WO2011049764A3 - Leadframe packages having enhanced ground-bond reliability - Google Patents
Leadframe packages having enhanced ground-bond reliability Download PDFInfo
- Publication number
- WO2011049764A3 WO2011049764A3 PCT/US2010/052061 US2010052061W WO2011049764A3 WO 2011049764 A3 WO2011049764 A3 WO 2011049764A3 US 2010052061 W US2010052061 W US 2010052061W WO 2011049764 A3 WO2011049764 A3 WO 2011049764A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- die
- attach pad
- tie bar
- die attach
- bonding
- Prior art date
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- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49503—Lead-frames or other flat leads characterised by the die pad
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Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012535229A JP2013508974A (en) | 2009-10-19 | 2010-10-08 | Leadframe package with improved ground bond reliability |
CN2010800427454A CN102576698A (en) | 2009-10-19 | 2010-10-08 | Leadframe packages having enhanced ground-bond reliability |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/581,609 | 2009-10-19 | ||
US12/581,609 US8093707B2 (en) | 2009-10-19 | 2009-10-19 | Leadframe packages having enhanced ground-bond reliability |
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WO2011049764A2 WO2011049764A2 (en) | 2011-04-28 |
WO2011049764A3 true WO2011049764A3 (en) | 2011-11-17 |
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PCT/US2010/052061 WO2011049764A2 (en) | 2009-10-19 | 2010-10-08 | Leadframe packages having enhanced ground-bond reliability |
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US (1) | US8093707B2 (en) |
JP (1) | JP2013508974A (en) |
CN (1) | CN102576698A (en) |
TW (1) | TWI515855B (en) |
WO (1) | WO2011049764A2 (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20110115063A1 (en) * | 2009-11-18 | 2011-05-19 | Entropic Communications, Inc. | Integrated Circuit Packaging with Split Paddle |
US20110140253A1 (en) * | 2009-12-14 | 2011-06-16 | National Semiconductor Corporation | Dap ground bond enhancement |
US9337240B1 (en) * | 2010-06-18 | 2016-05-10 | Altera Corporation | Integrated circuit package with a universal lead frame |
TWI489607B (en) * | 2010-11-23 | 2015-06-21 | 登豐微電子股份有限公司 | Package structure |
CN102800765A (en) * | 2012-03-21 | 2012-11-28 | 深圳雷曼光电科技股份有限公司 | Light emitting diode (LED) packaging structure and packaging process for same |
US9147656B1 (en) * | 2014-07-11 | 2015-09-29 | Freescale Semicondutor, Inc. | Semiconductor device with improved shielding |
US9922904B2 (en) | 2015-05-26 | 2018-03-20 | Infineon Technologies Ag | Semiconductor device including lead frames with downset |
US10249556B1 (en) * | 2018-03-06 | 2019-04-02 | Nxp B.V. | Lead frame with partially-etched connecting bar |
US20190287918A1 (en) * | 2018-03-13 | 2019-09-19 | Texas Instruments Incorporated | Integrated circuit (ic) packages with shields and methods of producing the same |
CN109192715B (en) * | 2018-09-20 | 2024-03-22 | 江苏长电科技股份有限公司 | Lead frame structure, packaging structure and manufacturing method thereof |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020096766A1 (en) * | 2001-01-24 | 2002-07-25 | Chen Wen Chuan | Package structure of integrated circuits and method for packaging the same |
US20060012035A1 (en) * | 2002-12-10 | 2006-01-19 | Infineon Technologies Ag | Method of packaging integrated circuits, and integrated circuit packages produced by the method |
US20080272479A1 (en) * | 2007-05-03 | 2008-11-06 | Henry Descalzo Bathan | Integrated circuit package system with device cavity |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5328079A (en) | 1993-03-19 | 1994-07-12 | National Semiconductor Corporation | Method of and arrangement for bond wire connecting together certain integrated circuit components |
