WO2009071035A3 - Method of sample preparation for atomic spectrometric techniques - Google Patents

Method of sample preparation for atomic spectrometric techniques Download PDF

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Publication number
WO2009071035A3
WO2009071035A3 PCT/CZ2008/000142 CZ2008000142W WO2009071035A3 WO 2009071035 A3 WO2009071035 A3 WO 2009071035A3 CZ 2008000142 W CZ2008000142 W CZ 2008000142W WO 2009071035 A3 WO2009071035 A3 WO 2009071035A3
Authority
WO
WIPO (PCT)
Prior art keywords
sample preparation
spectrometric techniques
sample
desorption
pulses
Prior art date
Application number
PCT/CZ2008/000142
Other languages
French (fr)
Other versions
WO2009071035A2 (en
Inventor
Jan Preisler
Viktor Kanicky
Tomas Vaculovic
Pavla Foltynova
Ondrej Pes
Original Assignee
Univ Masarykova
Jan Preisler
Viktor Kanicky
Tomas Vaculovic
Pavla Foltynova
Ondrej Pes
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Masarykova, Jan Preisler, Viktor Kanicky, Tomas Vaculovic, Pavla Foltynova, Ondrej Pes filed Critical Univ Masarykova
Publication of WO2009071035A2 publication Critical patent/WO2009071035A2/en
Publication of WO2009071035A3 publication Critical patent/WO2009071035A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/3103—Atomic absorption analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6402—Atomic fluorescence; Laser induced fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]

Abstract

The application relates to a method of sample preparation for atomic spectrometric techniques, wherein a liquid analyte or analyte solution, emulsion or suspension is applied onto a solid substrate and is subsequently- sampled by desorption pulses, which may be pulses of laser radiation or discharge. The sample can be further protected against sweeping away by the application of holding means onto the substrate. Also, an array of samples can be applied, which allows the desorption of more than one sample at a time.
PCT/CZ2008/000142 2007-12-03 2008-11-27 Method of sample preparation for atomic spectrometric techniques WO2009071035A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CZ2007-847A CZ304648B6 (en) 2007-12-03 2007-12-03 Method of preparing samples for atomic spectrometric techniques
CZPV2007-847 2007-12-03

Publications (2)

Publication Number Publication Date
WO2009071035A2 WO2009071035A2 (en) 2009-06-11
WO2009071035A3 true WO2009071035A3 (en) 2009-07-23

Family

ID=40578771

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CZ2008/000142 WO2009071035A2 (en) 2007-12-03 2008-11-27 Method of sample preparation for atomic spectrometric techniques

Country Status (2)

Country Link
CZ (1) CZ304648B6 (en)
WO (1) WO2009071035A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104316499A (en) * 2014-08-11 2015-01-28 广西大学 A method of indirectly measuring gold in seawater by adoption of an atomic fluorescence spectrophotometer

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020150236A1 (en) * 2019-01-15 2020-07-23 Fluidigm Canada Inc. Direct ionization in imaging mass spectrometry

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4220414A (en) * 1976-05-06 1980-09-02 Barringer Research Limited Laser spectrochemical analysis
US6002478A (en) * 1998-03-20 1999-12-14 Transgenomic Inc. System and method of determining trace elements in high viscosity liquids, and powders, utilizing laser-ablation
US6248592B1 (en) * 1995-03-27 2001-06-19 The Regents Of The University Of California Method for measuring lead concentrations in blood
US6287872B1 (en) * 1997-12-11 2001-09-11 Bruker Daltonik Gmbh Sample support plates for Maldi mass spectrometry including methods for manufacture of plates and application of sample
WO2004072616A2 (en) * 2003-02-10 2004-08-26 Waters Investments Limited A sample preparation plate for mass spectrometry
WO2005070089A2 (en) * 2004-01-13 2005-08-04 Waters Investments Limited Substrate adapter for use in mass spectroscopy analysis
WO2006118595A2 (en) * 2004-09-17 2006-11-09 Nanosys, Inc. Nanostructured thin films and their uses

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6825463B2 (en) * 1997-05-23 2004-11-30 Northeastern University On-line and off-line deposition of liquid samples for matrix assisted laser desorption ionization-time of flight (MALDI-TOF) mass spectroscopy
US7087898B2 (en) * 2000-06-09 2006-08-08 Willoughby Ross C Laser desorption ion source
DE10112386B4 (en) * 2001-03-15 2007-08-02 Bruker Daltonik Gmbh Time-of-flight mass spectrometer with multiplex operation
CA2527886C (en) * 2003-06-07 2014-01-14 Ross C. Willoughby Laser desorption ion source
US20070046934A1 (en) * 2005-08-26 2007-03-01 New Wave Research, Inc. Multi-function laser induced breakdown spectroscopy and laser ablation material analysis system and method

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4220414A (en) * 1976-05-06 1980-09-02 Barringer Research Limited Laser spectrochemical analysis
US6248592B1 (en) * 1995-03-27 2001-06-19 The Regents Of The University Of California Method for measuring lead concentrations in blood
US6287872B1 (en) * 1997-12-11 2001-09-11 Bruker Daltonik Gmbh Sample support plates for Maldi mass spectrometry including methods for manufacture of plates and application of sample
US6002478A (en) * 1998-03-20 1999-12-14 Transgenomic Inc. System and method of determining trace elements in high viscosity liquids, and powders, utilizing laser-ablation
WO2004072616A2 (en) * 2003-02-10 2004-08-26 Waters Investments Limited A sample preparation plate for mass spectrometry
WO2005070089A2 (en) * 2004-01-13 2005-08-04 Waters Investments Limited Substrate adapter for use in mass spectroscopy analysis
WO2006118595A2 (en) * 2004-09-17 2006-11-09 Nanosys, Inc. Nanostructured thin films and their uses

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
F. FORET ET AL.: "Liquid phase interfacing and miniaturization in matrix-assisted laser desorption/ionization mass spectrometry", PROTEOMICS, vol. 2, no. 4, April 2002 (2002-04-01), pages 360 - 372, XP002526844 *
WAL VANDER R L ET AL: "TRACE METAL DETECTION BY LASER-INDUCED BREAKDOWN SPECTROSCOPY", APPLIED SPECTROSCOPY, THE SOCIETY FOR APPLIED SPECTROSCOPY. BALTIMORE, US, vol. 53, no. 10, 1 October 1999 (1999-10-01), pages 1226 - 1236, XP000903119, ISSN: 0003-7028 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104316499A (en) * 2014-08-11 2015-01-28 广西大学 A method of indirectly measuring gold in seawater by adoption of an atomic fluorescence spectrophotometer

Also Published As

Publication number Publication date
WO2009071035A2 (en) 2009-06-11
CZ2007847A3 (en) 2009-06-17
CZ304648B6 (en) 2014-08-20

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