WO2017204101A1 - Projection exposure device and projection exposure method therefor - Google Patents

Projection exposure device and projection exposure method therefor Download PDF

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Publication number
WO2017204101A1
WO2017204101A1 PCT/JP2017/018781 JP2017018781W WO2017204101A1 WO 2017204101 A1 WO2017204101 A1 WO 2017204101A1 JP 2017018781 W JP2017018781 W JP 2017018781W WO 2017204101 A1 WO2017204101 A1 WO 2017204101A1
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WO
WIPO (PCT)
Prior art keywords
workpiece
projection exposure
area
predetermined
work
Prior art date
Application number
PCT/JP2017/018781
Other languages
French (fr)
Japanese (ja)
Inventor
秀人 小谷
田中 良和
隆正 大庭
Original Assignee
株式会社サーマプレシジョン
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社サーマプレシジョン filed Critical 株式会社サーマプレシジョン
Priority to SG11201810475VA priority Critical patent/SG11201810475VA/en
Priority to CN201780030833.4A priority patent/CN109154785A/en
Priority to KR1020187030908A priority patent/KR102406914B1/en
Publication of WO2017204101A1 publication Critical patent/WO2017204101A1/en

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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70775Position control, e.g. interferometers or encoders for determining the stage position
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70716Stages
    • G03F7/70725Stages control
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/7085Detection arrangement, e.g. detectors of apparatus alignment possibly mounted on wafers, exposure dose, photo-cleaning flux, stray light, thermal load
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically

Definitions

  • the present invention relates to a technique for improving the throughput of a projection exposure apparatus, and more particularly to a technique for improving the throughput by reducing the total projection exposure time.
  • a projection exposure apparatus that uses a photolithography technique to transfer a pattern on a photomask (reticle) onto a work such as a wafer or a substrate is disclosed in, for example, Reference 1 or Reference 2.
  • Cited Document 1 a pattern on an original plate (reticle: photomask) is placed on a table (or stage) that can move in the X (horizontal) -Y (vertical) - ⁇ (rotation) direction via a projection lens. It is projected onto a single exposed object (work). The position of the object to be exposed (work) in each XY direction is detected by a position detection device using a laser interferometer.
  • the cited document 1 discloses a step moving direction for highly accurately aligning the reticle and wafer in step exposure, and a moving direction of the wafer with respect to the laser interferometer of the position detection device.
  • Cited Document 2 a table (or stage) on which a single workpiece is placed is not only movable in the X (horizontal) -Y (vertical) - ⁇ (rotating) direction, but also on a photomask (reticle).
  • the table to be placed is movable in the X (horizontal) -Y (vertical) - ⁇ (rotation) direction.
  • Citation 2 discloses that the scan direction and scan speed of both tables can be individually set.
  • JP 2001-203161 A Japanese Patent Laid-Open No. 11-260697
  • a brittle material such as a crystal material or a brittle material such as glass even if it is amorphous may be used. It is necessary to take a slow time. For this reason, the time required for loading and unloading the workpiece into the exposure possible area on the stage requires a very long time such as 70 seconds.
  • a work is first loaded at a predetermined position on the stage, then the position of the work on the stage is detected, and then the position detected next.
  • exposure is performed after adjusting the position of the stage or photomask in each direction. That is, in the conventional projection exposure apparatus and the projection exposure method thereof, each process is performed individually one by one, and in order to reduce the total processing time, the time required for each individual process is reduced. Alternatively, there was no other way but to shorten the switching time between each process.
  • the present invention has been made in view of the above-mentioned problems, and loads / unloads workpieces in the projection exposure process, detects the position of a workpiece placed on the stage, and corresponds to the position of the workpiece. It is an object of the present invention to provide a projection exposure apparatus and a projection exposure method thereof that can reduce the total processing time compared to the prior art by enabling parallel execution of at least two projection exposure processes.
  • one embodiment of a projection exposure apparatus provides a predetermined pattern on a workpiece by projecting and exposing with a light from a light source in accordance with a predetermined pattern on the photomask.
  • a projection exposure apparatus for forming a pattern wherein two first areas and second areas are formed on a top surface of a part on which a work is placed so that the two works can be placed simultaneously without overlapping.
  • the sliding table is configured to be alternately slid in the opposite direction and temporarily stopped at the predetermined first stop position and the second stop position at each direction end, and the workpiece into each area of the slide table. When the slide table is temporarily stopped at a predetermined first stop position, the first region is located immediately above the first region of the slide table.
  • a second position detection device arranged to detect the placement position of the workpiece placed on the slide table and the second area of the slide table when the slide table is temporarily stopped at the predetermined first stop position.
  • the first area of the sliding table is directly A light source, a photomask and a projection optical system, which are arranged at the upper part so as to be able to perform projection exposure on the workpiece placed in the first region, sliding of the sliding table and stopping at each stop position;
  • the control unit receives the workpiece placed in the first area when the workpiece placed in the second area is projected and exposed by the light source, the photomask and the projection optical system.
  • the position of the workpiece placed in the second area is detected when the placement position is detected by the position detection device and the workpiece placed in the first area is projected and exposed by the light source, the photomask and the projection optical system. Parallel processing for detecting the placement position with the position detection device is performed.
  • one embodiment of a projection exposure method provides a predetermined pattern on a work by projecting and exposing a predetermined pattern on a photomask to a predetermined position on the work with light from a light source.
  • a pattern is formed, and two first and second regions are formed on the uppermost surface of the part where the workpiece is placed so that the two workpieces can be placed at the same time.
  • To detect the placement position of the workpiece (D) re-sliding the sliding table to temporarily stop the first area at a predetermined second stop position; and (E) projecting a pattern on the photomask onto the work in the first area.
  • FIGS. 1 to (c) are diagrams showing a schematic configuration when the slide table of the exposure apparatus of the first embodiment of the present invention stops at the first stop position, and (a) shows the first stop position.
  • the side view in the case, (b) is a side view in the case of the second stop position, (c) is a top view.
  • 3 is an operation flowchart of the exposure apparatus according to the first embodiment of the present invention.
  • the projection exposure apparatus of the present invention projects a photomask with light from a light source in accordance with a predetermined pattern on a workpiece.
  • a projection exposure apparatus that forms a predetermined pattern on a workpiece by exposure, wherein the two first workpieces are placed on the uppermost surface of a portion on which the workpiece is placed so that the two workpieces can be placed simultaneously without overlapping.
  • a sliding table configured so that one region and a second region are formed and alternately slid in opposite directions and can be temporarily stopped at predetermined first stop positions and second stop positions of end portions in each direction;
  • Two first loaders capable of individually loading and unloading workpieces into each area of the moving table, and the first area of the sliding table when the sliding table temporarily stops at a predetermined first stop position.
  • the first position detection device arranged to detect the placement position of the workpiece placed on the slide table and the second area of the slide table when the slide table temporarily stops at the predetermined second stop position.
  • the second position detection device arranged so as to detect the placement position of the workpiece placed in the second area and the sliding table are temporarily stopped at the predetermined first stop position immediately above.
  • a light source, a photomask, a projection optical system, and a slide of the slide table which are directly above the first area of the slide table and are arranged so that projection exposure can be performed on the workpiece placed in the first area.
  • Another embodiment of the projection exposure apparatus according to the present invention is an exposure apparatus in which the projection exposure apparatus performs step exposure with a plurality of shots on a pattern to be projected and exposed on one workpiece.
  • a device for aligning a position of a pattern to be projected and exposed to a position of a workpiece whose position is detected includes a photomask in a vertical (Y) horizontal (X) height (Z) direction. Including a driving device that linearly moves in at least one direction.
  • the device for aligning the position of the pattern to be projected and exposed to the position of the workpiece whose position has been detected is tilt drive that changes the angle of the photomask from the plane orthogonal to the exposure light Includes devices.
  • a stage in which a device for aligning a pattern to be projected and exposed to a position of a workpiece whose position has been detected is placed in a vertical (Y) horizontal direction on a stage placed under a sliding table.
  • Y vertical
  • X A drive device that linearly moves in at least one direction of the height (Z) direction is included.
  • a device for aligning a position of a pattern to be projected and exposed to a position of a workpiece whose position is detected includes a projection optical system configured to have a vertical (Y) horizontal (X) height (Z ) Including a driving device that moves linearly in at least one direction.
  • One embodiment of a projection exposure method using a projection exposure apparatus is to form a predetermined pattern on a workpiece by aligning a predetermined pattern on a photomask with a predetermined position on the workpiece and performing projection exposure with light from a light source.
  • two first areas and second areas are formed on the uppermost surface of the part where the workpiece is placed so that the two workpieces can be placed at the same time and slide in the opposite directions alternately.
