WO2005122695A3 - A system for mapping defective printed circuits - Google Patents
A system for mapping defective printed circuits Download PDFInfo
- Publication number
- WO2005122695A3 WO2005122695A3 PCT/IL2005/000650 IL2005000650W WO2005122695A3 WO 2005122695 A3 WO2005122695 A3 WO 2005122695A3 IL 2005000650 W IL2005000650 W IL 2005000650W WO 2005122695 A3 WO2005122695 A3 WO 2005122695A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- pcb
- layer
- layers
- scrap
- units
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0097—Processing two or more printed circuits simultaneously, e.g. made from a common substrate, or temporarily stacked circuit boards
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0266—Marks, test patterns or identification means
- H05K1/0269—Marks, test patterns or identification means for visual or optical inspection
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/16—Inspection; Monitoring; Aligning
- H05K2203/161—Using chemical substances, e.g. colored or fluorescent, for facilitating optical or visual inspection
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/16—Inspection; Monitoring; Aligning
- H05K2203/163—Monitoring a manufacturing process
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007517648A JP4923180B2 (en) | 2004-06-21 | 2005-06-19 | System for mapping defective printed circuits |
CN2005800248665A CN101297305B (en) | 2004-06-21 | 2005-06-19 | A system for mapping defective printed circuits |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IL162650 | 2004-06-21 | ||
IL162650A IL162650A (en) | 2004-06-21 | 2004-06-21 | Scrap-units- mapping system for mapping multiple layers of a single board and method therefor |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2005122695A2 WO2005122695A2 (en) | 2005-12-29 |
WO2005122695A3 true WO2005122695A3 (en) | 2007-05-18 |
Family
ID=35510182
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/IL2005/000650 WO2005122695A2 (en) | 2004-06-21 | 2005-06-19 | A system for mapping defective printed circuits |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP4923180B2 (en) |
CN (1) | CN101297305B (en) |
IL (1) | IL162650A (en) |
TW (1) | TWI275335B (en) |
WO (1) | WO2005122695A2 (en) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101621893B (en) * | 2008-07-02 | 2011-04-13 | 欣兴电子股份有限公司 | Process and equipment thereof for manufacturing imprint dividing board of defective subboard of circuit board |
CN101865652A (en) * | 2009-04-15 | 2010-10-20 | 上海汽车制动系统有限公司 | Detection method and system of EBS (Electronic Brake System) electromagnetic valve model discrimination |
CN102338754A (en) * | 2010-07-22 | 2012-02-01 | 牧德科技股份有限公司 | Method for detecting defects of power supply layer and ground layer of circuit board |
CN102074031B (en) * | 2011-01-13 | 2013-08-07 | 广东正业科技股份有限公司 | Standard establishment method for observational check machine of printed circuit board |
CN102136016A (en) * | 2011-03-09 | 2011-07-27 | 瑞谷科技(深圳)有限公司 | Printed circuit board (PCB) designing method and device |
KR101478790B1 (en) | 2013-10-14 | 2015-01-06 | (주)에이티테크놀러지 | Apparatus for testing Printed Circuit Board |
US9885671B2 (en) | 2014-06-09 | 2018-02-06 | Kla-Tencor Corporation | Miniaturized imaging apparatus for wafer edge |
US9645097B2 (en) | 2014-06-20 | 2017-05-09 | Kla-Tencor Corporation | In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning |
CN105588840B (en) * | 2015-12-04 | 2019-01-25 | 广州视源电子科技股份有限公司 | A kind of electronic units fix method and device |
CN105873358B (en) * | 2016-05-31 | 2019-02-05 | Oppo广东移动通信有限公司 | Multiple-printed-panel for circuit board |
KR101751518B1 (en) * | 2016-08-24 | 2017-06-27 | 주식회사 아이디디 | Marking apparatus and method for PCB panel |
CN108804738B (en) * | 2018-03-22 | 2021-04-06 | 广州兴森快捷电路科技有限公司 | Circuit board defect tracking method and device based on positioning hole and computer equipment |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01214198A (en) * | 1988-02-23 | 1989-08-28 | Toshiba Corp | Recognition of failure of multi-layer printed-circuit board |
