WO2011091896A1 - A single photon counting readout chip with negligible dead time - Google Patents
A single photon counting readout chip with negligible dead time Download PDFInfo
- Publication number
- WO2011091896A1 WO2011091896A1 PCT/EP2010/069265 EP2010069265W WO2011091896A1 WO 2011091896 A1 WO2011091896 A1 WO 2011091896A1 EP 2010069265 W EP2010069265 W EP 2010069265W WO 2011091896 A1 WO2011091896 A1 WO 2011091896A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- counter
- pixel
- single photon
- nibble
- photon counting
- Prior art date
Links
- 239000000463 material Substances 0.000 claims abstract description 8
- 239000003990 capacitor Substances 0.000 claims description 16
- 239000000758 substrate Substances 0.000 claims description 15
- 238000013461 design Methods 0.000 claims description 9
- 238000013459 approach Methods 0.000 description 4
- 238000012546 transfer Methods 0.000 description 4
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 235000003642 hunger Nutrition 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 230000008685 targeting Effects 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 238000002050 diffraction method Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 238000012800 visualization Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/243—Modular detectors, e.g. arrays formed from self contained units
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/247—Detector read-out circuitry
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/1446—Devices controlled by radiation in a repetitive configuration
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/32—Transforming X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Power Engineering (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2010344046A AU2010344046B2 (en) | 2010-01-26 | 2010-12-09 | A single photon counting readout chip with negligible dead time |
EP10790759.4A EP2529545B1 (en) | 2010-01-26 | 2010-12-09 | A single photon counting readout chip with negligible dead time |
US13/575,349 US8766198B2 (en) | 2010-01-26 | 2010-12-09 | Single photon counting readout chip with negligible dead time |
JP2012550342A JP5701318B2 (en) | 2010-01-26 | 2010-12-09 | Single photon counting readout circuit that can ignore dead time |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP10151685.4 | 2010-01-26 | ||
EP10151685A EP2348704A1 (en) | 2010-01-26 | 2010-01-26 | A single photon counting readout chip with neglibible dead time |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2011091896A1 true WO2011091896A1 (en) | 2011-08-04 |
Family
ID=42199005
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2010/069265 WO2011091896A1 (en) | 2010-01-26 | 2010-12-09 | A single photon counting readout chip with negligible dead time |
Country Status (5)
Country | Link |
---|---|
US (1) | US8766198B2 (en) |
EP (2) | EP2348704A1 (en) |
JP (1) | JP5701318B2 (en) |
AU (1) | AU2010344046B2 (en) |
WO (1) | WO2011091896A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130343517A1 (en) * | 2012-06-22 | 2013-12-26 | Daniel Gagnon | Apparatus, detector, and method for applying a pixel by pixel bias on demand in energy discriminating computed tomography (ct) imaging |
JP2014216769A (en) * | 2013-04-24 | 2014-11-17 | キヤノン株式会社 | Imaging device, imaging system, and driving method for imaging device |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2490441A1 (en) * | 2011-02-16 | 2012-08-22 | Paul Scherrer Institut | Single photon counting detector system having improved counter architecture |
US8680474B2 (en) * | 2012-03-02 | 2014-03-25 | Luxen Technologies, Inc. | Parallel readout integrated circuit architecture for X-ray image sensor |
EP2871496B1 (en) | 2013-11-12 | 2020-01-01 | Samsung Electronics Co., Ltd | Radiation detector and computed tomography apparatus using the same |
US10084983B2 (en) * | 2014-04-29 | 2018-09-25 | Fermi Research Alliance, Llc | Wafer-scale pixelated detector system |
AU2016264606B2 (en) | 2015-05-19 | 2020-09-03 | Magic Leap, Inc. | Semi-global shutter imager |
US10098595B2 (en) * | 2015-08-06 | 2018-10-16 | Texas Instruments Incorporated | Low power photon counting system |
US10117626B2 (en) * | 2015-09-29 | 2018-11-06 | General Electric Company | Apparatus and method for pile-up correction in photon-counting detector |
CN106092339A (en) * | 2016-06-01 | 2016-11-09 | 南京邮电大学 | A kind of simulation counting circuit for single-photon detector |
EP3658961B1 (en) * | 2017-07-26 | 2022-08-17 | Shenzhen Xpectvision Technology Co., Ltd. | A radiation detector and methods of data output from it |
US10151845B1 (en) | 2017-08-02 | 2018-12-11 | Texas Instruments Incorporated | Configurable analog-to-digital converter and processing for photon counting |