  • a projection exposure method using a projection exposure apparatus having a slide table configured to be capable of temporarily stopping to the predetermined first stop position and second stop position of each direction end, and (A) the slide table And a step of temporarily stopping the first area at a predetermined first stop position, (B) loading a work in the first area of the sliding table, and (C) a work in the first area.
  • Step of detecting the placement position (D) re-sliding the sliding table to temporarily stop the first area at a predetermined second stop position; and (E) projecting and exposing a pattern on the photomask to the work in the first area; (F) When there is a workpiece for which the projection exposure has been completed in the second area of the sliding table, the workpiece for which the projection exposure has been completed from within the second area is performed in parallel with the projection exposure process of (E).
  • the subsequent cycles include steps of alternately exchanging the first area and the second area.
  • a plurality of regions are formed on the uppermost surface of a part on which a work is placed so that a plurality of works can be placed at the same time without sliding.
  • a reciprocating type sliding table configured to be capable of temporary stopping at a plurality of predetermined stopping positions, and in a sliding direction centering on a projection optical system that projects a pattern on a photomask onto a workpiece.
  • FIGS. 1A and 1B show a schematic configuration of the exposure apparatus 1 according to the first embodiment of the present invention, and a substantially rectangular workpiece sliding table 120 on a workpiece stage base 140. Is installed.
  • first work placement area 110 and a work placing second area 111 are arranged at both ends of the long side of the sliding table 120.
  • the first work placement area 110 and the second work placement area 111 are larger than the surface areas of the first work 510 and the second work 511, and each has a sufficient area for placing each work.
  • a position recognition mark (ID) or a marker (not shown) indicating a reference point for position measurement may be provided at a place where each workpiece does not interfere.
  • the work sliding table 120 is connected to a control unit 410 including a microcomputer and a central processing unit (CPU) via an XYZ tilt driving unit 150. In response to a command from the control unit 410, a driving signal is sent from the XYZ tilt driving unit 150 to the work sliding table 120.
  • the work sliding table 120 can precisely control the sliding distance and stop position on the plane of the sliding table by a driving mechanism (not shown).
  • the work sliding table 120 is connected to a power source (not shown) and is supplied with electric power necessary for sliding.
  • the work stage base 140 is a base for tilting or tilting the work sliding table 120 in each of the X, Y, and Z directions, and a drive mechanism, a guide rail, or the like may be provided as necessary.
  • a drive mechanism a guide rail, or the like may be provided as necessary.
  • the case of sliding only in the X direction will be described, but other directions and tilt functions can be used for alignment for exposing a predetermined pattern.
  • the work placement first area 110 is moved to the first stop position 610 or the second stop position 611 by sliding the work slide table 120 via the XYZ tilt driving unit 150 controlled by the control unit 410. You can move and stop at that position. The more detailed the pattern to be exposed, the higher the sliding accuracy and the stopping accuracy and the more precise control is required.
  • the first position detection unit 210 is disposed immediately above the work placement first area 110 when temporarily stopped at the first stop position 610.
  • the first loader 310 is disposed on or near the area of the work placement first area 110 when temporarily stopped at the first stop position 610.
  • the first loader 310 can unload the exposed work from the work placement first area 110 temporarily stopped at the first stop position 610, and can load the unexposed work from that area.
  • a conveyor (not shown) or the like can be used to send the exposed workpiece lowered from the workpiece slide table 120 to the next step or move the unexposed workpiece to the vicinity of the first loader 310.
  • An exposure projection optical system 50 is disposed immediately above the second stop position 611.
  • the work placement second area 111 also moves to the first stop position 610 or the second stop position 611 by sliding the work slide table 120 controlled by the control unit 410, and stops at that position. be able to. Since the first stop position 610 and the second stop position 611 are disposed at both ends of the long side of the substantially rectangular work sliding table 120, when the work is temporarily stopped at the first stop position 610, A first position detector 210 is disposed immediately above the placement first area 110, and a first loader 310 is disposed above or in the vicinity of the work placement first area 110. Although the projection optical system 50 for exposure is arranged immediately above the area 111, when it is temporarily stopped at the second stop position 611, the second position detection unit is located immediately above the work placement second area 111. 211 is arranged, a second loader 311 is arranged above or in the vicinity of the work placement second area 111, and an exposure projection optical system 50 is located immediately above the work placement first area 110. Be placed.
  • the light source unit 10, the photomask 20, the mask XY ⁇ stage 30, and the mask tilt stage 40 are disposed further above the projection optical system 50 for exposure.
  • the second light for placing the work when the exposure light from the light source unit 10 passes through the photomask 20 and the projection optical system 50 and is temporarily stopped at the first stop position 610.
  • the second work 511 placed in the region 111 is exposed, whereby a predetermined pattern on the photomask 20 is transferred onto the second work 511.
  • the mask XY ⁇ stage 30 is connected to a control unit 410 including a microcomputer and a central processing unit (CPU) via a mask XY ⁇ stage driving unit 60.
  • a driving signal is sent from the masking XY ⁇ stage driving unit 60 to the masking XY ⁇ stage 30.
  • the mask XY ⁇ stage 30 is precisely controlled by a mask XY ⁇ stage driving unit 60 that can be moved in the X direction (lateral direction), Y direction (vertical direction), and ⁇ (rotation) direction on a stage plane (not shown). Furthermore, the stop position in the XY ⁇ (vertical, horizontal, rotational) direction on the stage plane can be controlled.
  • the mask XY ⁇ stage 30 is also connected to a power supply (not shown) and is supplied with electric power necessary for movement in the XY ⁇ (vertical, horizontal, rotational) direction.
  • the mask tilt stage 40 is connected to a control unit 410 including a microcomputer and a central processing unit (CPU) via a mask tilt stage driving unit 70.
  • a driving signal is sent from the mask tilt stage driving unit 70 to the mask tilt stage 40.
  • the mask tilt stage 40 is in a state where the stage plane is precisely tilted (tilted) by the mask tilt stage driving unit 70 that can tilt the stage plane (not shown) from an angle perpendicular to the optical axis.
  • the stop position can be controlled.
  • the mask tilt stage 40 is also connected to a power source (not shown) and supplied with power necessary for tilting the stage plane.
  • the control unit 410 allows the workpiece sliding table 120, the workpiece stage base 140, and the mask XY ⁇ stage so that the predetermined pattern on the photomask 20 is accurately transferred to a predetermined position on the second workpiece 511. 30 and the position of the tilt stage for mask 40 on the plane, and the angle and tilt angle on the plane are controlled. In that case, for example, using a photomask microscope (not shown), a workpiece microscope, or the like, control is performed so that the mask alignment mark on the photomask (not shown) matches the workpiece alignment mark on the workpiece. be able to.
  • the projection optical system 50 can also be provided with a drive unit and used for control for projecting a predetermined pattern on the photomask to a predetermined position on the work.
  • step S1 when the process is started, it is confirmed whether or not the sliding table 120 is temporarily stopped at the first stop position 610 (S1). If the sliding table 120 is temporarily stopped at the first stop position 610 (S1: Yes), whether or not an unexposed workpiece is placed in the workpiece placement first area 110 of the sliding table 120. Is confirmed (S2). If the sliding table 120 is not temporarily stopped at the first stop position 610 (S1: No), it means that the sliding table 120 is temporarily stopped at the second stop position 611, and the process proceeds to step S7.
  • the control unit 410 places the unexposed workpiece on the first loader 310 for placing the workpiece.
  • An instruction is output so as to load into one area 110 (S3).
  • the process proceeds to step S4, and the first command is sent from the controller 41.
  • the 1-position detecting unit 210 detects the position of the first workpiece 510 in the workpiece placement first area 110 (S4). In that case, for example, a stage alignment mark on the stage and a work alignment mark on the work may be detected by a work microscope.
  • the control unit 410 slides the sliding table 120 from the first stop position 610 to the second stop position 611 on the XYZ tilt driving unit 150. (S5), and when the workpiece placement first area 110 on the sliding table 120 reaches the position directly below the projection optical system 50 in the case of the second stop position 611, a command to pause is output ( S6).
  • the control unit 410 sends the exposed workpiece to the second loader 311 for the workpiece placement second region 111. Is unloaded (S8), and an instruction is output to load the unexposed workpiece into the workpiece placement second area 111 (S9).
  • step S9 the unexposed workpiece is placed on the workpiece placement second.
  • the area 111 is loaded (S9).
  • the first workpiece 510 whose position has been detected in the workpiece placement first region 110 is At the second stop position 611, transfer onto the first work 510 by projection exposure of a predetermined pattern of the photomask 20 is performed (S10).