US5086477A (en) * | 1990-08-07 | 1992-02-04 | Northwest Technology Corp. | Automated system for extracting design and layout information from an integrated circuit |
US5204912A (en) * | 1990-02-26 | 1993-04-20 | Gerber Systems Corporation | Defect verification and marking system for use with printed circuit boards |
US5260779A (en) * | 1992-02-21 | 1993-11-09 | Control Automation, Inc. | Method and apparatus for inspecting a printed circuit board |
US20010036306A1 (en) * | 2000-03-08 | 2001-11-01 | Joachim Wienecke | Method for evaluating pattern defects on a wafer surface |
US20020131052A1 (en) * | 2000-11-13 | 2002-09-19 | Emery David G. | Advanced phase shift inspection method |
US20030086600A1 (en) * | 2000-11-08 | 2003-05-08 | Amnon Ganot | Multi-layer printed circuit board fabrication system and method |
US6707936B1 (en) * | 1999-04-16 | 2004-03-16 | Texas Instruments Incorporated | Method and apparatus for predicting device yield from a semiconductor wafer |
US6735745B2 (en) * | 2002-02-07 | 2004-05-11 | Applied Materials, Inc. | Method and system for detecting defects |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000101253A (en) * | 1998-09-24 | 2000-04-07 | Ibiden Co Ltd | Manufacture of multilayer printed wiring board |
JP2003139720A (en) * | 2001-10-31 | 2003-05-14 | Olympus Optical Co Ltd | Verifying device |
IL148829A0 (en) * | 2002-03-21 | 2002-09-12 | Camtek Ltd | A method for storing information on layers of a layered product |
JP4282515B2 (en) * | 2004-03-15 | 2009-06-24 | パナソニック株式会社 | Method for manufacturing component-embedded board and board management apparatus |
-
2004
- 2004-06-21 IL IL162650A patent/IL162650A/en active IP Right Grant
-
2005
- 2005-06-19 CN CN2005800248665A patent/CN101297305B/en active Active
- 2005-06-19 WO PCT/IL2005/000650 patent/WO2005122695A2/en active Application Filing
- 2005-06-19 JP JP2007517648A patent/JP4923180B2/en active Active
- 2005-06-20 TW TW094120377A patent/TWI275335B/en not_active IP Right Cessation
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01214198A (en) * | 1988-02-23 | 1989-08-28 | Toshiba Corp | Recognition of failure of multi-layer printed-circuit board |
US5204912A (en) * | 1990-02-26 | 1993-04-20 | Gerber Systems Corporation | Defect verification and marking system for use with printed circuit boards |
US5086477A (en) * | 1990-08-07 | 1992-02-04 | Northwest Technology Corp. | Automated system for extracting design and layout information from an integrated circuit |
US5260779A (en) * | 1992-02-21 | 1993-11-09 | Control Automation, Inc. | Method and apparatus for inspecting a printed circuit board |
US6707936B1 (en) * | 1999-04-16 | 2004-03-16 | Texas Instruments Incorporated | Method and apparatus for predicting device yield from a semiconductor wafer |
US20010036306A1 (en) * | 2000-03-08 | 2001-11-01 | Joachim Wienecke | Method for evaluating pattern defects on a wafer surface |
US20030086600A1 (en) * | 2000-11-08 | 2003-05-08 | Amnon Ganot | Multi-layer printed circuit board fabrication system and method |
US20020131052A1 (en) * | 2000-11-13 | 2002-09-19 | Emery David G. | Advanced phase shift inspection method |
US6735745B2 (en) * | 2002-02-07 | 2004-05-11 | Applied Materials, Inc. | Method and system for detecting defects |
Non-Patent Citations (1)
Title |
---|
IBM TECH DIS BULL, vol. 29, no. 3, August 1983 (1983-08-01), pages 1154 - 1155 * |
Also Published As
Publication number | Publication date |
---|---|
JP2008504521A (en) | 2008-02-14 |
IL162650A (en) | 2014-09-30 |
JP4923180B2 (en) | 2012-04-25 |
TWI275335B (en) | 2007-03-01 |
TW200601927A (en) | 2006-01-01 |
WO2005122695A2 (en) | 2005-12-29 |
CN101297305B (en) | 2012-08-22 |
CN101297305A (en) | 2008-10-29 |
IL162650A0 (en) | 2005-11-20 |
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