WO2006050395A3 - Optically enhanced digital imaging system - Google Patents

Optically enhanced digital imaging system Download PDF

Info

Publication number
WO2006050395A3
WO2006050395A3 PCT/US2005/039561 US2005039561W WO2006050395A3 WO 2006050395 A3 WO2006050395 A3 WO 2006050395A3 US 2005039561 W US2005039561 W US 2005039561W WO 2006050395 A3 WO2006050395 A3 WO 2006050395A3
Authority
WO
WIPO (PCT)
Prior art keywords
imaging system
systems
digital imaging
methods
enhanced digital
Prior art date
Application number
PCT/US2005/039561
Other languages
French (fr)
Other versions
WO2006050395A2 (en
Inventor
Cameron Abnet
Daniel Leibovich Feldkhun
Michael Stephen Mermelstein
Original Assignee
Umech Technologies Co
Cameron Abnet
Daniel Leibovich Feldkhun
Michael Stephen Mermelstein
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Umech Technologies Co, Cameron Abnet, Daniel Leibovich Feldkhun, Michael Stephen Mermelstein filed Critical Umech Technologies Co
Priority to DE202005021436U priority Critical patent/DE202005021436U1/en
Priority to EP05817014A priority patent/EP1807724A2/en
Priority to JP2007539308A priority patent/JP4948417B2/en
Publication of WO2006050395A2 publication Critical patent/WO2006050395A2/en
Publication of WO2006050395A3 publication Critical patent/WO2006050395A3/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00—Geometric image transformation in the plane of the image
    • G06T3/40—Scaling the whole image or part thereof
    • G06T3/4053—Super resolution, i.e. output image resolution higher than sensor resolution
    • G06T3/4069—Super resolution, i.e. output image resolution higher than sensor resolution by subpixel displacement
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/02—Objectives
    • G02B21/025—Objectives with variable magnification
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/387—Composing, repositioning or otherwise geometrically modifying originals
    • H04N1/393—Enlarging or reducing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/69—Control of means for changing angle of the field of view, e.g. optical zoom objectives or electronic zooming

Abstract

Improved methods and systems for imaging are provided. Specifically, systems and methods for extending the range of a digital zoom are provided in which an imaging system provides continuous magnification over a plurality of interleaved optical pathways and digital zooming imagers. Systems and methods of centering an image as the field of view changes, and for masking out undesirable obstacles from a magnified image are also provided.
PCT/US2005/039561 2004-11-02 2005-10-31 Optically enhanced digital imaging system WO2006050395A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DE202005021436U DE202005021436U1 (en) 2004-11-02 2005-10-31 Optically enhanced digital imaging system
EP05817014A EP1807724A2 (en) 2004-11-02 2005-10-31 Optically enhanced digital imaging system
JP2007539308A JP4948417B2 (en) 2004-11-02 2005-10-31 Optically enhanced digital imaging system

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US62432604P 2004-11-02 2004-11-02
US60/624,326 2004-11-02

Publications (2)

Publication Number Publication Date
WO2006050395A2 WO2006050395A2 (en) 2006-05-11
WO2006050395A3 true WO2006050395A3 (en) 2006-08-10

Family

ID=35841789

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2005/039561 WO2006050395A2 (en) 2004-11-02 2005-10-31 Optically enhanced digital imaging system

Country Status (5)