  • the control unit 410 outputs a command to slide the XYZ tilt driving unit 150 again (S11), and outputs a command to pause when the sliding table 120 reaches the first stop position 610. (S12).
  • the control unit 410 sends the exposed workpiece to the first loader 310.
  • a command is output to unload from (S14), and the process proceeds to step S16 to check whether there is any remaining unexposed workpiece (S16). If there is no exposed workpiece in the workpiece placement first area 110 (S13: No), it is not necessary to unload the workpiece, so the process proceeds to step S16 to determine whether there is no remaining unexposed workpiece. Is confirmed (S16).
  • the workpiece placement second is performed simultaneously.
  • the transfer onto the second workpiece 511 by projection exposure of a predetermined pattern of the photomask 20 is performed at the second stop position 611 (S15), and the control unit In step S16, it is confirmed whether there is no unexposed workpiece remaining 410.
  • step S16: Yes If there is no remaining unexposed workpiece (S16: Yes), the process is terminated. If there is any remaining unexposed workpiece (S16: No), the process returns to step S1 and the first workpiece placement is performed. It is confirmed whether or not the area 110 is temporarily stopped at the first stop position 610 (S1), and the subsequent processing is repeated.
  • the projection exposure apparatus 1 of the present embodiment forms a predetermined pattern on the workpieces 510 and 511 by aligning a predetermined pattern of the photomask 20 with a predetermined position on the workpieces 510 and 511 and performing projection exposure with light from a light source.
  • the projection exposure apparatus 1 has two first areas 110 and 110 so that the two works 510 and 511 can be placed at the same time without overlapping each other on the uppermost surface of the part on which the works 510 and 511 are placed.
  • a sliding table 120 in which a second region 111 is formed and alternately slid in the opposite direction and configured to be capable of temporarily stopping at a predetermined first stop position 610 and second stop position 611 at each direction end; Two first loaders 310 and second loaders 311 capable of individually loading and unloading workpieces 510 and 511 into each area of the sliding table 120, and the sliding table 120 are predetermined.
  • the placement position of the workpiece 510 or 511 placed in the first area 110 is detected immediately above the first area 110 of the sliding table 120.
  • the arranged first position detecting device 210 and the sliding table 120 are temporarily stopped at a predetermined second stop position 611, the second area 111 is placed immediately above the second area 111 of the sliding table 120.
  • the slide Projection exposure can be performed on the workpieces 510 and 511 placed in the second area 111 directly above the second area 111 in the table 120, and the sliding table 12. Is temporarily stopped at a predetermined second stop position 611, it is possible to perform projection exposure on the workpieces 510 and 511 placed directly in the first area 110 on the sliding table 120 and in the first area 110.
  • the position of the workpiece 510 placed in the first area 110 is detected by the position detection device 210, and conversely, in the first area 110.
  • the position detection device 211 detects the placement position of the workpiece 511 placed in the second region 111 when the workpiece 510 placed on the workpiece 510 is projected and exposed by the light source 10, the photomask 20 and the projection optical system 50. Parallel processing can be performed.
  • the projection exposure apparatus 1 of the present embodiment can be an exposure apparatus that performs step exposure of a pattern to be projected and exposed on a single workpiece 510 or 511 by a plurality of shots.
  • a device that aligns the position of the pattern to be exposed to projection with the position of the workpieces 510 and 511 whose positions have been detected is the vertical (Y) horizontal (X) height of the photomask 20.
  • a drive device 60 that linearly moves in at least one of the (Z) directions and / or a device that aligns the pattern of the projection exposure to the position of the workpieces 510 and 511 that have been detected can be obtained by a photo Tilt drive devices 40 and 70 that change the angle of the mask 20 from the plane orthogonal to the exposure light may be included, and / or the pattern of the projection exposure is aligned with the position of the workpieces 510 and 511 that have been detected.
  • a stage in which the device is disposed under the sliding table 120 is linearly arranged in at least one of the vertical (Y), horizontal (X), and height (Z) directions.
  • a drive device 150 that can be moved and / or a device that aligns the pattern of the projection exposure to the position of the workpieces 510, 511 whose position has been detected, allows the projection optical system 50 to be vertically (Y) horizontally (X )
  • a drive device that moves linearly in at least one direction of the height (Z) direction can be included.
  • the projection exposure method of the projection exposure apparatus 11 of the present embodiment matches the predetermined pattern of the photomask 20 with a predetermined position on the workpieces 510 and 511, and performs projection exposure with light from the light source 10 to perform the projection exposure on the workpieces 510 and 511.
  • the two first regions 110 and the second region 110 are formed so that the two workpieces 510 and 511 can be placed at the same time on the uppermost surface of the portion on which the workpieces 510 and 511 are placed.
  • Projection exposure having a slide table 120 in which regions 111 are formed and alternately slid in opposite directions and configured to be capable of temporarily stopping at predetermined first stop positions 610 and second stop positions 611 at the end portions in the respective directions.
  • the projection optical system 50, the first position detection unit 210, the second position detection unit 211, the first loader 310, and the second loader 311 are at the first or second stop positions.
  • different processes on the first or second different area for placing the work are simultaneously executed in parallel with different processes such as work loading / unloading and position detection or projection exposure. Can do. Therefore, in comparison with the conventional case in which each process is continuously performed in series at the same place, parallel processing is possible in this embodiment, so that the processing time can be shortened.
  • Projection exposure apparatus 1 10 light source 20 photomask (reticle) DESCRIPTION OF SYMBOLS 30 XY (theta) stage for masks 40 tilt stage for masks 50 projection optical system 60 XY (theta) stage drive part for masks 70 tilt stage drive part for masks 110 1st area

Abstract

The present invention is provided with: a sliding table 120 having, formed thereon, a plurality of areas 110, 111 in which workpieces are placed; a first loader 310 and a second loader 311 which are capable of loading and unloading the workpieces 510, 511; a first position detection device 210; a second position detection device 211; a light source 10; a photomask 20; a projection optical system 50; and a control unit 410 which controls the sliding table 120 and each unit. When the workpiece 511 placed in the second area 111 is subjected to projection exposure, the control unit 410 executes parallel processing in which the placement position of the workpiece 510 placed in the first area 110 is detected. Furthermore, when the workpiece 510 placed in the first area 110 is subjected to projection exposure, the control unit 410 executes parallel processing in which the placement position of the workpiece 511 placed in the second area 111 is detected.

Description

投影露光装置及びその投影露光方法Projection exposure apparatus and projection exposure method
 本発明は、投影露光装置のスループットを向上させる技術に関し、特に、トータルの投影露光時間を減少させてスループットを向上させる技術に関する。 The present invention relates to a technique for improving the throughput of a projection exposure apparatus, and more particularly to a technique for improving the throughput by reducing the total projection exposure time.
 フォトリソグラフィ技術を用いて、フォトマスク(レチクル)上のパターンを、ウェハ又は基板等のワーク上に転写させる投影露光装置は、例えば、引用文献1あるいは引用文献2に開示されている。 A projection exposure apparatus that uses a photolithography technique to transfer a pattern on a photomask (reticle) onto a work such as a wafer or a substrate is disclosed in, for example, Reference 1 or Reference 2.
 引用文献1では、原板(レチクル:フォトマスク)上のパターンが、投影レンズを介して、X(横)-Y(縦)-θ(回転)方向に移動可能なテーブル(又はステージ)上に戴置された1個の被露光体(ワーク)に投影される。被露光体(ワーク)のXY各方向の位置は、レーザ干渉計を用いた位置検出デバイスにより検出される。引用文献1では、ステップ露光におけるレチクルとウエハの位置合わせを高精度に行うためのステップ移動方向と、位置検出デバイスのレーザ干渉計に対するウエハの移動方向を開示している。 In Cited Document 1, a pattern on an original plate (reticle: photomask) is placed on a table (or stage) that can move in the X (horizontal) -Y (vertical) -θ (rotation) direction via a projection lens. It is projected onto a single exposed object (work). The position of the object to be exposed (work) in each XY direction is detected by a position detection device using a laser interferometer. The cited document 1 discloses a step moving direction for highly accurately aligning the reticle and wafer in step exposure, and a moving direction of the wafer with respect to the laser interferometer of the position detection device.
