WO2012075303A3 - A system and method for analyzing an electronics device including a logic analyzer - Google Patents

A system and method for analyzing an electronics device including a logic analyzer Download PDF

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Publication number
WO2012075303A3
WO2012075303A3 PCT/US2011/062910 US2011062910W WO2012075303A3 WO 2012075303 A3 WO2012075303 A3 WO 2012075303A3 US 2011062910 W US2011062910 W US 2011062910W WO 2012075303 A3 WO2012075303 A3 WO 2012075303A3
Authority
WO
WIPO (PCT)
Prior art keywords
logic analyzer
under test
computing device
device under
embedded logic
Prior art date
Application number
PCT/US2011/062910
Other languages
French (fr)
Other versions
WO2012075303A2 (en
Inventor
James Ray Bailey
Christopher W. Case
Michael Anthony Marra, Iii
James Patrick Sharpe
James Alan Ward
Original Assignee
Lexmark International, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US13/308,286 external-priority patent/US9170901B2/en
Application filed by Lexmark International, Inc. filed Critical Lexmark International, Inc.
Publication of WO2012075303A2 publication Critical patent/WO2012075303A2/en
Publication of WO2012075303A3 publication Critical patent/WO2012075303A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers

Abstract

A system for testing or debugging a device under test having an embedded logic analyzer. In one embodiment, the system includes software stored in non-transitory memory for testing a device under test having an embedded logic analyzer, the software program product having instructions which, when executed by a computing device associated with the device under test cause the computing device to reconstruct signals of interest in the device under test based at least in part upon signals captured by the embedded logic analyzer during the test or debug session, and cause the computing device to display the reconstructed signals of interest to a user of the computing device.
PCT/US2011/062910 2010-12-01 2011-12-01 A system and method for analyzing an electronics device including a logic analyzer WO2012075303A2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US41884910P 2010-12-01 2010-12-01
US61/418,849 2010-12-01
US13/308,286 US9170901B2 (en) 2009-08-18 2011-11-30 System and method for analyzing an electronics device including a logic analyzer
US13/308,286 2011-11-30

Publications (2)

Publication Number Publication Date
WO2012075303A2 WO2012075303A2 (en) 2012-06-07
WO2012075303A3 true WO2012075303A3 (en) 2012-08-02

Family

ID=46172575

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2011/062910 WO2012075303A2 (en) 2010-12-01 2011-12-01 A system and method for analyzing an electronics device including a logic analyzer

Country Status (1)

Country Link
WO (1) WO2012075303A2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5881217A (en) * 1996-11-27 1999-03-09 Hewlett-Packard Company Input comparison circuitry and method for a programmable state machine
US6389558B1 (en) * 1996-10-28 2002-05-14 Altera Corporation Embedded logic analyzer for a programmable logic device
US20030078752A1 (en) * 1999-05-14 2003-04-24 Chakravarthy K. Allamsetty System and method for testing a circuit implemented on a programmable logic device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6389558B1 (en) * 1996-10-28 2002-05-14 Altera Corporation Embedded logic analyzer for a programmable logic device
US5881217A (en) * 1996-11-27 1999-03-09 Hewlett-Packard Company Input comparison circuitry and method for a programmable state machine
US20030078752A1 (en) * 1999-05-14 2003-04-24 Chakravarthy K. Allamsetty System and method for testing a circuit implemented on a programmable logic device

Also Published As

Publication number Publication date
WO2012075303A2 (en) 2012-06-07

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