Country Link
US (2) US20060092505A1 (en)
EP (1) EP1807724A2 (en)
JP (2) JP4948417B2 (en)
DE (1) DE202005021436U1 (en)
WO (1) WO2006050395A2 (en)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110118834A1 (en) * 2004-03-31 2011-05-19 Yuhwa Lo Fluidic intraocular lens systems and methods
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
JP4558607B2 (en) * 2005-08-24 2010-10-06 ローレル精機株式会社 Coin detector
JP2008167447A (en) * 2006-12-27 2008-07-17 Suss Microtec Test Systems Gmbh Arrangement and method for image acquisition on prober
WO2008087632A2 (en) * 2007-01-15 2008-07-24 Humaneyes Technologies Ltd. A method and a system for lenticular printing
US8520060B2 (en) * 2007-02-25 2013-08-27 Humaneyes Technologies Ltd. Method and a system for calibrating and/or visualizing a multi image display and for reducing ghosting artifacts
US7986465B1 (en) 2007-03-01 2011-07-26 Rhevision Technology, Inc. Systems and methods for effecting zoom and focus using fluidic adaptive lenses
US20100195868A1 (en) * 2007-05-31 2010-08-05 Lu Peter J Target-locking acquisition with real-time confocal (tarc) microscopy
US9035968B2 (en) * 2007-07-23 2015-05-19 Humaneyes Technologies Ltd. Multi view displays and methods for producing the same
US8254034B1 (en) 2008-03-31 2012-08-28 Rhevision Technology, Inc. Fluidic adaptive lens with a lens membrane having suppressed fluid permeability
US9165388B2 (en) 2008-09-22 2015-10-20 International Business Machines Corporation Method of automatic cropping
US8253784B2 (en) * 2008-11-13 2012-08-28 Honeywell International Inc. Image capturing device assembly for use with test probe
US8482562B2 (en) 2009-12-03 2013-07-09 International Business Machines Corporation Vision-based computer control
JP2011135490A (en) * 2009-12-25 2011-07-07 Seiko Epson Corp Digital camera and method of manufacturing the same
JP2011133796A (en) * 2009-12-25 2011-07-07 Seiko Epson Corp Camera and method for manufacturing the same
JP5718155B2 (en) * 2011-05-27 2015-05-13 オリンパス株式会社 Imaging device
JP2014178357A (en) * 2013-03-13 2014-09-25 Sony Corp Digital microscope device, imaging method of the same and program
WO2014155942A1 (en) * 2013-03-26 2014-10-02 パナソニックヘルスケア株式会社 Observation device, signal output method and signal generation program
DE102013006994A1 (en) 2013-04-19 2014-10-23 Carl Zeiss Microscopy Gmbh Digital microscope and method for optimizing the workflow in a digital microscope
TWI599793B (en) * 2015-11-23 2017-09-21 財團法人金屬工業研究發展中心 Image scanning system for tissue slides
DE102018104704A1 (en) * 2018-03-01 2019-09-05 Carl Zeiss Microscopy Gmbh Digital microscope and method for changing a magnification of a digital microscope
DE102018110644B4 (en) 2018-05-03 2024-02-15 Carl Zeiss Meditec Ag Digital microscope and digital microscopy method
EP3674774A1 (en) * 2018-12-27 2020-07-01 Leica Instruments (Singapore) Pte. Ltd. Digital microscope system, method for operating the same and computer program
DE102020101879A1 (en) 2020-01-27 2021-07-29 Carl Zeiss Meditec Ag Stereo microscope and microscopy method for creating a stereo image of an object
DE102020101880A1 (en) 2020-01-27 2021-07-29 Carl Zeiss Meditec Ag Microscopy method and microscope for generating an image of an object
KR20220160240A (en) * 2021-05-27 2022-12-06 삼성전자주식회사 Electronic device including imaging optical system
FR3127048A1 (en) * 2021-09-10 2023-03-17 Universite de Bordeaux Optical microscope and method for high resolution optical microscopy with increased field of view

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5686960A (en) * 1992-01-14 1997-11-11 Michael Sussman Image input device having optical deflection elements for capturing multiple sub-images
US20020176160A1 (en) * 2001-03-30 2002-11-28 Nikon Corporation Microscope system
US20030076585A1 (en) * 2001-08-07 2003-04-24 Ledley Robert S. Optical system for enhancing the image from a microscope's high power objective lens
US20040170312A1 (en) * 2000-05-03 2004-09-02 Soenksen Dirk G. Fully automatic rapid microscope slide scanner

