WO2005121396A3 - Controlled deposition of silicon-containing coatings adhered by an oxide layer - Google Patents

Controlled deposition of silicon-containing coatings adhered by an oxide layer Download PDF

Info

Publication number
WO2005121396A3
WO2005121396A3 PCT/US2005/013214 US2005013214W WO2005121396A3 WO 2005121396 A3 WO2005121396 A3 WO 2005121396A3 US 2005013214 W US2005013214 W US 2005013214W WO 2005121396 A3 WO2005121396 A3 WO 2005121396A3
Authority
WO
WIPO (PCT)
Prior art keywords
process chamber
control over
coating
silicon
films
Prior art date
Application number
PCT/US2005/013214
Other languages
French (fr)
Other versions
WO2005121396A2 (en
Inventor
Boris Kobrin
Romuald Nowak
Richard C Yi
Jeffrey D Chinn
Original Assignee
Applied Microstructures Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Microstructures Inc filed Critical Applied Microstructures Inc
Publication of WO2005121396A2 publication Critical patent/WO2005121396A2/en
Publication of WO2005121396A3 publication Critical patent/WO2005121396A3/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40Oxides
    • C23C16/401Oxides containing silicon
    • C23C16/402Silicon dioxide
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y30/00Nanotechnology for materials or surface science, e.g. nanocomposites
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/02Pretreatment of the material to be coated
    • C23C16/0227Pretreatment of the material to be coated by cleaning or etching

Abstract

We have developed an improved vapor-phase deposition method and apparatus for the application of films / coatings on substrates. The method provides for the addition of a precise amount of each of the reactants to be consumed in a single reaction step of the coating formation process. In addition to the control over the amount of reactants added to the process chamber, the present invention requires precise control over the total pressure (which is less than atmospheric pressure) in the process chamber, the partial vapor pressure of each vaporous component present in the process chamber, the substrate temperature, and typically the temperature of a major processing surface within said process chamber. Control over this combination of variables determines a number of the characteristics of a film/coating or multi-layered film/coating formed using the method. By varying these process parameters, the roughness and the thickness of the films/coatings produced can be controlled.
PCT/US2005/013214 2004-06-04 2005-04-20 Controlled deposition of silicon-containing coatings adhered by an oxide layer WO2005121396A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/862,047 US7638167B2 (en) 2004-06-04 2004-06-04 Controlled deposition of silicon-containing coatings adhered by an oxide layer
US10/862,047 2004-06-04

Publications (2)

Publication Number Publication Date
WO2005121396A2 WO2005121396A2 (en) 2005-12-22
WO2005121396A3 true WO2005121396A3 (en) 2006-11-16

Family

ID=35449280

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2005/013214 WO2005121396A2 (en) 2004-06-04 2005-04-20 Controlled deposition of silicon-containing coatings adhered by an oxide layer

Country Status (3)

