WO2006071668A3 - Pin electronics with high voltage functionality - Google Patents

Pin electronics with high voltage functionality Download PDF

Info

Publication number
WO2006071668A3
WO2006071668A3 PCT/US2005/046332 US2005046332W WO2006071668A3 WO 2006071668 A3 WO2006071668 A3 WO 2006071668A3 US 2005046332 W US2005046332 W US 2005046332W WO 2006071668 A3 WO2006071668 A3 WO 2006071668A3
Authority
WO
WIPO (PCT)
Prior art keywords
high voltage
pin electronics
pin
output
voltage functionality
Prior art date
Application number
PCT/US2005/046332
Other languages
French (fr)
Other versions
WO2006071668A2 (en
Inventor
Ernest P Walker
Ronald A Sartschev
Original Assignee
Teradyne Inc
Ernest P Walker
Ronald A Sartschev
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc, Ernest P Walker, Ronald A Sartschev filed Critical Teradyne Inc
Priority to JP2007548428A priority Critical patent/JP4698680B2/en
Priority to EP05854966A priority patent/EP1849018A4/en
Priority to CN2005800440104A priority patent/CN101084444B/en
Publication of WO2006071668A2 publication Critical patent/WO2006071668A2/en
Publication of WO2006071668A3 publication Critical patent/WO2006071668A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Abstract

In one aspect, the invention is an integrated circuit (IC) for use in testing a device. The IC includes a pin electronics (PE) driver having an output and a pin. The IC also includes a buffer connected to the output of the PE driver and the pin. The first voltage measured at the pin is greater than a second voltage measured at the output. The IC may include a first amplifier having an input connected to a voltage source. The IC may also include a second amplifier having an input connected to the output of the PE driver.
PCT/US2005/046332 2004-12-23 2005-12-16 Pin electronics with high voltage functionality WO2006071668A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2007548428A JP4698680B2 (en) 2004-12-23 2005-12-16 Pin electronics with high voltage capability
EP05854966A EP1849018A4 (en) 2004-12-23 2005-12-16 Pin electronics with high voltage functionality
CN2005800440104A CN101084444B (en) 2004-12-23 2005-12-16 Pin electronics with high voltage functionality

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/023,023 US7102375B2 (en) 2004-12-23 2004-12-23 Pin electronics with high voltage functionality
US11/023,023 2004-12-23

Publications (2)

Publication Number Publication Date
WO2006071668A2 WO2006071668A2 (en) 2006-07-06
WO2006071668A3 true WO2006071668A3 (en) 2007-01-04

Family

ID=36610716

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2005/046332 WO2006071668A2 (en) 2004-12-23 2005-12-16 Pin electronics with high voltage functionality

Country Status (6)

Country Link
US (1) US7102375B2 (en)
EP (1) EP1849018A4 (en)
JP (1) JP4698680B2 (en)
KR (1) KR100905507B1 (en)
CN (1) CN101084444B (en)
WO (1) WO2006071668A2 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7560947B2 (en) 2005-09-28 2009-07-14 Teradyne, Inc. Pin electronics driver
US7712000B2 (en) * 2006-10-30 2010-05-04 Verigy (Singapore) Pte. Ltd. ATE architecture and method for DFT oriented testing
KR101414980B1 (en) * 2008-06-30 2014-07-09 삼성전자주식회사 Test system
KR20120137963A (en) * 2011-06-14 2012-12-24 삼성전자주식회사 Signal transmission apparatus and semiconductor test apparatus using the same
US10976367B2 (en) 2018-12-13 2021-04-13 Micron Technology, Inc. Controller structural testing with automated test vectors
TW202102869A (en) * 2019-04-16 2021-01-16 美商塞雷特有限責任公司 Device interface board compliance testing using impedance response profiling
US11125817B2 (en) 2019-10-14 2021-09-21 Analog Devices, Inc. Compound pin driver
US11264906B2 (en) 2019-12-13 2022-03-01 Analog Devices, Inc. Compound pin driver controller

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5754041A (en) * 1995-03-17 1998-05-19 Hewlett-Packard Company Device for measuring voltage/current characteristics with means to prevent output transients during changes in settings
US6687868B1 (en) * 1999-04-06 2004-02-03 Advantest Corporation Test device and method for electrically testing electronic device
US6859902B1 (en) * 2000-10-02 2005-02-22 Credence Systems Corporation Method and apparatus for high speed IC test interface
US6879175B2 (en) * 2003-03-31 2005-04-12 Teradyne, Inc. Hybrid AC/DC-coupled channel for automatic test equipment
US6940271B2 (en) * 2001-08-17 2005-09-06 Nptest, Inc. Pin electronics interface circuit

