WO2011008762A3 - Storage device testing system cooling - Google Patents
Storage device testing system cooling Download PDFInfo
- Publication number
- WO2011008762A3 WO2011008762A3 PCT/US2010/041831 US2010041831W WO2011008762A3 WO 2011008762 A3 WO2011008762 A3 WO 2011008762A3 US 2010041831 W US2010041831 W US 2010041831W WO 2011008762 A3 WO2011008762 A3 WO 2011008762A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- storage device
- testing system
- device testing
- system cooling
- body portion
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
- G11B20/10—Digital recording or reproducing
- G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B33/00—Constructional parts, details or accessories not provided for in the other groups of this subclass
- G11B33/12—Disposition of constructional parts in the apparatus, e.g. of power supply, of modules
- G11B33/125—Disposition of constructional parts in the apparatus, e.g. of power supply, of modules the apparatus comprising a plurality of recording/reproducing devices, e.g. modular arrangements, arrays of disc drives
- G11B33/127—Mounting arrangements of constructional parts onto a chassis
- G11B33/128—Mounting arrangements of constructional parts onto a chassis of the plurality of recording/reproducing devices, e.g. disk drives, onto a chassis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B33/00—Constructional parts, details or accessories not provided for in the other groups of this subclass
- G11B33/14—Reducing influence of physical parameters, e.g. temperature change, moisture, dust
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B33/00—Constructional parts, details or accessories not provided for in the other groups of this subclass
- G11B33/14—Reducing influence of physical parameters, e.g. temperature change, moisture, dust
- G11B33/1406—Reducing the influence of the temperature
- G11B33/1413—Reducing the influence of the temperature by fluid cooling
- G11B33/142—Reducing the influence of the temperature by fluid cooling by air cooling
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201080031734.6A CN102473438B (en) | 2009-07-15 | 2010-07-13 | Storage device testing system cooling |
JP2012520720A JP2012533833A (en) | 2009-07-15 | 2010-07-13 | Storage device test system cooling |
MYPI2011005388A MY184062A (en) | 2009-07-15 | 2010-07-13 | Storage device testing system cooling |
SG2011092517A SG176842A1 (en) | 2009-07-15 | 2010-07-13 | Storage device testing system cooling |
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/503,567 | 2009-07-15 | ||
US12/503,567 US7920380B2 (en) | 2009-07-15 | 2009-07-15 | Test slot cooling system for a storage device testing system |
US12/698,575 US8687356B2 (en) | 2010-02-02 | 2010-02-02 | Storage device testing system cooling |
US12/698,575 | 2010-02-02 | ||
US12/815,140 US8116079B2 (en) | 2009-07-15 | 2010-06-14 | Storage device testing system cooling |
US12/815,140 | 2010-06-14 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2011008762A2 WO2011008762A2 (en) | 2011-01-20 |
WO2011008762A3 true WO2011008762A3 (en) | 2011-04-28 |
Family
ID=43450135
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2010/041831 WO2011008762A2 (en) | 2009-07-15 | 2010-07-13 | Storage device testing system cooling |
Country Status (7)
Country | Link |
---|---|
US (1) | US8116079B2 (en) |
JP (1) | JP2012533833A (en) |
KR (1) | KR20120039018A (en) |
CN (2) | CN104112465A (en) |
MY (3) | MY153995A (en) |
SG (1) | SG176842A1 (en) |
WO (1) | WO2011008762A2 (en) |
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US9898056B2 (en) | 2013-06-19 | 2018-02-20 | Sandisk Technologies Llc | Electronic assembly with thermal channel and method of manufacture thereof |
US9497889B2 (en) | 2014-02-27 | 2016-11-15 | Sandisk Technologies Llc | Heat dissipation for substrate assemblies |
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US10948534B2 (en) | 2017-08-28 | 2021-03-16 | Teradyne, Inc. | Automated test system employing robotics |
US11226390B2 (en) | 2017-08-28 | 2022-01-18 | Teradyne, Inc. | Calibration process for an automated test system |
US10725091B2 (en) | 2017-08-28 | 2020-07-28 | Teradyne, Inc. | Automated test system having multiple stages |
US10845410B2 (en) | 2017-08-28 | 2020-11-24 | Teradyne, Inc. | Automated test system having orthogonal robots |
US10368467B2 (en) | 2017-10-10 | 2019-07-30 | Facebook, Inc. | System and method for data center heat containment |
US10983145B2 (en) | 2018-04-24 | 2021-04-20 | Teradyne, Inc. | System for testing devices inside of carriers |
US11105847B1 (en) * | 2018-06-18 | 2021-08-31 | Seagate Technology Llc | Data storage component test socket opener |
US10775408B2 (en) | 2018-08-20 | 2020-09-15 | Teradyne, Inc. | System for testing devices inside of carriers |
US11353375B2 (en) | 2019-06-28 | 2022-06-07 | Teradyne, Inc. | Using vibrations to position devices in a test system |
CN112249627B (en) * | 2020-10-10 | 2022-08-23 | 北京特种机械研究所 | Air floatation system and real-time attitude leveling method thereof |
US11899042B2 (en) | 2020-10-22 | 2024-02-13 | Teradyne, Inc. | Automated test system |
US11953519B2 (en) | 2020-10-22 | 2024-04-09 | Teradyne, Inc. | Modular automated test system |
US11867749B2 (en) | 2020-10-22 | 2024-01-09 | Teradyne, Inc. | Vision system for an automated test system |
US11754596B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Test site configuration in an automated test system |
US11754622B2 (en) | 2020-10-22 | 2023-09-12 | Teradyne, Inc. | Thermal control system for an automated test system |
US11682426B2 (en) * | 2021-08-13 | 2023-06-20 | Western Digital Technologies, Inc. | Archival data storage library |
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- 2010-07-13 MY MYPI2012001960A patent/MY153995A/en unknown
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- 2010-07-13 WO PCT/US2010/041831 patent/WO2011008762A2/en active Application Filing
- 2010-07-13 CN CN201080031734.6A patent/CN102473438B/en active Active
- 2010-07-13 MY MYPI2011005388A patent/MY184062A/en unknown
- 2010-07-13 MY MYPI2012001961A patent/MY154176A/en unknown
- 2010-07-13 SG SG2011092517A patent/SG176842A1/en unknown
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Also Published As
Publication number | Publication date |
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MY154176A (en) | 2015-05-15 |
SG176842A1 (en) | 2012-01-30 |
JP2012533833A (en) | 2012-12-27 |
WO2011008762A2 (en) | 2011-01-20 |
MY184062A (en) | 2021-03-17 |
MY153995A (en) | 2015-04-30 |
CN102473438B (en) | 2015-04-01 |
US8116079B2 (en) | 2012-02-14 |
CN104112465A (en) | 2014-10-22 |
US20110064546A1 (en) | 2011-03-17 |
KR20120039018A (en) | 2012-04-24 |
CN102473438A (en) | 2012-05-23 |
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