Country Link
US (2) US7638167B2 (en)
TW (1) TWI293339B (en)
WO (1) WO2005121396A2 (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9725805B2 (en) * 2003-06-27 2017-08-08 Spts Technologies Limited Apparatus and method for controlled application of reactive vapors to produce thin films and coatings
US8501277B2 (en) 2004-06-04 2013-08-06 Applied Microstructures, Inc. Durable, heat-resistant multi-layer coatings and coated articles
US7947579B2 (en) * 2006-02-13 2011-05-24 Stc.Unm Method of making dense, conformal, ultra-thin cap layers for nanoporous low-k ILD by plasma assisted atomic layer deposition
US8187678B2 (en) * 2006-02-13 2012-05-29 Stc.Unm Ultra-thin microporous/hybrid materials
US9157152B2 (en) * 2007-03-29 2015-10-13 Tokyo Electron Limited Vapor deposition system
WO2009012479A1 (en) * 2007-07-19 2009-01-22 Swagelok Company Coated seals
US20090110884A1 (en) * 2007-10-29 2009-04-30 Integrated Surface Technologies Surface Coating
US20120213929A1 (en) * 2011-02-18 2012-08-23 Tokyo Electron Limited Method of operating filament assisted chemical vapor deposition system
US8852693B2 (en) 2011-05-19 2014-10-07 Liquipel Ip Llc Coated electronic devices and associated methods
WO2013011511A1 (en) 2011-07-18 2013-01-24 Mor Research Applications Ltd. A device for adjusting the intraocular pressure
US20130312663A1 (en) * 2012-05-22 2013-11-28 Applied Microstructures, Inc. Vapor Delivery Apparatus
US9765429B2 (en) 2013-09-04 2017-09-19 President And Fellows Of Harvard College Growing films via sequential liquid/vapor phases
CN104733647B (en) * 2015-03-10 2016-08-24 京东方科技集团股份有限公司 Film encapsulation method and thin-film packing structure, display device
US10784100B2 (en) 2016-07-21 2020-09-22 Tokyo Electron Limited Back-side friction reduction of a substrate
US10006564B2 (en) * 2016-08-10 2018-06-26 Ckd Corporation Corrosion resistant coating for process gas control valve
US11709155B2 (en) 2017-09-18 2023-07-25 Waters Technologies Corporation Use of vapor deposition coated flow paths for improved chromatography of metal interacting analytes
US11709156B2 (en) 2017-09-18 2023-07-25 Waters Technologies Corporation Use of vapor deposition coated flow paths for improved analytical analysis
US11918936B2 (en) 2020-01-17 2024-03-05 Waters Technologies Corporation Performance and dynamic range for oligonucleotide bioanalysis through reduction of non specific binding

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4956204A (en) * 1986-08-15 1990-09-11 Nippon Telegraph And Telephone Corporation Process of forming a film by low pressure chemical vapor deposition
US6399222B2 (en) * 1997-12-27 2002-06-04 Tdk Corporation Organic electroluminescent device
US20030062081A1 (en) * 2001-09-28 2003-04-03 Sanyo Electric Co., Ltd. Photovoltaic element and photovoltaic device

