WO2010096707A3 - Microelectronic contactor assembly, structures thereof, and methods of constructing same - Google Patents

Microelectronic contactor assembly, structures thereof, and methods of constructing same Download PDF

Info

Publication number
WO2010096707A3
WO2010096707A3 PCT/US2010/024807 US2010024807W WO2010096707A3 WO 2010096707 A3 WO2010096707 A3 WO 2010096707A3 US 2010024807 W US2010024807 W US 2010024807W WO 2010096707 A3 WO2010096707 A3 WO 2010096707A3
Authority
WO
WIPO (PCT)
Prior art keywords
structures
methods
contactor assembly
inserts
probe head
Prior art date
Application number
PCT/US2010/024807
Other languages
French (fr)
Other versions
WO2010096707A2 (en
Inventor
Yohannes Desta
Chang Huang
Lakshmikanth Namburi
Matthew Losey
Original Assignee
Touchdown Technologies, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Touchdown Technologies, Inc. filed Critical Touchdown Technologies, Inc.
Publication of WO2010096707A2 publication Critical patent/WO2010096707A2/en
Publication of WO2010096707A3 publication Critical patent/WO2010096707A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Abstract

A plurality of inserts are anchored in holes or recesses in a probe head. Shafts are coupled to the inserts, and adjustable multi-part fasteners are attached to the shafts and to a stiffener. The multi-part fasteners are operated to move the shafts and couple the probe head, the stiffener, and other components of a microelectronic contactor assembly. In some embodiments, the inserts may be anchored in the probe head using an adhesive. In some embodiments, the probe head may comprise more than one major substrate, and the inserts may be anchored in either of the substrates.
PCT/US2010/024807 2009-02-19 2010-02-19 Microelectronic contactor assembly, structures thereof, and methods of constructing same WO2010096707A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15373109P 2009-02-19 2009-02-19
US61/153,731 2009-02-19

Publications (2)

Publication Number Publication Date
WO2010096707A2 WO2010096707A2 (en) 2010-08-26
WO2010096707A3 true WO2010096707A3 (en) 2010-11-18

Family

ID=42634479

Family Applications (3)

Application Number Title Priority Date Filing Date
PCT/US2010/024813 WO2010096711A2 (en) 2009-02-19 2010-02-19 Probe head for a microelectronic contactor assembly, and methods of making same
PCT/US2010/024817 WO2010096714A2 (en) 2009-02-19 2010-02-19 Probe head for a microelectronic contactor assembly, the probe head having smt electronic components thereon
PCT/US2010/024807 WO2010096707A2 (en) 2009-02-19 2010-02-19 Microelectronic contactor assembly, structures thereof, and methods of constructing same

Family Applications Before (2)

Application Number Title Priority Date Filing Date
PCT/US2010/024813 WO2010096711A2 (en) 2009-02-19 2010-02-19 Probe head for a microelectronic contactor assembly, and methods of making same
PCT/US2010/024817 WO2010096714A2 (en) 2009-02-19 2010-02-19 Probe head for a microelectronic contactor assembly, the probe head having smt electronic components thereon

Country Status (3)

Country Link
US (3) US8901950B2 (en)
TW (3) TWI512298B (en)
WO (3) WO2010096711A2 (en)

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JP6745197B2 (en) * 2016-11-04 2020-08-26 浜松ホトニクス株式会社 Ultrasonic inspection apparatus and ultrasonic inspection method
US10663486B2 (en) 2017-02-06 2020-05-26 International Business Machines Corporation Portable electrical noise probe structure
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Also Published As

Publication number Publication date
TW201040538A (en) 2010-11-16
TWI512298B (en) 2015-12-11
US20100237887A1 (en) 2010-09-23
TW201111799A (en) 2011-04-01
US20100237888A1 (en) 2010-09-23
US20100237889A1 (en) 2010-09-23
TW201037320A (en) 2010-10-16
WO2010096714A3 (en) 2011-01-27
US8901950B2 (en) 2014-12-02
WO2010096711A3 (en) 2011-01-20
WO2010096707A2 (en) 2010-08-26
US8305101B2 (en) 2012-11-06
WO2010096714A2 (en) 2010-08-26
US8232818B2 (en) 2012-07-31
TWI491885B (en) 2015-07-11
TWI522622B (en) 2016-02-21
WO2010096711A2 (en) 2010-08-26

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