Family Cites Families (108)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US491783A (en) * 1893-02-14 Bolster-plate
US2142625A (en) * 1932-07-06 1939-01-03 Hollandsche Draad En Kabelfab High tension cable
US2921276A (en) * 1955-08-30 1960-01-12 Cutler Hammer Inc Microwave circuits
US3230299A (en) * 1962-07-18 1966-01-18 Gen Cable Corp Electrical cable with chemically bonded rubber layers
US3429040A (en) * 1965-06-18 1969-02-25 Ibm Method of joining a component to a substrate
GB1240866A (en) * 1968-08-22 1971-07-28 Amf Inc Control device
NL7003475A (en) * 1969-03-28 1970-09-30
US3714572A (en) * 1970-08-21 1973-01-30 Rca Corp Alignment and test fixture apparatus
US4009456A (en) * 1970-10-07 1977-02-22 General Microwave Corporation Variable microwave attenuator
US3710251A (en) * 1971-04-07 1973-01-09 Collins Radio Co Microelectric heat exchanger pedestal
GB1387587A (en) * 1971-07-22 1975-03-19 Plessey Co Ltd Electrical interconnectors and connector assemblies
CA970849A (en) * 1972-09-18 1975-07-08 Malcolm P. Macmartin Low leakage isolating transformer for electromedical apparatus
US3867698A (en) * 1973-03-01 1975-02-18 Western Electric Co Test probe for integrated circuit chips
US3930809A (en) * 1973-08-21 1976-01-06 Wentworth Laboratories, Inc. Assembly fixture for fixed point probe card
US3863181A (en) * 1973-12-03 1975-01-28 Bell Telephone Labor Inc Mode suppressor for strip transmission lines
US4001685A (en) * 1974-03-04 1977-01-04 Electroglas, Inc. Micro-circuit test probe
US3936743A (en) * 1974-03-05 1976-02-03 Electroglas, Inc. High speed precision chuck assembly
SE407115B (en) * 1975-10-06 1979-03-12 Kabi Ab PROCEDURES AND METAL ELECTRODES FOR THE STUDY OF ENZYMATIC AND OTHER BIOCHEMICAL REACTIONS
US4008900A (en) * 1976-03-15 1977-02-22 John Freedom Indexing chuck
US4074201A (en) * 1976-07-26 1978-02-14 Gte Sylvania Incorporated Signal analyzer with noise estimation and signal to noise readout
US4186338A (en) * 1976-12-16 1980-01-29 Genrad, Inc. Phase change detection method of and apparatus for current-tracing the location of faults on printed circuit boards and similar systems
US4312117A (en) * 1977-09-01 1982-01-26 Raytheon Company Integrated test and assembly device
US4184729A (en) * 1977-10-13 1980-01-22 Bunker Ramo Corporation Flexible connector cable
US4135131A (en) * 1977-10-14 1979-01-16 The United States Of America As Represented By The Secretary Of The Army Microwave time delay spectroscopic methods and apparatus for remote interrogation of biological targets
US4184133A (en) * 1977-11-28 1980-01-15 Rockwell International Corporation Assembly of microwave integrated circuits having a structurally continuous ground plane
US4425395A (en) * 1981-04-30 1984-01-10 Fujikura Rubber Works, Ltd. Base fabrics for polyurethane-coated fabrics, polyurethane-coated fabrics and processes for their production
US4426619A (en) * 1981-06-03 1984-01-17 Temptronic Corporation Electrical testing system including plastic window test chamber and method of using same
US4566184A (en) * 1981-08-24 1986-01-28 Rockwell International Corporation Process for making a probe for high speed integrated circuits
US4491173A (en) * 1982-05-28 1985-01-01 Temptronic Corporation Rotatable inspection table
JPS60136006U (en) * 1984-02-20 1985-09-10 株式会社　潤工社 flat cable
JP2609232B2 (en) * 1986-09-04 1997-05-14 日本ヒューレット・パッカード株式会社 Floating drive circuit
US5082627A (en) * 1987-05-01 1992-01-21 Biotronic Systems Corporation Three dimensional binding site array for interfering with an electrical field
US4894612A (en) * 1987-08-13 1990-01-16 Hypres, Incorporated Soft probe for providing high speed on-wafer connections to a circuit
US5084671A (en) * 1987-09-02 1992-01-28 Tokyo Electron Limited Electric probing-test machine having a cooling system
US4896109A (en) * 1987-12-07 1990-01-23 The United States Of America As Represented By The Department Of Energy Photoconductive circuit element reflectometer
US4891584A (en) * 1988-03-21 1990-01-02 Semitest, Inc. Apparatus for making surface photovoltage measurements of a semiconductor
US4988062A (en) * 1988-03-10 1991-01-29 London Robert A Apparatus, system and method for organizing and maintaining a plurality of medical catheters and the like
US4983910A (en) * 1988-05-20 1991-01-08 Stanford University Millimeter-wave active probe
US4987100A (en) * 1988-05-26 1991-01-22 International Business Machines Corporation Flexible carrier for an electronic device