 引用文献2では、1個のワークの戴置されるテーブル(又はステージ)がX(横)-Y(縦)-θ(回転)方向に移動可能であるだけでなく、フォトマスク(レチクル)の戴置されるテーブルがX(横)-Y(縦)-θ(回転)方向に移動可能になっている。引用文献2では、双方のテーブルのスキャン方向とスキャン速度等を個別に設定できることが開示されている。 In Cited Document 2, a table (or stage) on which a single workpiece is placed is not only movable in the X (horizontal) -Y (vertical) -θ (rotating) direction, but also on a photomask (reticle). The table to be placed is movable in the X (horizontal) -Y (vertical) -θ (rotation) direction. Citation 2 discloses that the scan direction and scan speed of both tables can be individually set.
特開2001-203161号JP 2001-203161 A 特開平11-260697号Japanese Patent Laid-Open No. 11-260697
 しかしながら、ワークの材料としては、例えば結晶材料のように脆性を有する材料や、非結晶であってもガラス等のように脆性の材料が用いられる場合があり、取り扱いを慎重に、則ち比較的低速時間をかけて行う必要がある。そのため、ステージ上の露光可能領域内にワークをロード及びアンロードするために必要な時間は、例えば70秒等のように非常に長い時間が必要である。 However, as a material for the workpiece, for example, a brittle material such as a crystal material or a brittle material such as glass even if it is amorphous may be used. It is necessary to take a slow time. For this reason, the time required for loading and unloading the workpiece into the exposure possible area on the stage requires a very long time such as 70 seconds.
 また、近年における転写パターンの高精細化により、投影露光装置でワーク上にパターンを転写させる際の、ステージ上のワークの位置検出についても高い精度が求められており、位置検出に必要な時間が増加する傾向にある。また、ステップ露光等のように複数の位置に移動させながら複数回の露光を実施する場合にはさらに多くの位置検出時間が必要になる。 In addition, due to the high definition of transfer patterns in recent years, high accuracy is required for the position detection of the workpiece on the stage when the pattern is transferred onto the workpiece by the projection exposure apparatus, and the time required for position detection is required. It tends to increase. Further, when performing exposure a plurality of times while moving to a plurality of positions as in step exposure or the like, more position detection time is required.
 特許文献1及び2のような従来の投影露光装置では、まず、ステージ上の所定位置にワークをロードし、次にそのワークのステージ上の位置を検出し、さらにその次に検出された位置に合わせてステージ又はフォトマスクの位置を各方向に調整してから露光を実施していた。つまり、従来の投影露光装置及びその投影露光方法では、各処理を1処理づつ個別に順番に実施しており、トータルの処理時間を短縮するには、個別の各処理に必要な時間を短縮するか、又は、各処理の間の切り換える時間を短縮するしか方法がなかった。 In the conventional projection exposure apparatuses such as Patent Documents 1 and 2, a work is first loaded at a predetermined position on the stage, then the position of the work on the stage is detected, and then the position detected next. In addition, exposure is performed after adjusting the position of the stage or photomask in each direction. That is, in the conventional projection exposure apparatus and the projection exposure method thereof, each process is performed individually one by one, and in order to reduce the total processing time, the time required for each individual process is reduced. Alternatively, there was no other way but to shorten the switching time between each process.
発明の概要
 本発明は、上記問題点に鑑みてなされたものであり、投影露光工程におけるワークのロード/アンロード、ステージ上の戴置されたワークの位置検出、及び、ワークの位置に対応させた投影露光の各処理の少なくとも二つの並列実施を可能にすることにより、従来よりもトータルの処理時間を短縮することのできる投影露光装置及びその投影露光方法を提供することを目的とする。
SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems, and loads / unloads workpieces in the projection exposure process, detects the position of a workpiece placed on the stage, and corresponds to the position of the workpiece. It is an object of the present invention to provide a projection exposure apparatus and a projection exposure method thereof that can reduce the total processing time compared to the prior art by enabling parallel execution of at least two projection exposure processes.
 上記目的を達成するために、本発明に係る投影露光装置の1つの実施形態は、フォトマスクの所定パターンをワーク上の所定位置に合わせて光源からの光で投影露光することでワーク上に所定パターンを形成する投影露光装置であって、ワークを載置する部位の最上面に、2個のワークが重ならないで同時に載置が可能なように2個の第1領域及び第2領域が形成されて交互に逆方向へ摺動及び各方向端部の所定の第1停止位置及び第2停止位置への一時停止が可能に構成された摺動テーブルと、摺動テーブルの各領域内へワークを各々個別にロード及びアンロードできる2個の第1ローダと、摺動テーブルが所定の第1停止位置に一時停止した場合に、摺動テーブルにおける第1領域の直上部に、当該第1領域内に載置されたワークの戴置位置を検出するように配置された第1位置検出デバイスと、摺動テーブルが所定の第2停止位置に一時停止した場合に、摺動テーブルにおける第2領域の直上部に、当該第2領域内に載置されたワークの戴置位置を検出するように配置された第2位置検出デバイスと、摺動テーブルが所定の第1停止位置に一時停止した場合に、摺動テーブルにおける第2領域の直上部であって、当該第2領域内に載置されたワークに投影露光でき、且つ、摺動テーブルが所定の第2停止位置に一時停止した場合に、摺動テーブルにおける第1領域の直上部であって、当該第1領域内に載置されたワークに投影露光できるように配置された光源、フォトマスク及び投影光学系と、摺動テーブルの摺動および各停止位置での停止と、第1ローダによる各領域内へのワークのロード及びアンロード、位置検出デバイスによる各領域内のワークの戴置位置の検出、光源、フォトマスク及び投影光学系による各領域内のワークへの投影露光、の各処理を制御する制御部と、を有し、制御部が、第2領域内に載置されたワークに対して光源、フォトマスク及び投影光学系により投影露光する時に、第1領域内に載置されたワークの戴置位置を位置検出デバイスで検出し、逆に第1領域内に載置されたワークに対して光源、フォトマスク及び投影光学系により投影露光する時に、第2領域内に載置されたワークの戴置位置を位置検出デバイスで検出する並行処理を実施する。 In order to achieve the above object, one embodiment of a projection exposure apparatus according to the present invention provides a predetermined pattern on a workpiece by projecting and exposing with a light from a light source in accordance with a predetermined pattern on the photomask. A projection exposure apparatus for forming a pattern, wherein two first areas and second areas are formed on a top surface of a part on which a work is placed so that the two works can be placed simultaneously without overlapping. The sliding table is configured to be alternately slid in the opposite direction and temporarily stopped at the predetermined first stop position and the second stop position at each direction end, and the workpiece into each area of the slide table. When the slide table is temporarily stopped at a predetermined first stop position, the first region is located immediately above the first region of the slide table. The work placed inside When the first position detecting device arranged to detect the position and the sliding table are temporarily stopped at a predetermined second stop position, the second position of the sliding table is directly above the second area. A second position detection device arranged to detect the placement position of the workpiece placed on the slide table and the second area of the slide table when the slide table is temporarily stopped at the predetermined first stop position. When the workpiece placed on the second area can be projected and exposed, and the sliding table is temporarily stopped at the predetermined second stop position, the first area of the sliding table is directly A light source, a photomask and a projection optical system, which are arranged at the upper part so as to be able to perform projection exposure on the workpiece placed in the first region, sliding of the sliding table and stopping at each stop position; Within each area by the first loader Control to control the processing of loading and unloading of the workpiece, detection of the placement position of the workpiece in each region by the position detection device, and projection exposure to the workpiece in each region by the light source, photomask and projection optical system And the control unit receives the workpiece placed in the first area when the workpiece placed in the second area is projected and exposed by the light source, the photomask and the projection optical system. The position of the workpiece placed in the second area is detected when the placement position is detected by the position detection device and the workpiece placed in the first area is projected and exposed by the light source, the photomask and the projection optical system. Parallel processing for detecting the placement position with the position detection device is performed.
