01-29 | |
US60/540,511 | 2004-01-29 | ||
US10/772,943 | 2004-02-04 | ||
US10/772,943 US20050104609A1 (en) | 2003-02-04 | 2004-02-04 | Microprobe tips and methods for making |
US58268904P | 2004-06-23 | 2004-06-23 | |
US58269004P | 2004-06-23 | 2004-06-23 | |
US60/582,689 | 2004-06-23 | ||
US60/582,690 | 2004-06-23 | ||
US60971904P | 2004-09-13 | 2004-09-13 | |
US60/609,719 | 2004-09-13 | ||
US61178904P | 2004-09-20 | 2004-09-20 | |
US60/611,789 | 2004-09-20 | ||
US10/949,738 | 2004-09-24 | ||
US10/949,738 US20060006888A1 (en) | 2003-02-04 | 2004-09-24 | Electrochemically fabricated microprobes |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2005065438A2 WO2005065438A2 (en) | 2005-07-21 |
WO2005065438A3 true WO2005065438A3 (en) | 2005-09-29 |
Family
ID=34754085
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2005/000088 WO2005065438A2 (en) | 2003-12-31 | 2005-01-03 | Cantilever microprobes for contacting components and methods for making such probes |
Country Status (2)
Country | Link |
---|---|
TW (1) | TW200536039A (en) |
WO (1) | WO2005065438A2 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070089551A1 (en) * | 2005-09-30 | 2007-04-26 | Sv Probe Ptd. Ltd. | Cantilever probe structure for a probe card assembly |
TWI404936B (en) * | 2009-12-30 | 2013-08-11 | Korea Mach & Materials Inst | Cantilever-type micro contact probe with hinge structure |
JP4883215B1 (en) * | 2010-10-29 | 2012-02-22 | オムロン株式会社 | Terminal and connector using the same |
CN112362922A (en) * | 2020-11-25 | 2021-02-12 | 广州国显科技有限公司 | Lighting test fixture, fixing piece and lighting test device |
CN115480082A (en) * | 2021-06-15 | 2022-12-16 | 迪科特测试科技(苏州)有限公司 | Elastic force type probe element, assembly and testing device |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4965865A (en) * | 1989-10-11 | 1990-10-23 | General Signal Corporation | Probe card for integrated circuit chip |
US5286208A (en) * | 1991-02-19 | 1994-02-15 | Yamaichi Electric Co., Ltd. | Contact in electric part socket |
US6215196B1 (en) * | 1997-06-30 | 2001-04-10 | Formfactor, Inc. | Electronic component with terminals and spring contact elements extending from areas which are remote from the terminals |
US6672875B1 (en) * | 1998-12-02 | 2004-01-06 | Formfactor, Inc. | Spring interconnect structures |
US6811406B2 (en) * | 2001-04-12 | 2004-11-02 | Formfactor, Inc. | Microelectronic spring with additional protruding member |
-
2004
- 2004-12-30 TW TW093141480A patent/TW200536039A/en unknown
-
2005
- 2005-01-03 WO PCT/US2005/000088 patent/WO2005065438A2/en active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4965865A (en) * | 1989-10-11 | 1990-10-23 | General Signal Corporation | Probe card for integrated circuit chip |
US5286208A (en) * | 1991-02-19 | 1994-02-15 | Yamaichi Electric Co., Ltd. | Contact in electric part socket |
US6215196B1 (en) * | 1997-06-30 | 2001-04-10 | Formfactor, Inc. | Electronic component with terminals and spring contact elements extending from areas which are remote from the terminals |
US6672875B1 (en) * | 1998-12-02 | 2004-01-06 | Formfactor, Inc. | Spring interconnect structures |
US6811406B2 (en) * | 2001-04-12 | 2004-11-02 | Formfactor, Inc. | Microelectronic spring with additional protruding member |
Also Published As
Publication number | Publication date |
---|---|
TW200536039A (en) | 2005-11-01 |
WO2005065438A2 (en) | 2005-07-21 |
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