US4893914A (en) * 1988-10-12 1990-01-16 The Micromanipulator Company, Inc. Test station
US4982153A (en) * 1989-02-06 1991-01-01 Cray Research, Inc. Method and apparatus for cooling an integrated circuit chip during testing
JP2960733B2 (en) * 1989-07-27 1999-10-12 株式会社日立製作所 Image display method, image display device, and remote operation device
DE69130205T2 (en) * 1990-12-25 1999-03-25 Ngk Insulators Ltd Semiconductor wafer heater and method of manufacturing the same
JPH05136218A (en) * 1991-02-19 1993-06-01 Tokyo Electron Yamanashi Kk Inspection device
US5487999A (en) * 1991-06-04 1996-01-30 Micron Technology, Inc. Method for fabricating a penetration limited contact having a rough textured surface
US5177438A (en) * 1991-08-02 1993-01-05 Motorola, Inc. Low resistance probe for semiconductor
US5180977A (en) * 1991-12-02 1993-01-19 Hoya Corporation Usa Membrane probe contact bump compliancy system
US5345170A (en) * 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US5382898A (en) * 1992-09-21 1995-01-17 Cerprobe Corporation High density probe card for testing electrical circuits
US5371654A (en) * 1992-10-19 1994-12-06 International Business Machines Corporation Three dimensional high performance interconnection package
US5383787A (en) * 1993-04-27 1995-01-24 Aptix Corporation Integrated circuit package with direct access to internal signals
JP3346838B2 (en) * 1993-06-29 2002-11-18 有限会社創造庵 Rotary movement mechanism
US5594358A (en) * 1993-09-02 1997-01-14 Matsushita Electric Industrial Co., Ltd. Radio frequency probe and probe card including a signal needle and grounding needle coupled to a microstrip transmission line
US6023103A (en) * 1994-11-15 2000-02-08 Formfactor, Inc. Chip-scale carrier for semiconductor devices including mounted spring contacts
US7064566B2 (en) * 1993-11-16 2006-06-20 Formfactor, Inc. Probe card assembly and kit
US6836962B2 (en) * 1993-11-16 2005-01-04 Formfactor, Inc. Method and apparatus for shaping spring elements
US20020011859A1 (en) * 1993-12-23 2002-01-31 Kenneth R. Smith Method for forming conductive bumps for the purpose of contrructing a fine pitch test device
US5486975A (en) * 1994-01-31 1996-01-23 Applied Materials, Inc. Corrosion resistant electrostatic chuck
JPH07248452A (en) * 1994-03-14 1995-09-26 Nikon Corp Device for automatically tracking sample image
JP3382346B2 (en) * 1994-04-12 2003-03-04 キヤノン株式会社 Imaging device
US5704355A (en) * 1994-07-01 1998-01-06 Bridges; Jack E. Non-invasive system for breast cancer detection
GB9417450D0 (en) * 1994-08-25 1994-10-19 Symmetricom Inc An antenna
US5774222A (en) * 1994-10-07 1998-06-30 Hitachi, Ltd. Manufacturing method of semiconductor substrative and method and apparatus for inspecting defects of patterns on an object to be inspected
US5481196A (en) * 1994-11-08 1996-01-02 Nebraska Electronics, Inc. Process and apparatus for microwave diagnostics and therapy
JP3563800B2 (en) * 1995-01-09 2004-09-08 オリンパス株式会社 Observation optical device
US6002109A (en) * 1995-07-10 1999-12-14 Mattson Technology, Inc. System and method for thermal processing of a semiconductor substrate
KR0176434B1 (en) * 1995-10-27 1999-04-15 이대원 Vacuum chuck apparatus
US5712571A (en) * 1995-11-03 1998-01-27 Analog Devices, Inc. Apparatus and method for detecting defects arising as a result of integrated circuit processing
JP3838381B2 (en) * 1995-11-22 2006-10-25 株式会社アドバンテスト Probe card
US5861743A (en) * 1995-12-21 1999-01-19 Genrad, Inc. Hybrid scanner for use in an improved MDA tester
US6181149B1 (en) * 1996-09-26 2001-01-30 Delaware Capital Formation, Inc. Grid array package test contactor
US6002263A (en) * 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
JPH11112859A (en) * 1997-09-30 1999-04-23 Kyocera Corp Digital electronic camera
US6013586A (en) * 1997-10-09 2000-01-11 Dimension Polyant Sailcloth, Inc. Tent material product and method of making tent material product
US6287776B1 (en) * 1998-02-02 2001-09-11 Signature Bioscience, Inc. Method for detecting and classifying nucleic acid hybridization
US6181144B1 (en) * 1998-02-25 2001-01-30 Micron Technology, Inc. Semiconductor probe card having resistance measuring circuitry and method fabrication
US6720501B1 (en) * 1998-04-14 2004-04-13 Formfactor, Inc. PC board having clustered blind vias
