WO2008028160A3 - Substrates, systems and methods for analyzing materials - Google Patents

Substrates, systems and methods for analyzing materials Download PDF

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Publication number
WO2008028160A3
WO2008028160A3 PCT/US2007/077454 US2007077454W WO2008028160A3 WO 2008028160 A3 WO2008028160 A3 WO 2008028160A3 US 2007077454 W US2007077454 W US 2007077454W WO 2008028160 A3 WO2008028160 A3 WO 2008028160A3
Authority
WO
WIPO (PCT)
Prior art keywords
substrates
systems
methods
materials
analyses
Prior art date
Application number
PCT/US2007/077454
Other languages
French (fr)
Other versions
WO2008028160A2 (en
Inventor
Paul Lundquist
Stephen Turner
Original Assignee
Pacific Biosciences California
Paul Lundquist
Stephen Turner
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pacific Biosciences California, Paul Lundquist, Stephen Turner filed Critical Pacific Biosciences California
Priority to AU2007289057A priority Critical patent/AU2007289057C1/en
Priority to CA2662521A priority patent/CA2662521C/en
Priority to EP21190541.9A priority patent/EP3936857B1/en
Priority to EP23151617.0A priority patent/EP4220138A1/en
Priority to EP07814642.0A priority patent/EP2064488B1/en
Priority to US11/981,796 priority patent/US7838847B2/en
Priority to US11/981,795 priority patent/US7834329B2/en
Publication of WO2008028160A2 publication Critical patent/WO2008028160A2/en
Publication of WO2008028160A3 publication Critical patent/WO2008028160A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6452—Individual samples arranged in a regular 2D-array, e.g. multiwell plates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/7703—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24—Coupling light guides
    • G02B6/42—Coupling light guides with opto-electronic elements
    • G02B6/43—Arrangements comprising a plurality of opto-electronic elements and associated optical interconnections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7769—Measurement method of reaction-produced change in sensor
    • G01N2021/7786—Fluorescence

Abstract

Substrates, systems and methods for analyzing materials that include waveguide arrays disposed upon or within the substrate such that evanescent fields emanating from the waveguides illuminate materials disposed upon or proximal to the surface of the substrate, permitting analysis of such materials. The substrates, systems and methods are used in a variety of analytical operations, including, inter alia, nucleic acid analysis, including hybridization and sequencing analyses, cellular analyses and other molecular analyses.
PCT/US2007/077454 2006-09-01 2007-08-31 Substrates, systems and methods for analyzing materials WO2008028160A2 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
AU2007289057A AU2007289057C1 (en) 2006-09-01 2007-08-31 Substrates, systems and methods for analyzing materials
CA2662521A CA2662521C (en) 2006-09-01 2007-08-31 Substrates, systems and methods for analyzing materials
EP21190541.9A EP3936857B1 (en) 2006-09-01 2007-08-31 Substrates, systems and methods for analyzing materials
EP23151617.0A EP4220138A1 (en) 2006-09-01 2007-08-31 Substrates, systems and methods for analyzing materials
EP07814642.0A EP2064488B1 (en) 2006-09-01 2007-08-31 Device and method for analyzing materials
US11/981,796 US7838847B2 (en) 2006-09-01 2007-10-31 Substrates, systems and methods for analyzing materials
US11/981,795 US7834329B2 (en) 2006-09-01 2007-10-31 Substrates, systems and methods for analyzing materials

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US84189706P 2006-09-01 2006-09-01
US60/841,897 2006-09-01

Publications (2)

Publication Number Publication Date
WO2008028160A2 WO2008028160A2 (en) 2008-03-06
WO2008028160A3 true WO2008028160A3 (en) 2008-11-06

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/077454 WO2008028160A2 (en) 2006-09-01 2007-08-31 Substrates, systems and methods for analyzing materials

Country Status (5)

Country Link
US (4) US7820983B2 (en)
EP (3) EP2064488B1 (en)
AU (1) AU2007289057C1 (en)
CA (1) CA2662521C (en)
WO (1) WO2008028160A2 (en)

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