WO2011007168A3 - Microspectroscopy apparatus and method - Google Patents

Microspectroscopy apparatus and method Download PDF

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Publication number
WO2011007168A3
WO2011007168A3 PCT/GB2010/051148 GB2010051148W WO2011007168A3 WO 2011007168 A3 WO2011007168 A3 WO 2011007168A3 GB 2010051148 W GB2010051148 W GB 2010051148W WO 2011007168 A3 WO2011007168 A3 WO 2011007168A3
Authority
WO
WIPO (PCT)
Prior art keywords
sample
probe
light source
infra
scanned
Prior art date
Application number
PCT/GB2010/051148
Other languages
French (fr)
Other versions
WO2011007168A2 (en
Inventor
Graham Reading
Hubert Murray Montagu-Pollock
John Wood
Original Assignee
Voak, Graham
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB0912102A external-priority patent/GB0912102D0/en
Priority claimed from GBGB1001160.9A external-priority patent/GB201001160D0/en
Application filed by Voak, Graham filed Critical Voak, Graham
Publication of WO2011007168A2 publication Critical patent/WO2011007168A2/en
Publication of WO2011007168A3 publication Critical patent/WO2011007168A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope

Abstract

Scanned probe near-field infra-red micro-spectroscopy apparatus comprising: a probe operable to be scanned over a surface of a sample; and at least one semiconductor light source arranged to illuminate the substrate thereby to heat the sample by absorption of infra-red radiation, the apparatus being arranged to be responsive by means of the probe to thermal expansion of the sample due to a temperature rise of the sample induced by illumination of the sample by the light source thereby to obtain micro-spectroscopy data in respect of the sample.
PCT/GB2010/051148 2009-07-13 2010-07-13 Microspectroscopy apparatus and method WO2011007168A2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
GB0912102A GB0912102D0 (en) 2009-07-13 2009-07-13 Microspectroscopy apparatus and method
GB0912102.1 2009-07-13
GBGB1001160.9A GB201001160D0 (en) 2010-01-25 2010-01-25 Improved scanned probe microscope
GB1001160.9 2010-01-25

Publications (2)

Publication Number Publication Date
WO2011007168A2 WO2011007168A2 (en) 2011-01-20
WO2011007168A3 true WO2011007168A3 (en) 2011-04-14

Family

ID=43449898

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/GB2010/051148 WO2011007168A2 (en) 2009-07-13 2010-07-13 Microspectroscopy apparatus and method

Country Status (1)

Country Link
WO (1) WO2011007168A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8780347B2 (en) * 2010-06-11 2014-07-15 Block Engineering, Llc QCL spectroscopy system and applications therefor
US9012849B2 (en) * 2012-07-10 2015-04-21 Massachusetts Institute Of Technology Direct and quantitative broadband absorptance spectroscopy with multilayer cantilever probes

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6260997B1 (en) * 1997-10-28 2001-07-17 Michael Claybourn Method and apparatus for high spatial resolution spectroscopic microscopy
US20060262316A1 (en) * 2005-05-20 2006-11-23 Baney Douglas M System and method for interferometric laser photoacoustic spectroscopy
US20080283755A1 (en) * 2007-05-15 2008-11-20 Dazzi A Dazzi High frequency deflection measurement of IR absorption

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8402819B2 (en) 2007-05-15 2013-03-26 Anasys Instruments, Inc. High frequency deflection measurement of IR absorption

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6260997B1 (en) * 1997-10-28 2001-07-17 Michael Claybourn Method and apparatus for high spatial resolution spectroscopic microscopy
US20060262316A1 (en) * 2005-05-20 2006-11-23 Baney Douglas M System and method for interferometric laser photoacoustic spectroscopy
US20080283755A1 (en) * 2007-05-15 2008-11-20 Dazzi A Dazzi High frequency deflection measurement of IR absorption

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
HAMMICHE A ET AL: "PHOTOTHERMAL FT-IR SPECTROSCOPY: A STEP TOWARDS FT-IR MICROSCOPY AT A RESOLUTION BETTER THAN THE DIFFRACTION LIMIT", APPLIED SPECTROSCOPY, THE SOCIETY FOR APPLIED SPECTROSCOPY. BALTIMORE, US, vol. 53, no. 7, 1 July 1999 (1999-07-01), pages 810 - 815, XP000835468, ISSN: 0003-7028, DOI: DOI:10.1366/0003702991947379 *

Also Published As

Publication number Publication date
WO2011007168A2 (en) 2011-01-20

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