US6181416B1 (en) * 1998-04-14 2001-01-30 Optometrix, Inc. Schlieren method for imaging semiconductor device properties
TW440699B (en) * 1998-06-09 2001-06-16 Advantest Corp Test apparatus for electronic parts
GB2342148B (en) * 1998-10-01 2000-12-20 Nippon Kokan Kk Method and apparatus for preventing snow from melting and for packing snow in artificial ski facility
US6175228B1 (en) * 1998-10-30 2001-01-16 Agilent Technologies Electronic probe for measuring high impedance tri-state logic circuits
US6169410B1 (en) * 1998-11-09 2001-01-02 Anritsu Company Wafer probe with built in RF frequency conversion module
US6672875B1 (en) * 1998-12-02 2004-01-06 Formfactor, Inc. Spring interconnect structures
WO2000050867A2 (en) * 1999-02-22 2000-08-31 Paul Bryant Programmable active microwave ultrafine resonance spectrometer (pamurs) method and systems
US6539531B2 (en) * 1999-02-25 2003-03-25 Formfactor, Inc. Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes
US6448865B1 (en) * 1999-02-25 2002-09-10 Formfactor, Inc. Integrated circuit interconnect system
US6499121B1 (en) * 1999-03-01 2002-12-24 Formfactor, Inc. Distributed interface for parallel testing of multiple devices using a single tester channel
US6400166B2 (en) * 1999-04-15 2002-06-04 International Business Machines Corporation Micro probe and method of fabricating same
US6340895B1 (en) * 1999-07-14 2002-01-22 Aehr Test Systems, Inc. Wafer-level burn-in and test cartridge
US6339338B1 (en) * 2000-01-18 2002-01-15 Formfactor, Inc. Apparatus for reducing power supply noise in an integrated circuit
US6509751B1 (en) * 2000-03-17 2003-01-21 Formfactor, Inc. Planarizer for a semiconductor contactor
US6677744B1 (en) * 2000-04-13 2004-01-13 Formfactor, Inc. System for measuring signal path resistance for an integrated circuit tester interconnect structure
US6379130B1 (en) * 2000-06-09 2002-04-30 Tecumseh Products Company Motor cover retention
JP2002022775A (en) * 2000-07-05 2002-01-23 Ando Electric Co Ltd Electro-optical probe and magneto-optical probe
JP4254022B2 (en) * 2000-07-07 2009-04-15 株式会社明電舎 Stationary obstacle detection method
JP2002039091A (en) * 2000-07-21 2002-02-06 Minebea Co Ltd Blower
US6512482B1 (en) * 2001-03-20 2003-01-28 Xilinx, Inc. Method and apparatus using a semiconductor die integrated antenna structure
JP4029603B2 (en) * 2001-05-31 2008-01-09 豊田合成株式会社 Weather strip
CA2353024C (en) * 2001-07-12 2005-12-06 Ibm Canada Limited-Ibm Canada Limitee Anti-vibration and anti-tilt microscope stand
US6678876B2 (en) * 2001-08-24 2004-01-13 Formfactor, Inc. Process and apparatus for finding paths through a routing space
NZ518092A (en) * 2002-03-28 2004-11-26 Pulse Data Internat Ltd Low vision video magnifier viewing apparatus having digital zoom feature
JP4095336B2 (en) * 2002-05-13 2008-06-04 日本放送協会 Original image restoration apparatus and original image restoration program
US6815963B2 (en) * 2002-05-23 2004-11-09 Cascade Microtech, Inc. Probe for testing a device under test
US7343185B2 (en) * 2002-06-21 2008-03-11 Nir Diagnostics Inc. Measurement of body compounds
JP2004101871A (en) * 2002-09-10 2004-04-02 Olympus Corp Photographing apparatus for microscope image
US6847219B1 (en) * 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US6987483B2 (en) * 2003-02-21 2006-01-17 Kyocera Wireless Corp. Effectively balanced dipole microstrip antenna
US6838885B2 (en) * 2003-03-05 2005-01-04 Murata Manufacturing Co., Ltd. Method of correcting measurement error and electronic component characteristic measurement apparatus

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5686960A (en) * 1992-01-14 1997-11-11 Michael Sussman Image input device having optical deflection elements for capturing multiple sub-images
US20040170312A1 (en) * 2000-05-03 2004-09-02 Soenksen Dirk G. Fully automatic rapid microscope slide scanner
US20020176160A1 (en) * 2001-03-30 2002-11-28 Nikon Corporation Microscope system
US20030076585A1 (en) * 2001-08-07 2003-04-24 Ledley Robert S. Optical system for enhancing the image from a microscope's high power objective lens

Also Published As

Publication number Publication date
US20060092505A1 (en) 2006-05-04
DE202005021436U1 (en) 2008-02-14
JP2008519499A (en) 2008-06-05
JP2010114916A (en) 2010-05-20
EP1807724A2 (en) 2007-07-18
WO2006050395A2 (en) 2006-05-11
US9245317B2 (en) 2016-01-26
JP4948417B2 (en) 2012-06-06
US20130044203A1 (en) 2013-02-21

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