WO2005101244A3 - Method for estimating examinee attribute parameters in a cognitive diagnosis model - Google Patents

Method for estimating examinee attribute parameters in a cognitive diagnosis model Download PDF

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Publication number
WO2005101244A3
WO2005101244A3 PCT/US2005/011715 US2005011715W WO2005101244A3 WO 2005101244 A3 WO2005101244 A3 WO 2005101244A3 US 2005011715 W US2005011715 W US 2005011715W WO 2005101244 A3 WO2005101244 A3 WO 2005101244A3
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WO
WIPO (PCT)
Prior art keywords
item
attribute
distribution
determined
execution
Prior art date
Application number
PCT/US2005/011715
Other languages
French (fr)
Other versions
WO2005101244A2 (en
Inventor
Daniel Bolt
Jianbin Fu
Original Assignee
Educational Testing Service
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Filing date
Publication date
Application filed by Educational Testing Service filed Critical Educational Testing Service
Publication of WO2005101244A2 publication Critical patent/WO2005101244A2/en
Publication of WO2005101244A3 publication Critical patent/WO2005101244A3/en

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09B—EDUCATIONAL OR DEMONSTRATION APPLIANCES; APPLIANCES FOR TEACHING, OR COMMUNICATING WITH, THE BLIND, DEAF OR MUTE; MODELS; PLANETARIA; GLOBES; MAPS; DIAGRAMS
    • G09B7/00—Electrically-operated teaching apparatus or devices working with questions and answers
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09B—EDUCATIONAL OR DEMONSTRATION APPLIANCES; APPLIANCES FOR TEACHING, OR COMMUNICATING WITH, THE BLIND, DEAF OR MUTE; MODELS; PLANETARIA; GLOBES; MAPS; DIAGRAMS
    • G09B7/00—Electrically-operated teaching apparatus or devices working with questions and answers
    • G09B7/02—Electrically-operated teaching apparatus or devices working with questions and answers of the type wherein the student is expected to construct an answer to the question which is presented or wherein the machine gives an answer to the question presented by a student

Abstract

A method and system for determining attribute score levels from an assessment are disclosed (Figure 2). An assessment includes items each testing for at least one attribute (Figure 2, 205). A first distribution is generated having a response propensity represented by a highest level of execution for each attribute tested by the item. An item threshold is determined for at least one score for the first distribution. Each item threshold corresponds to a level of execution corresponding to the score for which the item threshold is determined. For each attribute tested by the item, a second distribution is generated having a response propensity represented by a lowest level of execution for the attribute and the highest level of execution for all other attributes tested by the item (Figure 2). A mean parameter is determined for the second distribution. An attribute score level is determined for the scores based on the item thresholds and the mean parameters (Figure 2).
PCT/US2005/011715 2004-04-06 2005-04-06 Method for estimating examinee attribute parameters in a cognitive diagnosis model WO2005101244A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US55992204P 2004-04-06 2004-04-06
US60/559,922 2004-04-06

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WO2005101244A2 WO2005101244A2 (en) 2005-10-27
WO2005101244A3 true WO2005101244A3 (en) 2009-08-27

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PCT/US2005/011715 WO2005101244A2 (en) 2004-04-06 2005-04-06 Method for estimating examinee attribute parameters in a cognitive diagnosis model

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US (2) US7418458B2 (en)
WO (1) WO2005101244A2 (en)

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Also Published As

Publication number Publication date
US20080286742A1 (en) 2008-11-20
US7418458B2 (en) 2008-08-26
US20050222799A1 (en) 2005-10-06
WO2005101244A2 (en) 2005-10-27

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