WO2007046820A3 - Interferometric analysis for the manufacture of nano-scale devices - Google Patents
Interferometric analysis for the manufacture of nano-scale devices Download PDFInfo
- Publication number
- WO2007046820A3 WO2007046820A3 PCT/US2005/042638 US2005042638W WO2007046820A3 WO 2007046820 A3 WO2007046820 A3 WO 2007046820A3 US 2005042638 W US2005042638 W US 2005042638W WO 2007046820 A3 WO2007046820 A3 WO 2007046820A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- nano
- manufacture
- relative
- scale devices
- interferometric analysis
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C3/00—Measuring distances in line of sight; Optical rangefinders
- G01C3/02—Details
- G01C3/06—Use of electric means to obtain final indication
- G01C3/08—Use of electric radiation detectors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C3/00—Measuring distances in line of sight; Optical rangefinders
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
- G03F9/7023—Aligning or positioning in direction perpendicular to substrate surface
- G03F9/703—Gap setting, e.g. in proximity printer
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
- G03F9/7042—Alignment for lithographic apparatus using patterning methods other than those involving the exposure to radiation, e.g. by stamping or imprinting
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7049—Technique, e.g. interferometric
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7073—Alignment marks and their environment
- G03F9/7076—Mark details, e.g. phase grating mark, temporary mark
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020077012811A KR101299473B1 (en) | 2004-11-30 | 2005-11-21 | Interferometric analysis for the manufacture of nano-scale devices |
JP2007543499A JP5198070B2 (en) | 2004-11-30 | 2005-11-21 | Interference analysis to produce nanoscale devices |
CN2005800407515A CN101115971B (en) | 2004-11-30 | 2005-11-21 | Interferometric analysis for the manufacture of nano-scale devices |
EP05858633.0A EP1817545B1 (en) | 2004-11-30 | 2005-11-21 | Interferometric analysis for the manufacture of nano-scale devices |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/000,321 | 2004-11-30 | ||
US11/000,331 | 2004-11-30 | ||
US11/000,331 US7292326B2 (en) | 2004-11-30 | 2004-11-30 | Interferometric analysis for the manufacture of nano-scale devices |
US11/000,321 US7630067B2 (en) | 2004-11-30 | 2004-11-30 | Interferometric analysis method for the manufacture of nano-scale devices |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2007046820A2 WO2007046820A2 (en) | 2007-04-26 |
WO2007046820A3 true WO2007046820A3 (en) | 2007-10-18 |
Family
ID=36583394
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2005/042638 WO2007046820A2 (en) | 2004-11-30 | 2005-11-21 | Interferometric analysis for the manufacture of nano-scale devices |
Country Status (5)
Country | Link |
---|---|
US (1) | US7292326B2 (en) |
EP (1) | EP1817545B1 (en) |
KR (1) | KR101299473B1 (en) |
CN (1) | CN101115971B (en) |
WO (1) | WO2007046820A2 (en) |
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US7630067B2 (en) * | 2004-11-30 | 2009-12-08 | Molecular Imprints, Inc. | Interferometric analysis method for the manufacture of nano-scale devices |
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JP5576822B2 (en) * | 2011-03-25 | 2014-08-20 | 富士フイルム株式会社 | Method for removing foreign matter adhering to the mold |
JP5713961B2 (en) | 2011-06-21 | 2015-05-07 | キヤノン株式会社 | Position detection apparatus, imprint apparatus, and position detection method |
JP5706861B2 (en) | 2011-10-21 | 2015-04-22 | キヤノン株式会社 | Detector, detection method, imprint apparatus, and article manufacturing method |
JP5943717B2 (en) * | 2012-06-05 | 2016-07-05 | キヤノン株式会社 | Position detection system, imprint apparatus, device manufacturing method, and position detection method |
JP6188382B2 (en) * | 2013-04-03 | 2017-08-30 | キヤノン株式会社 | Imprint apparatus and article manufacturing method |
JP6341883B2 (en) | 2014-06-27 | 2018-06-13 | キヤノン株式会社 | Position detection apparatus, position detection method, imprint apparatus, and article manufacturing method |
US10747106B2 (en) * | 2014-12-09 | 2020-08-18 | Canon Kabushiki Kaisha | Imprint apparatus |
US10495989B2 (en) | 2015-02-12 | 2019-12-03 | Canon Kabushiki Kaisha | Imprint apparatus and method of manufacturing article |
JP6726987B2 (en) * | 2016-03-17 | 2020-07-22 | キヤノン株式会社 | Imprint apparatus and article manufacturing method |
JP6685821B2 (en) * | 2016-04-25 | 2020-04-22 | キヤノン株式会社 | Measuring apparatus, imprint apparatus, article manufacturing method, light quantity determination method, and light quantity adjustment method |
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US7292326B2 (en) | 2007-11-06 |
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EP1817545B1 (en) | 2017-08-09 |
CN101115971B (en) | 2013-05-08 |
KR101299473B1 (en) | 2013-08-29 |
US20060126058A1 (en) | 2006-06-15 |
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CN101115971A (en) | 2008-01-30 |
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