 上記目的を達成するために、本発明に係る投影露光方法の1つの実施形態は、フォトマスクの所定パターンをワーク上の所定位置に合わせて光源からの光で投影露光することでワーク上に所定パターンを形成し、ワークを載置する部位の最上面に、2個のワークが重ならないで同時に載置が可能なように2個の第1領域及び第2領域が形成されて交互に逆方向へ摺動及び各方向端部の所定の第1停止位置及び第2停止位置への一時停止が可能に構成された摺動テーブルを有する投影露光装置を用いる投影露光方法であって、(A)摺動テーブルを摺動させて所定の第1停止位置に第1領域一時停止させるステップと、(B)摺動テーブルの第1領域内にワークをロードさせるステップと、(C)第1領域内のワークの戴置位置を検出するステップと、(D)摺動テーブルを再摺動させて所定の第2停止位置に第1領域一時停止させるステップと、(E)第1領域内のワークにフォトマスク上のパターンを投影露光するステップと、(F)摺動テーブルの第2領域内に投影露光が終了したワークがある場合には、(E)の投影露光処理と並行して、その第2領域内から投影露光が終了したワークをアンロードするステップと、(G)前記(A)~(F)の所定の第1停止位置の第1領域と所定の第2停止位置の第2領域を入れ替えて次のサイクルの処理を行い、以降のサイクルについては、第1領域と第2領域を交互に入れ替えて実施するステップと、を有する。 In order to achieve the above object, one embodiment of a projection exposure method according to the present invention provides a predetermined pattern on a work by projecting and exposing a predetermined pattern on a photomask to a predetermined position on the work with light from a light source. A pattern is formed, and two first and second regions are formed on the uppermost surface of the part where the workpiece is placed so that the two workpieces can be placed at the same time. A projection exposure method using a projection exposure apparatus having a slide table configured to be capable of sliding to a predetermined first stop position and second stop position of each direction end, and (A) Sliding the slide table to temporarily stop the first area at a predetermined first stop position; (B) loading the work in the first area of the slide table; and (C) in the first area. To detect the placement position of the workpiece (D) re-sliding the sliding table to temporarily stop the first area at a predetermined second stop position; and (E) projecting a pattern on the photomask onto the work in the first area. And (F) if there is a workpiece that has undergone projection exposure in the second area of the sliding table, the projection exposure is completed from within the second area in parallel with the projection exposure process of (E). A step of unloading the workpiece, and (G) the process of the next cycle by exchanging the first area at the predetermined first stop position and the second area at the predetermined second stop position in the above (A) to (F) And the following cycles are performed by alternately exchanging the first area and the second area.
(a)~(c)は本発明の第1の実施形態の露光装置の摺動テーブルが第1停止位置に停止した場合の概略構成を示す図であり、(a)が第1停止位置の場合の側面図、(b)が第2停止位置の場合の側面図、(c)が上面図である。(A) to (c) are diagrams showing a schematic configuration when the slide table of the exposure apparatus of the first embodiment of the present invention stops at the first stop position, and (a) shows the first stop position. The side view in the case, (b) is a side view in the case of the second stop position, (c) is a top view. 本発明の第1の実施形態の露光装置の動作フローチャートである。3 is an operation flowchart of the exposure apparatus according to the first embodiment of the present invention.
発明の詳細な説明
全般的説明
 本発明に係る投影露光装置の1つの実施態様は、本発明の投影露光装置は、フォトマスクの所定パターンをワーク上の所定位置に合わせて光源からの光で投影露光することでワーク上に所定パターンを形成する投影露光装置であって、ワークを載置する部位の最上面に、2個のワークが重ならないで同時に載置が可能なように2個の第1領域及び第2領域が形成されて交互に逆方向へ摺動及び各方向端部の所定の第1停止位置及び第2停止位置への一時停止が可能に構成された摺動テーブルと、摺動テーブルの各領域内へワークを各々個別にロード及びアンロードできる2個の第1ローダと、摺動テーブルが所定の第1停止位置に一時停止した場合に、摺動テーブルにおける第1領域の直上部に、当該第1領域内に載置されたワークの戴置位置を検出するように配置された第1位置検出デバイスと、摺動テーブルが所定の第2停止位置に一時停止した場合に、摺動テーブルにおける第2領域の直上部に、当該第2領域内に載置されたワークの戴置位置を検出するように配置された第2位置検出デバイスと、摺動テーブルが所定の第1停止位置に一時停止した場合に、摺動テーブルにおける第2領域の直上部であって、当該第2領域内に載置されたワークに投影露光でき、且つ、摺動テーブルが所定の第2停止位置に一時停止した場合に、摺動テーブルにおける第1領域の直上部であって、当該第1領域内に載置されたワークに投影露光できるように配置された光源、フォトマスク及び投影光学系と、摺動テーブルの摺動および各停止位置での停止と、第1ローダによる各領域内へのワークのロード及びアンロード、位置検出デバイスによる各領域内のワークの戴置位置の検出、光源、フォトマスク及び投影光学系による各領域内のワークへの投影露光、の各処理を制御する制御部と、を有し、制御部が、第2領域内に載置されたワークに対して光源、フォトマスク及び投影光学系により投影露光する時に、第1領域内に載置されたワークの戴置位置を位置検出デバイスで検出し、逆に第1領域内に載置されたワークに対して光源、フォトマスク及び投影光学系により投影露光する時に、第2領域内に載置されたワークの戴置位置を位置検出デバイスで検出する並行処理を実施するものである。
DETAILED DESCRIPTION OF THE INVENTION General Description In one embodiment of a projection exposure apparatus according to the present invention, the projection exposure apparatus of the present invention projects a photomask with light from a light source in accordance with a predetermined pattern on a workpiece. A projection exposure apparatus that forms a predetermined pattern on a workpiece by exposure, wherein the two first workpieces are placed on the uppermost surface of a portion on which the workpiece is placed so that the two workpieces can be placed simultaneously without overlapping. A sliding table configured so that one region and a second region are formed and alternately slid in opposite directions and can be temporarily stopped at predetermined first stop positions and second stop positions of end portions in each direction; Two first loaders capable of individually loading and unloading workpieces into each area of the moving table, and the first area of the sliding table when the sliding table temporarily stops at a predetermined first stop position. In the first area directly above The first position detection device arranged to detect the placement position of the workpiece placed on the slide table and the second area of the slide table when the slide table temporarily stops at the predetermined second stop position. When the second position detection device arranged so as to detect the placement position of the workpiece placed in the second area and the sliding table are temporarily stopped at the predetermined first stop position immediately above. , When it is directly above the second area of the sliding table and can be projected and exposed to a workpiece placed in the second area, and when the sliding table is temporarily stopped at a predetermined second stop position, A light source, a photomask, a projection optical system, and a slide of the slide table, which are directly above the first area of the slide table and are arranged so that projection exposure can be performed on the workpiece placed in the first area. And stop at each stop position, Loading and unloading of workpieces in each region by a loader, detection of the placement position of the workpiece in each region by a position detection device, projection exposure to the workpiece in each region by a light source, a photomask and a projection optical system, A control unit that controls each process, and the control unit is mounted in the first area when the workpiece placed in the second area is projected and exposed by the light source, the photomask, and the projection optical system. The position of the placed workpiece is detected by the position detection device. Conversely, when the workpiece placed in the first area is projected and exposed by the light source, the photomask, and the projection optical system, the position is placed in the second area. Parallel processing for detecting the placement position of the placed workpiece by the position detection device is performed.
 本発明に係る投影露光装置のその他の実施態様は、投影露光装置が、1個のワークに対して、投影露光するパターンを複数ショットでステップ露光する露光装置であるものである。 Another embodiment of the projection exposure apparatus according to the present invention is an exposure apparatus in which the projection exposure apparatus performs step exposure with a plurality of shots on a pattern to be projected and exposed on one workpiece.
 本発明に係る投影露光装置のその他の実施態様は、位置検出されたワークの位置に投影露光するパターンの位置を合わせるデバイスが、フォトマスクを縦(Y)横(X)高さ(Z)方向の少なくとも1方向に直線的に移動させる駆動デバイスを含むものである。 In another embodiment of the projection exposure apparatus according to the present invention, a device for aligning a position of a pattern to be projected and exposed to a position of a workpiece whose position is detected includes a photomask in a vertical (Y) horizontal (X) height (Z) direction. Including a driving device that linearly moves in at least one direction.
 本発明に係る投影露光装置のその他の実施態様は、位置検出されたワークの位置に投影露光するパターンの位置を合わせるデバイスが、フォトマスクを露光光に対して直交面から角度を変更するチルト駆動デバイスを含むものである。 In another embodiment of the projection exposure apparatus according to the present invention, the device for aligning the position of the pattern to be projected and exposed to the position of the workpiece whose position has been detected is tilt drive that changes the angle of the photomask from the plane orthogonal to the exposure light Includes devices.
 本発明に係る投影露光装置のその他の実施態様は、位置検出されたワークの位置に投影露光するパターンの位置を合わせるデバイスが、摺動テーブルの下に配置されるステージを、縦(Y)横(X)高さ(Z)方向の少なくとも1方向に直線的に移動させる駆動デバイスを含むものである。 In another embodiment of the projection exposure apparatus according to the present invention, a stage in which a device for aligning a pattern to be projected and exposed to a position of a workpiece whose position has been detected is placed in a vertical (Y) horizontal direction on a stage placed under a sliding table. (X) A drive device that linearly moves in at least one direction of the height (Z) direction is included.
