WO2006081031A3 - Adaptive scanning optical microscope - Google Patents

Adaptive scanning optical microscope Download PDF

Info

Publication number
WO2006081031A3
WO2006081031A3 PCT/US2005/047287 US2005047287W WO2006081031A3 WO 2006081031 A3 WO2006081031 A3 WO 2006081031A3 US 2005047287 W US2005047287 W US 2005047287W WO 2006081031 A3 WO2006081031 A3 WO 2006081031A3
Authority
WO
WIPO (PCT)
Prior art keywords
light
plane
optical microscope
scanning optical
field
Prior art date
Application number
PCT/US2005/047287
Other languages
French (fr)
Other versions
WO2006081031A2 (en
Inventor
Benjamin Michael Potsaid
Yves Bellouard
John T Wen
Original Assignee
Rensselaer Polytech Inst
Benjamin Michael Potsaid
Yves Bellouard
John T Wen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rensselaer Polytech Inst, Benjamin Michael Potsaid, Yves Bellouard, John T Wen filed Critical Rensselaer Polytech Inst
Priority to EP05855789A priority Critical patent/EP1842095A4/en
Priority to JP2007553106A priority patent/JP2008529082A/en
Publication of WO2006081031A2 publication Critical patent/WO2006081031A2/en
Publication of WO2006081031A3 publication Critical patent/WO2006081031A3/en
Priority to IL183131A priority patent/IL183131A0/en
Priority to US11/758,117 priority patent/US7742213B2/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/06—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the phase of light

Abstract

An adaptive scanning optical microscope (Fig. 1, 10) has a scanner lens assembly (16) for acquiring images from different parts of a object plane and for forming a preferably curved image field having at least some aberration which vanes as a function of the part of the object plane from which the image is acquired. A steering mirror selects the field of view and steers light from the object and along a light path from the object plane to a final image plane. An adaptive optics element (18) receives the steered light from the object and compensates for the field position dependent optical aberrations and additional optics are along at least part of the light pat for conditioning and focusing the light as it moves from the steering mirror, past the adaptive optics element and to the final image plane.
PCT/US2005/047287 2005-01-27 2005-12-29 Adaptive scanning optical microscope WO2006081031A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP05855789A EP1842095A4 (en) 2005-01-27 2005-12-29 Adaptive scanning optical microscope
JP2007553106A JP2008529082A (en) 2005-01-27 2005-12-29 Compensation scanning optical microscope
IL183131A IL183131A0 (en) 2005-01-27 2007-05-10 Adaptive scanning optical microscope
US11/758,117 US7742213B2 (en) 2005-12-29 2007-06-05 Adaptive-scanning optical microscope

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US64757205P 2005-01-27 2005-01-27
US60/647,572 2005-01-27

Publications (2)

Publication Number Publication Date
WO2006081031A2 WO2006081031A2 (en) 2006-08-03
WO2006081031A3 true WO2006081031A3 (en) 2007-03-01

Family

ID=36740940

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2005/047287 WO2006081031A2 (en) 2005-01-27 2005-12-29 Adaptive scanning optical microscope

Country Status (5)

Country Link
EP (1) EP1842095A4 (en)
JP (1) JP2008529082A (en)
CN (1) CN100585449C (en)
IL (1) IL183131A0 (en)
WO (1) WO2006081031A2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9107612B2 (en) 2004-04-20 2015-08-18 Wavetec Vision Systems, Inc. Integrated surgical microscope and wavefront sensor
US9295381B2 (en) 2007-10-31 2016-03-29 Wavetec Vision Systems, Inc. Wavefront sensor
US9307904B2 (en) 2008-11-06 2016-04-12 Wavetec Vision Systems, Inc. Optical angular measurement system for ophthalmic applications and method for positioning of a toric intraocular lens with increased accuracy
US9339180B2 (en) 2012-09-27 2016-05-17 Wavetec Vision Systems, Inc. Geometric optical power measurement device
US9554697B2 (en) 2009-07-14 2017-01-31 Wavetec Vision Systems, Inc. Determination of the effective lens position of an intraocular lens using aphakic refractive power