JP3074264B2 (en) * | 1997-11-17 | 2000-08-07 | 富士通株式会社 | Semiconductor device and its manufacturing method, lead frame and its manufacturing method |
US6072228A (en) * | 1996-10-25 | 2000-06-06 | Micron Technology, Inc. | Multi-part lead frame with dissimilar materials and method of manufacturing |
JP3356680B2 (en) * | 1998-04-10 | 2002-12-16 | 日本電気株式会社 | Lead frame, semiconductor device, and method of manufacturing semiconductor device |
US6398556B1 (en) * | 1998-07-06 | 2002-06-04 | Chi Fai Ho | Inexpensive computer-aided learning methods and apparatus for learners |
JP3062691B1 (en) * | 1999-02-26 | 2000-07-12 | 株式会社三井ハイテック | Semiconductor device |
WO2001009953A1 (en) * | 1999-07-30 | 2001-02-08 | Amkor Technology, Inc. | Lead frame with downset die pad |
KR100359304B1 (en) * | 2000-08-25 | 2002-10-31 | 삼성전자 주식회사 | Lead frame having a side ring pad and semiconductor chip package including the same |
US6424024B1 (en) * | 2001-01-23 | 2002-07-23 | Siliconware Precision Industries Co., Ltd. | Leadframe of quad flat non-leaded package |
US6661083B2 (en) * | 2001-02-27 | 2003-12-09 | Chippac, Inc | Plastic semiconductor package |
TW552689B (en) * | 2001-12-21 | 2003-09-11 | Siliconware Precision Industries Co Ltd | High electrical characteristic and high heat dissipating BGA package and its process |
AU2003218085A1 (en) | 2002-03-12 | 2003-09-29 | Fairchild Semiconductor Corporation | Wafer-level coated copper stud bumps |
US7229906B2 (en) * | 2002-09-19 | 2007-06-12 | Kulicke And Soffa Industries, Inc. | Method and apparatus for forming bumps for semiconductor interconnections using a wire bonding machine |
TWI250632B (en) * | 2003-05-28 | 2006-03-01 | Siliconware Precision Industries Co Ltd | Ground-enhancing semiconductor package and lead frame |
US7049683B1 (en) * | 2003-07-19 | 2006-05-23 | Ns Electronics Bangkok (1993) Ltd. | Semiconductor package including organo-metallic coating formed on surface of leadframe roughened using chemical etchant to prevent separation between leadframe and molding compound |
KR100536898B1 (en) | 2003-09-04 | 2005-12-16 | 삼성전자주식회사 | Wire bonding method of semiconductor device |
US7214606B2 (en) | 2004-03-11 | 2007-05-08 | Asm Technology Singapore Pte Ltd. | Method of fabricating a wire bond with multiple stitch bonds |
US7247937B2 (en) * | 2005-01-06 | 2007-07-24 | Via Technologies, Inc. | Mounting pad structure for wire-bonding type lead frame packages |
JP4252563B2 (en) * | 2005-07-05 | 2009-04-08 | 株式会社ルネサステクノロジ | Semiconductor device |
-
2009
- 2009-10-19 US US12/581,609 patent/US8093707B2/en active Active
-
2010
- 2010-10-08 CN CN2010800427454A patent/CN102576698A/en active Pending
- 2010-10-08 WO PCT/US2010/052061 patent/WO2011049764A2/en active Application Filing
- 2010-10-08 JP JP2012535229A patent/JP2013508974A/en active Pending
- 2010-10-18 TW TW099135404A patent/TWI515855B/en active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020096766A1 (en) * | 2001-01-24 | 2002-07-25 | Chen Wen Chuan | Package structure of integrated circuits and method for packaging the same |
US20060012035A1 (en) * | 2002-12-10 | 2006-01-19 | Infineon Technologies Ag | Method of packaging integrated circuits, and integrated circuit packages produced by the method |
US20080272479A1 (en) * | 2007-05-03 | 2008-11-06 | Henry Descalzo Bathan | Integrated circuit package system with device cavity |
Also Published As
Publication number | Publication date |
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TW201125092A (en) | 2011-07-16 |
US8093707B2 (en) | 2012-01-10 |
WO2011049764A2 (en) | 2011-04-28 |
TWI515855B (en) | 2016-01-01 |
US20110089556A1 (en) | 2011-04-21 |
CN102576698A (en) | 2012-07-11 |
JP2013508974A (en) | 2013-03-07 |
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