CN108254087B (en) * | 2017-12-28 | 2021-05-21 | 国家电网有限公司 | Single photon detector system and control method |
US20210021916A1 (en) * | 2018-04-02 | 2021-01-21 | Rensselaer Polytechnic Institute | Cross-connect switch architecture |
US10890674B2 (en) | 2019-01-15 | 2021-01-12 | Texas Instruments Incorporated | Dynamic noise shaping in a photon counting system |
Citations (4)
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US5475225A (en) * | 1989-03-17 | 1995-12-12 | Advanced Scientific Concepts Inc. | Autoradiographic digital imager |
US6154165A (en) * | 1998-09-16 | 2000-11-28 | Lucent Technologies Inc. | Variable clock rate, variable bit-depth analog-to-digital converter |
EP1581971A1 (en) | 2003-01-10 | 2005-10-05 | Paul Scherrer Institut | Photon counting imaging device |
EP1924079A2 (en) * | 2006-11-17 | 2008-05-21 | Olympus Corporation | Solid-state imaging apparatus |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5665959A (en) * | 1995-01-13 | 1997-09-09 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Adminstration | Solid-state image sensor with focal-plane digital photon-counting pixel array |
US6121622A (en) * | 1995-07-14 | 2000-09-19 | Yeda Research And Development Co., Ltd. | Imager or particle detector and method of manufacturing the same |
US6362484B1 (en) * | 1995-07-14 | 2002-03-26 | Imec Vzw | Imager or particle or radiation detector and method of manufacturing the same |
GB2318411B (en) * | 1996-10-15 | 1999-03-10 | Simage Oy | Imaging device for imaging radiation |
US6362482B1 (en) * | 1997-09-16 | 2002-03-26 | Advanced Scientific Concepts, Inc. | High data rate smart sensor technology |
GB2332585B (en) * | 1997-12-18 | 2000-09-27 | Simage Oy | Device for imaging radiation |
US6552745B1 (en) * | 1998-04-08 | 2003-04-22 | Agilent Technologies, Inc. | CMOS active pixel with memory for imaging sensors |
US7634061B1 (en) * | 2004-03-26 | 2009-12-15 | Nova R & D, Inc. | High resolution imaging system |
RU2411542C2 (en) * | 2005-04-22 | 2011-02-10 | Конинклейке Филипс Электроникс Н.В. | Digital silicon photomultiplier for tof-pet |
US8395127B1 (en) * | 2005-04-22 | 2013-03-12 | Koninklijke Philips Electronics N.V. | Digital silicon photomultiplier for TOF PET |
CN101501527A (en) * | 2006-08-14 | 2009-08-05 | 皇家飞利浦电子股份有限公司 | Radiation detector with counting electronics |
US7829860B2 (en) * | 2006-10-31 | 2010-11-09 | Dxray, Inc. | Photon counting imaging detector system |
EP2045816A1 (en) * | 2007-10-01 | 2009-04-08 | Paul Scherrer Institut | Fast readout method and swiched capacitor array circuitry for waveform digitizing |
JP5521721B2 (en) * | 2009-08-28 | 2014-06-18 | ソニー株式会社 | Image sensor and camera system |
-
2010
- 2010-01-26 EP EP10151685A patent/EP2348704A1/en not_active Withdrawn
- 2010-12-09 EP EP10790759.4A patent/EP2529545B1/en not_active Not-in-force
- 2010-12-09 US US13/575,349 patent/US8766198B2/en active Active
- 2010-12-09 JP JP2012550342A patent/JP5701318B2/en not_active Expired - Fee Related
- 2010-12-09 AU AU2010344046A patent/AU2010344046B2/en not_active Ceased
- 2010-12-09 WO PCT/EP2010/069265 patent/WO2011091896A1/en active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5475225A (en) * | 1989-03-17 | 1995-12-12 | Advanced Scientific Concepts Inc. | Autoradiographic digital imager |
US6154165A (en) * | 1998-09-16 | 2000-11-28 | Lucent Technologies Inc. | Variable clock rate, variable bit-depth analog-to-digital converter |
EP1581971A1 (en) | 2003-01-10 | 2005-10-05 | Paul Scherrer Institut | Photon counting imaging device |
EP1924079A2 (en) * | 2006-11-17 | 2008-05-21 | Olympus Corporation | Solid-state imaging apparatus |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130343517A1 (en) * | 2012-06-22 | 2013-12-26 | Daniel Gagnon | Apparatus, detector, and method for applying a pixel by pixel bias on demand in energy discriminating computed tomography (ct) imaging |
US9101273B2 (en) * | 2012-06-22 | 2015-08-11 | Kabushiki Kaisha Toshiba | Apparatus, detector, and method for applying a pixel by pixel bias on demand in energy discriminating computed tomography (CT) imaging |
JP2014216769A (en) * | 2013-04-24 | 2014-11-17 | キヤノン株式会社 | Imaging device, imaging system, and driving method for imaging device |
Also Published As
Publication number | Publication date |
---|---|
JP2013518489A (en) | 2013-05-20 |
US20120298877A1 (en) | 2012-11-29 |
JP5701318B2 (en) | 2015-04-15 |
US8766198B2 (en) | 2014-07-01 |
AU2010344046A1 (en) | 2012-07-12 |
EP2529545B1 (en) | 2019-05-08 |
AU2010344046B2 (en) | 2015-03-12 |
EP2348704A1 (en) | 2011-07-27 |
EP2529545A1 (en) | 2012-12-05 |
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