 本発明に係る投影露光装置のその他の実施態様は、位置検出されたワークの位置に投影露光するパターンの位置を合わせるデバイスが、投影光学系を、縦(Y)横(X)高さ(Z)方向の少なくとも1方向に直線的に移動させる駆動デバイスを含むものである。 In another embodiment of the projection exposure apparatus according to the present invention, a device for aligning a position of a pattern to be projected and exposed to a position of a workpiece whose position is detected includes a projection optical system configured to have a vertical (Y) horizontal (X) height (Z ) Including a driving device that moves linearly in at least one direction.
 本発明に係る投影露光装置を用いる投影露光方法の1つの実施態様は、フォトマスクの所定パターンをワーク上の所定位置に合わせて光源からの光で投影露光することでワーク上に所定パターンを形成し、ワークを載置する部位の最上面に、2個のワークが重ならないで同時に載置が可能なように2個の第1領域及び第2領域が形成されて交互に逆方向へ摺動及び各方向端部の所定の第1停止位置及び第2停止位置への一時停止が可能に構成された摺動テーブルを有する投影露光装置を用いる投影露光方法であって、(A)摺動テーブルを摺動させて所定の第1停止位置に第1領域一時停止させるステップと、(B)摺動テーブルの第1領域内にワークをロードさせるステップと、(C)第1領域内のワークの戴置位置を検出するステップと、(D)摺動テーブルを再摺動させて所定の第2停止位置に第1領域一時停止させるステップと、(E)第1領域内のワークにフォトマスク上のパターンを投影露光するステップと、(F)摺動テーブルの第2領域内に投影露光が終了したワークがある場合には、(E)の投影露光処理と並行して、その第2領域内から投影露光が終了したワークをアンロードするステップと、(G)前記(A)~(F)の所定の第1停止位置の第1領域と所定の第2停止位置の第2領域を入れ替えて次のサイクルの処理を行い、以降のサイクルについては、第1領域と第2領域を交互に入れ替えて実施するステップと、を有するものである。 One embodiment of a projection exposure method using a projection exposure apparatus according to the present invention is to form a predetermined pattern on a workpiece by aligning a predetermined pattern on a photomask with a predetermined position on the workpiece and performing projection exposure with light from a light source. In addition, two first areas and second areas are formed on the uppermost surface of the part where the workpiece is placed so that the two workpieces can be placed at the same time and slide in the opposite directions alternately. And a projection exposure method using a projection exposure apparatus having a slide table configured to be capable of temporarily stopping to the predetermined first stop position and second stop position of each direction end, and (A) the slide table And a step of temporarily stopping the first area at a predetermined first stop position, (B) loading a work in the first area of the sliding table, and (C) a work in the first area. Step of detecting the placement position (D) re-sliding the sliding table to temporarily stop the first area at a predetermined second stop position; and (E) projecting and exposing a pattern on the photomask to the work in the first area; (F) When there is a workpiece for which the projection exposure has been completed in the second area of the sliding table, the workpiece for which the projection exposure has been completed from within the second area is performed in parallel with the projection exposure process of (E). A step of unloading, and (G) performing the process of the next cycle by exchanging the first area of the predetermined first stop position and the second area of the predetermined second stop position of (A) to (F), The subsequent cycles include steps of alternately exchanging the first area and the second area.
発明の効果
 本発明の露光装置によれば、ワークを載置する部位の最上面に、複数のワークが重ならないで同時に載置が可能なように複数の領域が形成されて、摺動(スライド)及び所定の複数の停止位置への一時停止が可能に構成された往復運動型の摺動テーブルを設けると共に、ワークへフォトマスク上のパターンを投影する投影光学系を中心として、そのスライド方向で両側に、ワークの第1ローダ、摺動テーブル上のワークの位置検出デバイス、を摺動テーブル上の異なる領域に各々対応させて配置することで、各処理の並列実施が可能になる。これにより、従来よりもワークへのトータルの露光時間を短縮することのできる投影露光装置及びその投影露光方法を提供することできる。
Advantageous Effects of Invention According to the exposure apparatus of the present invention, a plurality of regions are formed on the uppermost surface of a part on which a work is placed so that a plurality of works can be placed at the same time without sliding. ) And a reciprocating type sliding table configured to be capable of temporary stopping at a plurality of predetermined stopping positions, and in a sliding direction centering on a projection optical system that projects a pattern on a photomask onto a workpiece. By arranging the first loader of the workpiece and the position detection device of the workpiece on the sliding table on both sides in correspondence with different areas on the sliding table, the respective processes can be performed in parallel. Thereby, it is possible to provide a projection exposure apparatus and a projection exposure method thereof that can shorten the total exposure time of the workpiece as compared with the conventional case.
図示された実施形態の説明
<第1実施形態>
 以下、本発明に係る第1の実施形態について、図面を参照しつつ説明する。図1(a)、(b)には、本発明の第1の実施形態の露光装置1の概略構成を示しており、ワーク用ステージ基台140の上に略矩形のワーク用摺動テーブル120が設置されている。
Description of Illustrated Embodiment <First Embodiment>
A first embodiment according to the present invention will be described below with reference to the drawings. FIGS. 1A and 1B show a schematic configuration of the exposure apparatus 1 according to the first embodiment of the present invention, and a substantially rectangular workpiece sliding table 120 on a workpiece stage base 140. Is installed.
 ワーク用摺動テーブル120上には、2個のワーク戴置用第1領域110及びワーク戴置用第2領域111が、当該摺動テーブル120の長辺の両端部に配置されている。ワーク戴置用第1領域110及びワーク戴置用第2領域111は、第1ワーク510及び第2ワーク511の各表面積よりも大きく、該各ワークを各々戴置するに充分な面積をそれぞれ有しており、また、各領域には、各ワークが干渉しない場所に位置の認識標章(ID)や位置測定の基準点を示すマーカー(不図示)が設けられていてもよい。 On the work sliding table 120, two work placing first areas 110 and a work placing second area 111 are arranged at both ends of the long side of the sliding table 120. The first work placement area 110 and the second work placement area 111 are larger than the surface areas of the first work 510 and the second work 511, and each has a sufficient area for placing each work. In each area, a position recognition mark (ID) or a marker (not shown) indicating a reference point for position measurement may be provided at a place where each workpiece does not interfere.
 ワーク用摺動テーブル120は、XYZチルト駆動部150を介して、マイクロコンピュータや中央演算ユニット(CPU)を含む制御部410に接続される。制御部410からの命令により、XYZチルト駆動部150から駆動用信号がワーク用摺動テーブル120に送出される。ワーク用摺動テーブル120は、不図示の駆動機構等により、精密に摺動テーブルの平面上における摺動する距離と停止位置を制御することができる。また、ワーク用摺動テーブル120は、不図示の電源と接続されて摺動に必要な電力が供給されている。 The work sliding table 120 is connected to a control unit 410 including a microcomputer and a central processing unit (CPU) via an XYZ tilt driving unit 150. In response to a command from the control unit 410, a driving signal is sent from the XYZ tilt driving unit 150 to the work sliding table 120. The work sliding table 120 can precisely control the sliding distance and stop position on the plane of the sliding table by a driving mechanism (not shown). The work sliding table 120 is connected to a power source (not shown) and is supplied with electric power necessary for sliding.
 ワーク用ステージ基台140は、ワーク用摺動テーブル120をX、Y、Zの各方向あるいはチルトさせるための基台であり、必要に応じて、駆動機構やガイドレール等を設けてもよい。本実施形態では、X方向のみに摺動させる場合を説明するが、所定パターンを露光させるための位置合わせ等で他の方向やチルトの機能を使用することができる。 The work stage base 140 is a base for tilting or tilting the work sliding table 120 in each of the X, Y, and Z directions, and a drive mechanism, a guide rail, or the like may be provided as necessary. In the present embodiment, the case of sliding only in the X direction will be described, but other directions and tilt functions can be used for alignment for exposing a predetermined pattern.
