WO2012150142A3 - Method and device for determining the currentness of test values - Google Patents

Method and device for determining the currentness of test values Download PDF

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Publication number
WO2012150142A3
WO2012150142A3 PCT/EP2012/057355 EP2012057355W WO2012150142A3 WO 2012150142 A3 WO2012150142 A3 WO 2012150142A3 EP 2012057355 W EP2012057355 W EP 2012057355W WO 2012150142 A3 WO2012150142 A3 WO 2012150142A3
Authority
WO
WIPO (PCT)
Prior art keywords
value
test
actual
setpoint
currentness
Prior art date
Application number
PCT/EP2012/057355
Other languages
German (de)
French (fr)
Other versions
WO2012150142A2 (en
Inventor
Fanghong Lou
Hans-Hermann Steinmann
Original Assignee
Siemens Aktiengesellschaft
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Aktiengesellschaft filed Critical Siemens Aktiengesellschaft
Publication of WO2012150142A2 publication Critical patent/WO2012150142A2/en
Publication of WO2012150142A3 publication Critical patent/WO2012150142A3/en

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Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/273Tester hardware, i.e. output processing circuits
    • G06F11/277Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response

Abstract

The invention relates to a method and a device for determining the currentness of actual test values (1.1, 1.2... 1.n; 1), which are compared with a setpoint test value (3.1, 3.2... 3.n; 3) during test runs (11.1, 11.2...11.m). In order to detect actual test values (1.1, 1.2... 1.n; 1) that are out-of-date, for example due to buffer storage, according to the invention an additional value (5; 5.1, 5.2... 5.m) is linked with the actual test value (1.1, 1.2... 1.n; 1) to form a control actual value (7.1, 7.2... 7.n; 7.1.1, 7.1.2... 7.1.m) and with the setpoint test value (3.1, 3.2... 3.n; 3) to form a control setpoint value (9.1, 9.2... 9.n; 9.1.1, 9.1.2... 9.1.m) in each test run (11.1, 11.2... 11.m), the control actual value (7.1, 7.2... 7.n; 7.1.1, 7.1.2... 7.1.m) and the control setpoint value (9.1, 9.2... 9.n; 9.1.1, 9.1.2... 9.1.m) are compared to each other, and the additional values (5; 5.1, 5.2... 5.m) of successive test runs (11.1, 11.2... 11.m) differ from each other.
PCT/EP2012/057355 2011-05-04 2012-04-23 Method and device for determining the currentness of test values WO2012150142A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE201110075255 DE102011075255A1 (en) 2011-05-04 2011-05-04 Method and device for determining the timeliness of test values
DE102011075255.2 2011-05-04

Publications (2)

Publication Number Publication Date
WO2012150142A2 WO2012150142A2 (en) 2012-11-08
WO2012150142A3 true WO2012150142A3 (en) 2013-01-17

Family

ID=46026789

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2012/057355 WO2012150142A2 (en) 2011-05-04 2012-04-23 Method and device for determining the currentness of test values

Country Status (2)

Country Link
DE (1) DE102011075255A1 (en)
WO (1) WO2012150142A2 (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5933594A (en) * 1994-05-19 1999-08-03 La Joie; Leslie T. Diagnostic system for run-time monitoring of computer operations
US20020188888A1 (en) * 2001-06-06 2002-12-12 Jochen Rivoir Method and apparatus for testing digital devices using transition timestamps
US20040250167A1 (en) * 2003-03-27 2004-12-09 Masahiko Sato Information processing apparatus and method, program, and recording medium
US20050222789A1 (en) * 2004-03-31 2005-10-06 West Burnell G Automatic test system
US20070071080A1 (en) * 2005-09-23 2007-03-29 Teradyne, Inc. Strobe technique for time stamping a digital signal

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5933594A (en) * 1994-05-19 1999-08-03 La Joie; Leslie T. Diagnostic system for run-time monitoring of computer operations
US20020188888A1 (en) * 2001-06-06 2002-12-12 Jochen Rivoir Method and apparatus for testing digital devices using transition timestamps
US20040250167A1 (en) * 2003-03-27 2004-12-09 Masahiko Sato Information processing apparatus and method, program, and recording medium
US20050222789A1 (en) * 2004-03-31 2005-10-06 West Burnell G Automatic test system
US20070071080A1 (en) * 2005-09-23 2007-03-29 Teradyne, Inc. Strobe technique for time stamping a digital signal

Also Published As

Publication number Publication date
DE102011075255A1 (en) 2012-11-08
WO2012150142A2 (en) 2012-11-08

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