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0650787Y2 (en) * 1987-10-28 1994-12-21 株式会社アドバンテスト I / O circuit for IC test
US4998026A (en) * 1989-04-19 1991-03-05 Hewlett-Packard Company Driver circuit for in-circuit overdrive/functional tester
JPH03255377A (en) * 1990-03-05 1991-11-14 Nec Corp Testing apparatus of integrated circuit
US5200696A (en) 1990-09-10 1993-04-06 Ltx Corporation Test system apparatus with Schottky diodes with programmable voltages
US5101153A (en) 1991-01-09 1992-03-31 National Semiconductor Corporation Pin electronics test circuit for IC device testing
US5467024A (en) 1993-11-01 1995-11-14 Motorola, Inc. Integrated circuit test with programmable source for both AC and DC modes of operation
JPH07218596A (en) 1994-02-03 1995-08-18 Mitsubishi Electric Corp Semiconductor testing apparatus
US5521493A (en) 1994-11-21 1996-05-28 Megatest Corporation Semiconductor test system including a novel driver/load circuit
JPH09325176A (en) * 1996-06-05 1997-12-16 Advantest Corp Ic tester
US5844913A (en) * 1997-04-04 1998-12-01 Hewlett-Packard Company Current mode interface circuitry for an IC test device
US6049901A (en) * 1997-09-16 2000-04-11 Stock; Mary C. Test system for integrated circuits using a single memory for both the parallel and scan modes of testing
JPH11326441A (en) * 1998-05-20 1999-11-26 Advantest Corp Semiconductor testing device
JP2001183431A (en) * 1999-04-06 2001-07-06 Advantest Corp Testing device and testing method
JP4119060B2 (en) 1999-10-01 2008-07-16 株式会社アドバンテスト Test equipment
US6694462B1 (en) * 2000-08-09 2004-02-17 Teradyne, Inc. Capturing and evaluating high speed data streams
US6677775B2 (en) 2001-01-10 2004-01-13 Analog Devices, Inc. Circuit testing device using a driver to perform electronics testing
US6885213B2 (en) 2002-09-13 2005-04-26 Logicvision, Inc. Circuit and method for accurately applying a voltage to a node of an integrated circuit
US6836136B2 (en) 2002-12-18 2004-12-28 Teradyne, Inc. Pin driver for AC and DC semiconductor device testing
US6828775B2 (en) 2003-02-21 2004-12-07 Semtech Corporation High-impedance mode for precision measurement unit
US7046014B2 (en) 2004-02-27 2006-05-16 Broadcom Corporation ATE measurement technique for comparator threshold voltage

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5754041A (en) * 1995-03-17 1998-05-19 Hewlett-Packard Company Device for measuring voltage/current characteristics with means to prevent output transients during changes in settings
US6687868B1 (en) * 1999-04-06 2004-02-03 Advantest Corporation Test device and method for electrically testing electronic device
US6859902B1 (en) * 2000-10-02 2005-02-22 Credence Systems Corporation Method and apparatus for high speed IC test interface
US6940271B2 (en) * 2001-08-17 2005-09-06 Nptest, Inc. Pin electronics interface circuit
US6879175B2 (en) * 2003-03-31 2005-04-12 Teradyne, Inc. Hybrid AC/DC-coupled channel for automatic test equipment

Also Published As

Publication number Publication date
KR100905507B1 (en) 2009-07-01
JP4698680B2 (en) 2011-06-08
CN101084444B (en) 2010-11-24
US20060139048A1 (en) 2006-06-29
KR20070086393A (en) 2007-08-27
EP1849018A4 (en) 2008-04-16
US7102375B2 (en) 2006-09-05
WO2006071668A2 (en) 2006-07-06
JP2008525803A (en) 2008-07-17
EP1849018A2 (en) 2007-10-31
CN101084444A (en) 2007-12-05

Similar Documents

Publication Publication Date Title
WO2006071668A3 (en) Pin electronics with high voltage functionality
WO2006050288A3 (en) Low cost test for ic's or electrical modules using standard reconfigurable logic devices
WO2007115120A3 (en) Method and apparatus to test the power-on-reset trip point of an integrated circuit
TW200706891A (en) Semiconductor integrated circuit and method for testing connection state between semiconductor integrated circuits
TW200703354A (en) Internally generating patterns for testing in an integrated circuit device
WO2006068936A3 (en) A method and system for testing semiconductor devices
DE502004011678D1 (en) MEASURING SENSOR WITH PREVENTING DEVICE
WO2006068938A3 (en) Bi-directional buffer for interfacing test system channel
TW200741227A (en) Manufacturing method of semiconductor device and semiconductor device
EP1970720A3 (en) Semiconductor component and method for testing the same
WO2007024794A3 (en) Heater chip test circuit and methods for using the same
TW200742255A (en) Output driver that operates both in a differential mode and in a single mode
WO2007031938A3 (en) Development of assertions for integrated circuit design simulation
WO2010117516A3 (en) System and method for using an integrated circuit pin as both a current limiting input and an open-drain output
TW200733130A (en) High-speed, low-power input buffer for an integrated circuit device
EP1308736A3 (en) Test circuit and semiconductor integrated circuit effectively carrying out verification of connection of nodes
DE60313860D1 (en) Integrated circuit with improved BIST circuit for performing a structured test
WO2008005362A3 (en) Calibration device
WO2012021332A3 (en) Circuitry on an integrated circuit for performing or facilitating oscilloscope, jitter, and/or bit-error-rate tester operations
WO2007047178A3 (en) Integrated circuit package resistance measurement
TW200504934A (en) Semiconductor integrated circuit device
TW200636742A (en) Sense amplifier overdriving circuit and semiconductor device using the same
GB2466777B (en) Apparatus and method for testing a transducer and/or electronic circuitry associated with a transducer
TW200743206A (en) Integration of vacuum microelectronic device with integrated circuit
WO2007005047A3 (en) System and method for configuring direct current converter

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 200580044010.4

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application
DPE1 Request for preliminary examination filed after expiration of 19th month from priority date (pct application filed from 20040101)
WWE Wipo information: entry into national phase

Ref document number: 2005854966

Country of ref document: EP

WWE Wipo information: entry into national phase

Ref document number: 2178/KOLNP/2007

Country of ref document: IN

WWE Wipo information: entry into national phase

Ref document number: 1020077013818

Country of ref document: KR

WWE Wipo information: entry into national phase

Ref document number: 2007548428

Country of ref document: JP

NENP Non-entry into the national phase

Ref country code: DE

DPE1 Request for preliminary examination filed after expiration of 19th month from priority date (pct application filed from 20040101)