 ワーク戴置用第1領域110は、制御部410により制御されたXYZチルト駆動部150を介してワーク用摺動テーブル120を摺動させることにより、第1停止位置610又は第2停止位置611まで移動し、その位置に停止することができる。露光されるパターンが詳細なパターンになるほど、摺動精度、停止精度を高くすると共に精密な制御が必要になる。第1停止位置610に一時停止した場合のワーク戴置用第1領域110の直上部には、例えば、第1位置検出部210が配置される。また、図1(a)では、第1ローダ310が、第1停止位置610に一時停止した場合のワーク戴置用第1領域110の領域の上部又は近傍に配置されている。第1ローダ310は、第1停止位置610に一時停止したワーク戴置用第1領域110から露光済みのワークをアンロードでき、未露光のワークをその領域からロードすることができる。ワーク用摺動テーブル120上から降ろされた露光済みワークを次の工程に送ったり、未露光ワークを第1ローダ310の近傍まで移動させるには、例えば、不図示のコンベア等を用いることができる。また、第2停止位置611の直上部には、露光用の投影光学系50が配置される。 The work placement first area 110 is moved to the first stop position 610 or the second stop position 611 by sliding the work slide table 120 via the XYZ tilt driving unit 150 controlled by the control unit 410. You can move and stop at that position. The more detailed the pattern to be exposed, the higher the sliding accuracy and the stopping accuracy and the more precise control is required. For example, the first position detection unit 210 is disposed immediately above the work placement first area 110 when temporarily stopped at the first stop position 610. Further, in FIG. 1A, the first loader 310 is disposed on or near the area of the work placement first area 110 when temporarily stopped at the first stop position 610. The first loader 310 can unload the exposed work from the work placement first area 110 temporarily stopped at the first stop position 610, and can load the unexposed work from that area. For example, a conveyor (not shown) or the like can be used to send the exposed workpiece lowered from the workpiece slide table 120 to the next step or move the unexposed workpiece to the vicinity of the first loader 310. . An exposure projection optical system 50 is disposed immediately above the second stop position 611.
 ワーク戴置用第2領域111も、制御部410により制御されたワーク用摺動テーブル120を摺動させることにより、第1停止位置610又は第2停止位置611まで移動し、その位置に停止することができる。第1停止位置610と第2停止位置611は、略矩形のワーク用摺動テーブル120の長辺の両端部に配置されているので、第1停止位置610に一時停止している時には、ワーク戴置用第1領域110の直上部に第1位置検出部210が配置され、ワーク戴置用第1領域110の領域の上部又は近傍には第1ローダ310が配置され、ワーク戴置用第2領域111の直上部には露光用の投影光学系50が配置されるが、第2停止位置611に一時停止している時には、ワーク戴置用第2領域111の直上部に第2位置検出部211が配置され、ワーク戴置用第2領域111の領域の上部又は近傍には第2ローダ311が配置され、ワーク戴置用第1領域110の直上部には露光用の投影光学系50が配置される。 The work placement second area 111 also moves to the first stop position 610 or the second stop position 611 by sliding the work slide table 120 controlled by the control unit 410, and stops at that position. be able to. Since the first stop position 610 and the second stop position 611 are disposed at both ends of the long side of the substantially rectangular work sliding table 120, when the work is temporarily stopped at the first stop position 610, A first position detector 210 is disposed immediately above the placement first area 110, and a first loader 310 is disposed above or in the vicinity of the work placement first area 110. Although the projection optical system 50 for exposure is arranged immediately above the area 111, when it is temporarily stopped at the second stop position 611, the second position detection unit is located immediately above the work placement second area 111. 211 is arranged, a second loader 311 is arranged above or in the vicinity of the work placement second area 111, and an exposure projection optical system 50 is located immediately above the work placement first area 110. Be placed.
 露光用の投影光学系50のさらに上部には、光源部10、フォトマスク20、マスク用XYθステージ30、マスク用チルトステージ40が配置される。図1(a)の場合は、光源部10からの露光光が、フォトマスク20及び投影光学系50を透過して、第1停止位置610に一時停止している時のワーク戴置用第2領域111に戴置された第2ワーク511を露光し、それにより、フォトマスク20上の所定パターンを第2ワーク511上に転写する。 The light source unit 10, the photomask 20, the mask XYθ stage 30, and the mask tilt stage 40 are disposed further above the projection optical system 50 for exposure. In the case of FIG. 1A, the second light for placing the work when the exposure light from the light source unit 10 passes through the photomask 20 and the projection optical system 50 and is temporarily stopped at the first stop position 610. The second work 511 placed in the region 111 is exposed, whereby a predetermined pattern on the photomask 20 is transferred onto the second work 511.
 マスク用XYθステージ30は、マスク用XYθステージ駆動部60を介して、マイクロコンピュータや中央演算ユニット(CPU)を含む制御部410に接続される。制御部410からの命令により、マスク用XYθステージ駆動部60から駆動用信号がマスク用XYθステージ30に送出される。マスク用XYθステージ30は、不図示のステージ平面上で、X方向(横方向)、Y方向(縦方向)及びθ(回転)方向に移動させることができるマスク用XYθステージ駆動部60により、精密にステージ平面上のXYθ(縦、横、回転)方向の停止位置を制御することができる。また、マスク用XYθステージ30も、不図示の電源と接続されてXYθ(縦、横、回転)方向の移動に必要な電力が供給されている。 The mask XYθ stage 30 is connected to a control unit 410 including a microcomputer and a central processing unit (CPU) via a mask XYθ stage driving unit 60. In response to a command from the control unit 410, a driving signal is sent from the masking XYθ stage driving unit 60 to the masking XYθ stage 30. The mask XYθ stage 30 is precisely controlled by a mask XYθ stage driving unit 60 that can be moved in the X direction (lateral direction), Y direction (vertical direction), and θ (rotation) direction on a stage plane (not shown). Furthermore, the stop position in the XYθ (vertical, horizontal, rotational) direction on the stage plane can be controlled. The mask XYθ stage 30 is also connected to a power supply (not shown) and is supplied with electric power necessary for movement in the XYθ (vertical, horizontal, rotational) direction.
 マスク用チルトステージ40は、マスク用チルトステージ駆動部70を介して、マイクロコンピュータや中央演算ユニット(CPU)を含む制御部410に接続される。制御部410からの命令により、マスク用チルトステージ駆動部70から駆動用信号がマスク用チルトステージ40に送出される。マスク用チルトステージ40は、不図示のステージ平面を光軸に垂直な角度から傾けてチルトさせることができるマスク用チルトステージ駆動部70により、精密にステージ平面が傾いた(チルトさせた)状態の停止位置を制御することができる。また、マスク用チルトステージ40も、不図示の電源と接続されてステージ平面をチルトさせるために必要な電力が供給されている。 The mask tilt stage 40 is connected to a control unit 410 including a microcomputer and a central processing unit (CPU) via a mask tilt stage driving unit 70. In response to a command from the control unit 410, a driving signal is sent from the mask tilt stage driving unit 70 to the mask tilt stage 40. The mask tilt stage 40 is in a state where the stage plane is precisely tilted (tilted) by the mask tilt stage driving unit 70 that can tilt the stage plane (not shown) from an angle perpendicular to the optical axis. The stop position can be controlled. The mask tilt stage 40 is also connected to a power source (not shown) and supplied with power necessary for tilting the stage plane.
 制御部410は、フォトマスク20上の所定パターンが、第2ワーク511上の所定の位置に正確に転写されるように、ワーク用摺動テーブル120、ワーク用ステージ基台140、マスク用XYθステージ30及びマスク用チルトステージ40の平面上の位置と、平面上の角度及びチルト角度を制御する。その際には、例えば、不図示のフォトマスク用顕微鏡及びワーク用顕微鏡等を用いて、やはり不図示のフォトマスク上のマスクアライメントマークが、ワーク上のワークアライメントマークに合致するように制御を行うことができる。また、必要に応じて、投影光学系50にも駆動部を設け、フォトマスク上の所定パターンをワーク上の所定位置に投影させるための制御に利用する事ができる。 The control unit 410 allows the workpiece sliding table 120, the workpiece stage base 140, and the mask XYθ stage so that the predetermined pattern on the photomask 20 is accurately transferred to a predetermined position on the second workpiece 511. 30 and the position of the tilt stage for mask 40 on the plane, and the angle and tilt angle on the plane are controlled. In that case, for example, using a photomask microscope (not shown), a workpiece microscope, or the like, control is performed so that the mask alignment mark on the photomask (not shown) matches the workpiece alignment mark on the workpiece. be able to. In addition, if necessary, the projection optical system 50 can also be provided with a drive unit and used for control for projecting a predetermined pattern on the photomask to a predetermined position on the work.
 次に図2を用いて本実施形態の動作を説明する。まず、処理を開始すると、摺動テーブル120が第1停止位置610に一時停止中であるか否かを確認する(S1)。摺動テーブル120が第1停止位置610に一時停止中であれば(S1:Yes)、摺動テーブル120のワーク戴置用第1領域110に未露光のワークが戴置されていないか否かを確認する(S2)。摺動テーブル120が第1停止位置610に一時停止中でなければ(S1:No)、摺動テーブル120は第2停止位置611に一時停止中ということになるので、ステップS7に進む。 Next, the operation of this embodiment will be described with reference to FIG. First, when the process is started, it is confirmed whether or not the sliding table 120 is temporarily stopped at the first stop position 610 (S1). If the sliding table 120 is temporarily stopped at the first stop position 610 (S1: Yes), whether or not an unexposed workpiece is placed in the workpiece placement first area 110 of the sliding table 120. Is confirmed (S2). If the sliding table 120 is not temporarily stopped at the first stop position 610 (S1: No), it means that the sliding table 120 is temporarily stopped at the second stop position 611, and the process proceeds to step S7.