Family Cites Families (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3203505A (en) * 1963-06-06 1965-08-31 Allis Chalmers Transmission mechanism
US3602671A (en) * 1969-11-28 1971-08-31 Allis Chalmers Mfg Co Oil circuit interrupter having improved stack insulating washer structure
US4002512A (en) * 1974-09-16 1977-01-11 Western Electric Company, Inc. Method of forming silicon dioxide
GB1573154A (en) * 1977-03-01 1980-08-13 Pilkington Brothers Ltd Coating glass
US5087525A (en) * 1989-02-21 1992-02-11 Libbey-Owens-Ford Co. Coated glass articles
US5328768A (en) 1990-04-03 1994-07-12 Ppg Industries, Inc. Durable water repellant glass surface
US5420067A (en) 1990-09-28 1995-05-30 The United States Of America As Represented By The Secretary Of The Navy Method of fabricatring sub-half-micron trenches and holes
US5602671A (en) 1990-11-13 1997-02-11 Texas Instruments Incorporated Low surface energy passivation layer for micromechanical devices
US5331454A (en) 1990-11-13 1994-07-19 Texas Instruments Incorporated Low reset voltage process for DMD
US5372851A (en) 1991-12-16 1994-12-13 Matsushita Electric Industrial Co., Ltd. Method of manufacturing a chemically adsorbed film
US5576247A (en) 1992-07-31 1996-11-19 Matsushita Electric Industrial Co., Ltd. Thin layer forming method wherein hydrophobic molecular layers preventing a BPSG layer from absorbing moisture
DE4236324C1 (en) 1992-10-28 1993-09-02 Schott Glaswerke, 55122 Mainz, De
JP3072000B2 (en) 1994-06-23 2000-07-31 株式会社半導体エネルギー研究所 Method for manufacturing semiconductor device
JPH0878406A (en) 1994-09-08 1996-03-22 Sony Corp Method for forming oxide film
JP3642110B2 (en) 1996-06-11 2005-04-27 松下電器産業株式会社 Manufacturing method of electronic parts
US6342277B1 (en) 1996-08-16 2002-01-29 Licensee For Microelectronics: Asm America, Inc. Sequential chemical vapor deposition
US5879459A (en) 1997-08-29 1999-03-09 Genus, Inc. Vertically-stacked process reactor and cluster tool system for atomic layer deposition
JPH10306377A (en) 1997-05-02 1998-11-17 Tokyo Electron Ltd Method for supplying minute amount of gas and device therefor
US5966499A (en) 1997-07-28 1999-10-12 Mks Instruments, Inc. System for delivering a substantially constant vapor flow to a chemical process reactor
US6287635B1 (en) * 1997-08-11 2001-09-11 Torrex Equipment Corp. High rate silicon deposition method at low pressures
JPH11116278A (en) 1997-10-20 1999-04-27 Central Glass Co Ltd Production of fluororesin coated body
US6203505B1 (en) 1998-06-05 2001-03-20 Advanced Cardiovascular Systems, Inc. Guidewires having a vapor deposited primer coat
US6774018B2 (en) 1999-02-01 2004-08-10 Sigma Laboratories Of Arizona, Inc. Barrier coatings produced by atmospheric glow discharge
US6383642B1 (en) 1999-04-09 2002-05-07 Saint-Gobain Vitrage Transparent substrate provided with hydrophobic/oleophobic coating formed by plasma CVD
US6258229B1 (en) 1999-06-02 2001-07-10 Handani Winarta Disposable sub-microliter volume sensor and method of making
US6503330B1 (en) 1999-12-22 2003-01-07 Genus, Inc. Apparatus and method to achieve continuous interface and ultrathin film during atomic layer deposition
DE10015380A1 (en) 2000-03-28 2001-10-11 Nmi Univ Tuebingen Microfluidic component and method for surface treatment of such
US6887337B2 (en) 2000-09-19 2005-05-03 Xactix, Inc. Apparatus for etching semiconductor samples and a source for providing a gas by sublimation thereto
US6743516B2 (en) 2000-09-29 2004-06-01 Guardian Industries Corporation Highly durable hydrophobic coatings and methods
US20020146725A1 (en) 2000-11-10 2002-10-10 Mullen Bette M. Chip for large-scale use of industrial genomics in health and agriculture and method of making same
US20020076507A1 (en) 2000-12-15 2002-06-20 Chiang Tony P. Process sequence for atomic layer deposition
US20020164824A1 (en) 2001-02-16 2002-11-07 Jianming Xiao Method and apparatus based on bundled capillaries for high throughput screening
US6576489B2 (en) 2001-05-07 2003-06-10 Applied Materials, Inc. Methods of forming microstructure devices
US7052616B2 (en) 2001-08-14 2006-05-30 The Penn State Research Foundation Fabrication of molecular scale devices using fluidic assembly
US6521300B1 (en) 2001-08-16 2003-02-18 United Microelectronics Corp. Method of a surface treatment in improving adhesion of an organic polymeric low-k dielectric layer
WO2003038143A1 (en) 2001-10-30 2003-05-08 Massachusetts Institute Of Technology Fluorocarbon-organosilicon copolymers and coatings prepared by hot-filament chemical vapor deposition
JP4908738B2 (en) 2002-01-17 2012-04-04 サンデュー・テクノロジーズ・エルエルシー ALD method
US6787185B2 (en) 2002-02-25 2004-09-07 Micron Technology, Inc. Deposition methods for improved delivery of metastable species
AU2003205066A1 (en) 2002-03-25 2003-10-13 Guardian Industries Corp. Anti-reflective hydrophobic coatings and methods
KR20030081144A (en) 2002-04-11 2003-10-17 가부시키가이샤 히다치 고쿠사이 덴키 Vertical semiconductor manufacturing apparatus
US6743736B2 (en) 2002-04-11 2004-06-01 Micron Technology, Inc. Reactive gaseous deposition precursor feed apparatus
US6833322B2 (en) * 2002-10-17 2004-12-21 Applied Materials, Inc. Apparatuses and methods for depositing an oxide film
JP3866655B2 (en) 2002-12-26 2007-01-10 励起 渡辺 Processing apparatus and processing method
US20040261703A1 (en) 2003-06-27 2004-12-30 Jeffrey D. Chinn Apparatus and method for controlled application of reactive vapors to produce thin films and coatings
KR100589053B1 (en) 2003-10-15 2006-06-12 삼성전자주식회사 Source supply apparatus, method of supplying source, and atomic layer deposition method using the same

