WO2009045091A3 - A vertical thin polysilicon substrate isfet - Google Patents

A vertical thin polysilicon substrate isfet Download PDF

Info

Publication number
WO2009045091A3
WO2009045091A3 PCT/MY2008/000116 MY2008000116W WO2009045091A3 WO 2009045091 A3 WO2009045091 A3 WO 2009045091A3 MY 2008000116 W MY2008000116 W MY 2008000116W WO 2009045091 A3 WO2009045091 A3 WO 2009045091A3
Authority
WO
WIPO (PCT)
Prior art keywords
isfet
polysilicon
thin polysilicon
substrate
vertical
Prior art date
Application number
PCT/MY2008/000116
Other languages
French (fr)
Other versions
WO2009045091A2 (en
Inventor
Mohd Ismahadi Syono
Rani Rozina Abdul
Original Assignee
Mimos Berhad
Mohd Ismahadi Syono
Rani Rozina Abdul
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mimos Berhad, Mohd Ismahadi Syono, Rani Rozina Abdul filed Critical Mimos Berhad
Publication of WO2009045091A2 publication Critical patent/WO2009045091A2/en
Publication of WO2009045091A3 publication Critical patent/WO2009045091A3/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/403Cells and electrode assemblies
    • G01N27/414Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
    • G01N27/4148Integrated circuits therefor, e.g. fabricated by CMOS processing

Abstract

The present invention generally relates to a vertical thin polysilicon substrate ISFET for the measurement of hydrogen ions (pH) and other ion activity in solution characterized in that wherein the present invention comprises of a method of making polysilicon vertical ISFET which is fully CMOS compatible and wherein the substrate is the polysilicon which is vertically sandwiched between a source and a drain and wherein a very high drive current is possible to achieve due to the thin polysilicon material and wherein the sandwiched structure is designed to ensure excellent noise isolation and wherein the gate lies on the same surface level as the drain and hence a very large area for better gate sensitivity is possible.
PCT/MY2008/000116 2007-10-05 2008-09-29 A vertical thin polysilicon substrate isfet WO2009045091A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
MYPI20071721 2007-10-05
MYPI20071721 2007-10-05

Publications (2)

Publication Number Publication Date
WO2009045091A2 WO2009045091A2 (en) 2009-04-09
WO2009045091A3 true WO2009045091A3 (en) 2009-06-04

Family

ID=40526855

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/MY2008/000116 WO2009045091A2 (en) 2007-10-05 2008-09-29 A vertical thin polysilicon substrate isfet

Country Status (1)

Country Link
WO (1) WO2009045091A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014098566A1 (en) * 2012-12-21 2014-06-26 Mimos Berhad An ion sensitive field effect transistor
CN107064255B (en) * 2017-05-24 2019-04-30 江苏大学 A kind of combination electrode formula pH sensor and preparation method thereof based on CMOS technology

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4534825A (en) * 1980-03-10 1985-08-13 Cordis Europa, N.V. Method of making an electrochemical sensing cell
JPS63235853A (en) * 1987-03-24 1988-09-30 Shindengen Electric Mfg Co Ltd Semiconductor ion sensor
US5393401A (en) * 1991-05-10 1995-02-28 Knoll; Meinhard Method of manufacturing miniaturized components of chemical and biological detection sensors that employ ion-selective membranes, and supports for such components
US5918110A (en) * 1996-05-31 1999-06-29 Siemens Aktiengesellschaft Method for manufacturing a combination of a pressure sensor and an electrochemical sensor
US7211459B2 (en) * 2003-05-09 2007-05-01 Au Optronics Corp. Fabrication method of an ion sensitive field effect transistor

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4534825A (en) * 1980-03-10 1985-08-13 Cordis Europa, N.V. Method of making an electrochemical sensing cell
JPS63235853A (en) * 1987-03-24 1988-09-30 Shindengen Electric Mfg Co Ltd Semiconductor ion sensor
US5393401A (en) * 1991-05-10 1995-02-28 Knoll; Meinhard Method of manufacturing miniaturized components of chemical and biological detection sensors that employ ion-selective membranes, and supports for such components
US5918110A (en) * 1996-05-31 1999-06-29 Siemens Aktiengesellschaft Method for manufacturing a combination of a pressure sensor and an electrochemical sensor
US7211459B2 (en) * 2003-05-09 2007-05-01 Au Optronics Corp. Fabrication method of an ion sensitive field effect transistor

Also Published As

Publication number Publication date
WO2009045091A2 (en) 2009-04-09

Similar Documents

Publication Publication Date Title
TW200644237A (en) High-voltage MOS device
SG169949A1 (en) Method of determining a sensitivity of a biosensor arrangement, and biosensor sensitivity determining system
TW200705674A (en) Thin film transistor and manufacturing method thereof
TW200633220A (en) Lateral double-diffused MOS transistor and manufacturing method therefor
TW200636919A (en) A manufacturing method for a recessed channel array transistor and corresponding recessed channel array transistor
TW200603342A (en) Technique for creating different mechanical stress in different channel regions by forming an etch stop layer having differently modified intrinsic stress
TW200633125A (en) Semiconductor device and method of semiconductor device
TW200731415A (en) Methods for forming a semiconductor device
TW200707737A (en) Field effect transistor, biosensor provided with it, and detecting method
TW200743217A (en) Liquid crystal display device and fabricating method thereof
TW200703570A (en) Semionductor device having cell transistor with recess channel structure and method of manufacturing the same
WO2011071598A3 (en) Quantum-well-based semiconductor devices
TW200715562A (en) Thin film transistor substrate and fabrication thereof
TW200729393A (en) Method for fabricating semiconductor device
EP2036130A4 (en) N-channel mosfets comprising dual stressors, and methods for forming the same
EP1557884A3 (en) Examination apparatus for biological sample and chemical sample
JP2008103609A5 (en)
TW200719442A (en) Low hydrogen concentration charge-trapping layer structures for non-volatile memory and methods of forming the same
TW200707554A (en) Offset spacers for CMOS transistors
TW200802704A (en) Method of fabricating a precision buried resistor
TW200709340A (en) Semiconductor apparatus
WO2007072405A3 (en) Semiconductor device with recessed field plate and method of manufacturing the same
TW200731509A (en) Semiconductor device and manufacturing method thereof
WO2012099446A3 (en) Transparent ion sensor chip using a field-effect-transistor-type signal converter in which an extended gate electrode is formed, and method for manufacturing the sensor chip
TW200735378A (en) Split gate memory cell and method for fabricating the same

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 08835719

Country of ref document: EP

Kind code of ref document: A2

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 08835719

Country of ref document: EP

Kind code of ref document: A2