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7556378B1 (en) 2003-04-10 2009-07-07 Tsontcho Ianchulev Intraoperative estimation of intraocular lens power
DE102006010767B4 (en) * 2006-03-08 2008-04-17 Carl Zeiss Surgical Gmbh microscopy system
US8333474B2 (en) 2007-10-19 2012-12-18 Wavetec Vision Systems, Inc. Optical instrument alignment system
US8876290B2 (en) 2009-07-06 2014-11-04 Wavetec Vision Systems, Inc. Objective quality metric for ocular wavefront measurements
WO2011008609A1 (en) 2009-07-14 2011-01-20 Wavetec Vision Systems, Inc. Ophthalmic surgery measurement system
JP5690827B2 (en) * 2009-09-18 2015-03-25 カール・ツァイス・エスエムティー・ゲーエムベーハー Method for measuring shape of optical surface and interference measuring device
JP2011095685A (en) * 2009-11-02 2011-05-12 Sony Corp Microscope system and method for controlling the microscope system
JP5744450B2 (en) * 2009-11-17 2015-07-08 キヤノン株式会社 Imaging apparatus and control method thereof
DE102012101778A1 (en) * 2012-03-02 2013-09-05 Leica Microsystems Cms Gmbh Scanning microscopic method and scanning microscope
JP5814855B2 (en) * 2012-04-27 2015-11-17 株式会社日立ハイテクノロジーズ Charged particle beam adjustment support apparatus and method
TWI490542B (en) * 2013-05-07 2015-07-01 Univ Nat Taiwan A scanning lens and an interference measuring device using the scanning lens
DE102014005880A1 (en) 2014-04-17 2015-11-05 Carl Zeiss Ag Scanning microscope with simplified optics, in particular with variable pupil position
DE102014112199A1 (en) 2014-08-26 2016-03-03 Carl Zeiss Microscopy Gmbh Microscopic imaging system
DE102014113908A1 (en) * 2014-09-25 2016-03-31 Carl Zeiss Ag Laser scanning system
DE102014017001A1 (en) * 2014-11-12 2016-05-12 Carl Zeiss Ag Microscope with low distortion error
CN104460007B (en) * 2014-12-30 2017-02-01 哈尔滨工业大学 Laser tripled-frequency space intensity shaping method
CN108351301B (en) 2015-09-02 2021-03-09 英思克斯公司 System and method for color imaging
CN105242397B (en) * 2015-09-30 2017-10-27 深圳大学 A kind of relevant adaptive optics aberration correction system
CN108474736B (en) 2015-11-05 2022-01-25 英思克斯公司 System and method for optogenetic imaging
CN105910799B (en) * 2016-06-06 2017-06-06 北京理工大学 Unlimited and finite conjugate seeks burnt light electric image analyzer and its method
CN106092518B (en) * 2016-06-06 2017-09-05 北京理工大学 Unlimited and finite conjugate differential detection seeks burnt photoelectricity as analyzer and its method
CN106199751B (en) * 2016-07-08 2019-03-01 中国科学院电子学研究所 The automatically controlled beam scanning optical link of Terahertz
CN106680984B (en) * 2016-12-16 2019-06-11 大连光耀辉科技有限公司 A kind of laser binary channels output equipment and microscope simultaneously
CN106773024A (en) * 2017-03-30 2017-05-31 中国检验认证集团检验有限公司 A kind of change enlargement ratio optical image technology based on distorting lens
CN107063092B (en) * 2017-06-05 2019-02-05 北京理工大学 A kind of coaxial calibration system of double light sources that big visual field quickly scans and method of adjustment
CN112782844B (en) * 2021-01-12 2023-03-31 中国科学院光电技术研究所 Stable closed-loop control method for adaptive optical system

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040223214A1 (en) * 2003-05-09 2004-11-11 3M Innovative Properties Company Scanning laser microscope with wavefront sensor

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002044786A2 (en) * 2000-11-28 2002-06-06 Carl Zeiss Smt Ag Catadioptric projection system for 157 nm lithography
TW538256B (en) * 2000-01-14 2003-06-21 Zeiss Stiftung Microlithographic reduction projection catadioptric objective
DE10038622A1 (en) * 2000-08-03 2002-02-21 Leica Microsystems Scanning microscope, optical arrangement and method for image acquisition in scanning microscopy
US6754000B2 (en) * 2000-10-04 2004-06-22 Leica Microsystems Heidelberg Gmbh Optical arrangement, and method for the deflection of light beams
JP2003057553A (en) * 2001-08-09 2003-02-26 Olympus Optical Co Ltd Confocal scanning type microscope
AU2003245458A1 (en) * 2002-06-12 2003-12-31 Advanced Research And Technology Institute, Inc. Method and apparatus for improving both lateral and axial resolution in ophthalmoscopy
CA2496091A1 (en) * 2002-09-16 2004-03-25 Rensselaer Polytechnic Institute Microscope with extended field of vision
US7339148B2 (en) * 2002-12-16 2008-03-04 Olympus America Inc. Confocal microscope
JP2004198492A (en) * 2002-12-16 2004-07-15 Olympus Corp Fluorescence microscope
JP2004247947A (en) * 2003-02-13 2004-09-02 Olympus Corp Optical apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040223214A1 (en) * 2003-05-09 2004-11-11 3M Innovative Properties Company Scanning laser microscope with wavefront sensor

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9107612B2 (en) 2004-04-20 2015-08-18 Wavetec Vision Systems, Inc. Integrated surgical microscope and wavefront sensor
US9420949B2 (en) 2004-04-20 2016-08-23 Wavetec Vision Systems, Inc. Integrated surgical microscope and wavefront sensor
US9295381B2 (en) 2007-10-31 2016-03-29 Wavetec Vision Systems, Inc. Wavefront sensor
US9307904B2 (en) 2008-11-06 2016-04-12 Wavetec Vision Systems, Inc. Optical angular measurement system for ophthalmic applications and method for positioning of a toric intraocular lens with increased accuracy
US9554697B2 (en) 2009-07-14 2017-01-31 Wavetec Vision Systems, Inc. Determination of the effective lens position of an intraocular lens using aphakic refractive power
US9339180B2 (en) 2012-09-27 2016-05-17 Wavetec Vision Systems, Inc. Geometric optical power measurement device

Also Published As

Publication number Publication date
EP1842095A4 (en) 2010-08-04
WO2006081031A2 (en) 2006-08-03
EP1842095A2 (en) 2007-10-10
JP2008529082A (en) 2008-07-31
IL183131A0 (en) 2007-09-20
CN101116023A (en) 2008-01-30
CN100585449C (en) 2010-01-27

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