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4956204A (en) * 1986-08-15 1990-09-11 Nippon Telegraph And Telephone Corporation Process of forming a film by low pressure chemical vapor deposition
US6399222B2 (en) * 1997-12-27 2002-06-04 Tdk Corporation Organic electroluminescent device
US20030062081A1 (en) * 2001-09-28 2003-04-03 Sanyo Electric Co., Ltd. Photovoltaic element and photovoltaic device

Also Published As

Publication number Publication date
WO2005121396A2 (en) 2005-12-22
US7638167B2 (en) 2009-12-29
US8178162B2 (en) 2012-05-15
TWI293339B (en) 2008-02-11
TW200540293A (en) 2005-12-16
US20050271809A1 (en) 2005-12-08
US20100075034A1 (en) 2010-03-25

Similar Documents

Publication Publication Date Title
WO2005121396A3 (en) Controlled deposition of silicon-containing coatings adhered by an oxide layer
TW200617200A (en) Multilayer coatings by plasma enhanced chemical vapor deposition
WO2005121397A3 (en) Controlled vapor deposition of multilayered coatings adhered by an oxide layer
WO2007140376A3 (en) A method for depositing and curing low-k films for gapfill and conformal film applications
WO2004063421A3 (en) Deposition chamber surface enhancement and resulting deposition chambers
TW200604368A (en) Controlled vapor deposition of multilayered coatings adhered by an oxide layer
CN109922952A (en) The siloxanes plasma polymer combined for sheet material
WO2009085958A3 (en) Passivation layer formation by plasma clean process to reduce native oxide growth
WO2006007313A3 (en) Improving water-barrier performance of an encapsulating film
AU2001231753A1 (en) Condensation coating method
EP1860690A3 (en) Process for producing silicon oxide films from organoaminosilane precursors
TW200943419A (en) Low wet etch rate silicon nitride film
WO2007112058A3 (en) Carbon precursors for use during silicon epitaxial firm formation
WO2007118026A3 (en) Step coverage and pattern loading for dielectric films
WO2006023262A3 (en) Atmospheric pressure chemical vapor deposition
WO2005036593A3 (en) Deposition of silicon-containing films from hexachlorodisilane
TW200624594A (en) Abrasion resistant coatings by plasma enhanced chemical vapor deposition
US20140308822A1 (en) Deposition technique for depositing a coating on a device
WO2008141158A3 (en) Substrate surface structures and processes for forming the same
WO2004110737A3 (en) High rate deposition for the formation of high quality optical coatings
CN108231538A (en) Membrane deposition method
WO2011084292A3 (en) Silicon thin film solar cell having improved haze and methods of making the same
WO2018212882A3 (en) Cvd thin film stress control method for display application
EP4235757A3 (en) Integrated dry processes for patterning radiation photoresist patterning
KR100827528B1 (en) Manufacturing method of semiconductor device using sp3-rich amorphous carbon as hard mask

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KM KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SM SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): GM KE LS MW MZ NA SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
NENP Non-entry into the national phase

Ref country code: DE

WWW Wipo information: withdrawn in national office

Country of ref document: DE

122 Ep: pct application non-entry in european phase