 摺動テーブル120のワーク戴置用第1領域110に未露光のワークが戴置されていない場合(S2:Yes)は、制御部410は第1ローダ310に未露光ワークをワーク戴置用第1領域110内にロードするように命令を出力する(S3)。ワーク戴置用第1領域110に未露光のワークが戴置されている場合(S2:No)は、未露光のワークをロードする必要が無いのでステップS4に進み、制御部41の命令により第1位置検出部210で、ワーク戴置用第1領域110における第1ワーク510の位置を検出する(S4)。その際には、例えば、ステージ上のステージアライメントマークと、ワーク上のワークアライメントマークを、ワーク用顕微鏡で検出するようにしてもよい。 When an unexposed workpiece is not placed on the workpiece placement first area 110 of the sliding table 120 (S2: Yes), the control unit 410 places the unexposed workpiece on the first loader 310 for placing the workpiece. An instruction is output so as to load into one area 110 (S3). When an unexposed workpiece is placed in the workpiece placement first area 110 (S2: No), it is not necessary to load the unexposed workpiece, so the process proceeds to step S4, and the first command is sent from the controller 41. The 1-position detecting unit 210 detects the position of the first workpiece 510 in the workpiece placement first area 110 (S4). In that case, for example, a stage alignment mark on the stage and a work alignment mark on the work may be detected by a work microscope.
 ワーク戴置用第1領域110における第1ワーク510の位置が検出できたら、制御部410はXYZチルト駆動部150に、摺動テーブル120を第1停止位置610から第2停止位置611まで摺動させる命令を出力し(S5)、摺動テーブル120上のワーク戴置用第1領域110が第2停止位置611の場合の投影光学系50の直下部に達したら一時停止する命令を出力する(S6)。 When the position of the first work 510 in the first work placement area 110 is detected, the control unit 410 slides the sliding table 120 from the first stop position 610 to the second stop position 611 on the XYZ tilt driving unit 150. (S5), and when the workpiece placement first area 110 on the sliding table 120 reaches the position directly below the projection optical system 50 in the case of the second stop position 611, a command to pause is output ( S6).
 摺動テーブル120が第2停止位置611で一時停止したら、第1停止位置610の摺動テーブル120のワーク戴置用第2領域111内に露光済みのワークがあるか否かを確認する(S7)。ワーク戴置用第2領域111内に露光済みのワークがある場合(S7:Yes)には、制御部410は第2ローダ311に対して、その露光済みワークをワーク戴置用第2領域111からアンロードし(S8)、未露光のワークをワーク戴置用第2領域111にロードするように命令を出力する(S9)。ワーク戴置用第2領域111内に露光済みのワークが無い場合(S7:No)には、ワークをアンロードする必要は無いのでステップS9に進んで未露光のワークをワーク戴置用第2領域111にロードする(S9)。 When the sliding table 120 is temporarily stopped at the second stop position 611, it is confirmed whether or not there is an exposed workpiece in the workpiece placement second region 111 of the sliding table 120 at the first stop position 610 (S7). ). When there is an exposed workpiece in the workpiece placement second area 111 (S7: Yes), the control unit 410 sends the exposed workpiece to the second loader 311 for the workpiece placement second region 111. Is unloaded (S8), and an instruction is output to load the unexposed workpiece into the workpiece placement second area 111 (S9). If there is no exposed workpiece in the workpiece placement second area 111 (S7: No), there is no need to unload the workpiece, so the process proceeds to step S9, where the unexposed workpiece is placed on the workpiece placement second. The area 111 is loaded (S9).
 ステップS7の処理以降にワーク戴置用第2領域111内にワークをロードするのと同時に並行して、ワーク戴置用第1領域110内の位置検出済みの第1ワーク510に対しては、第2停止位置611でフォトマスク20の所定パターンの投影露光による第1ワーク510上への転写が実施される(S10)。その所定パターンの転写が終了すると、制御部410はXYZチルト駆動部150に再度摺動させる命令を出力し(S11)、摺動テーブル120が第1停止位置610に達したら一時停止する命令を出力する(S12)。 At the same time as loading the workpiece into the workpiece placement second area 111 after the processing of step S7, the first workpiece 510 whose position has been detected in the workpiece placement first region 110 is At the second stop position 611, transfer onto the first work 510 by projection exposure of a predetermined pattern of the photomask 20 is performed (S10). When the transfer of the predetermined pattern is completed, the control unit 410 outputs a command to slide the XYZ tilt driving unit 150 again (S11), and outputs a command to pause when the sliding table 120 reaches the first stop position 610. (S12).
 摺動テーブル120が第1停止位置610で一時停止したら、第1停止位置610の摺動テーブル120のワーク戴置用第1領域110内に露光済みのワークがあるか否かを確認する(S13)。ワーク戴置用第1領域110内に露光済みのワークがある場合(S13:Yes)には、制御部410は第1ローダ310に対して、その露光済みワークをワーク戴置用第1領域110からアンロードするように命令を出力し(S14)、ステップS16に進んで未露光のワークの残りが無いか否かを確認する(S16)。ワーク戴置用第1領域110内に露光済みのワークが無い場合(S13:No)には、ワークをアンロードする必要は無いのでステップS16に進んで未露光のワークの残りが無いか否かを確認する(S16)。 When the sliding table 120 is temporarily stopped at the first stop position 610, it is confirmed whether or not there is an exposed workpiece in the workpiece placement first area 110 of the sliding table 120 at the first stop position 610 (S13). ). When there is an exposed workpiece in the workpiece placement first area 110 (S13: Yes), the control unit 410 sends the exposed workpiece to the first loader 310. A command is output to unload from (S14), and the process proceeds to step S16 to check whether there is any remaining unexposed workpiece (S16). If there is no exposed workpiece in the workpiece placement first area 110 (S13: No), it is not necessary to unload the workpiece, so the process proceeds to step S16 to determine whether there is no remaining unexposed workpiece. Is confirmed (S16).
 ステップS12以降の第1停止位置610の摺動テーブル120のワーク戴置用第1領域110内に露光済みのワークがあるか否かを確認するのと同時に並行して、ワーク戴置用第2領域111内の位置検出済みの第2ワーク511に対しては、第2停止位置611でフォトマスク20の所定パターンの投影露光による第2ワーク511上への転写が実施され(S15)、制御部410が未露光のワークの残りが無いか否かを確認する(S16)。 At the same time as checking whether or not there is an exposed workpiece in the workpiece placement first area 110 of the sliding table 120 at the first stop position 610 after step S12, the workpiece placement second is performed simultaneously. For the second workpiece 511 whose position has been detected in the region 111, the transfer onto the second workpiece 511 by projection exposure of a predetermined pattern of the photomask 20 is performed at the second stop position 611 (S15), and the control unit In step S16, it is confirmed whether there is no unexposed workpiece remaining 410.
 未露光のワークの残りが無い場合には(S16:Yes)、処理を終了し、未露光のワークの残りがある場合には(S16:No)、ステップS1に戻ってワーク戴置用第1領域110が第1停止位置610に一時停止中であるか否かを確認(S1)し、以降の処理を繰り返す。 If there is no remaining unexposed workpiece (S16: Yes), the process is terminated. If there is any remaining unexposed workpiece (S16: No), the process returns to step S1 and the first workpiece placement is performed. It is confirmed whether or not the area 110 is temporarily stopped at the first stop position 610 (S1), and the subsequent processing is repeated.
 従って、本実施形態の投影露光装置1は、フォトマスク20の所定パターンをワーク510、511上の所定位置に合わせて光源からの光で投影露光することでワーク510、511上に所定パターンを形成する投影露光装置1であって、ワーク510、511を載置する部位の最上面に、2個のワーク510、511が重ならないで同時に載置が可能なように2個の第1領域110及び第2領域111が形成されて交互に逆方向へ摺動及び各方向端部の所定の第1停止位置610及び第2停止位置611への一時停止が可能に構成された摺動テーブル120と、摺動テーブル120の各領域内へワーク510、511を各々個別にロード及びアンロードできる2個の第1ローダ310及び第2ローダ311と、摺動テーブル120が所定の第1停止位置610に一時停止した場合に、摺動テーブル120における第1領域110の直上部に、当該第1領域110内に載置されたワーク510又は511の戴置位置を検出するように配置された第1位置検出デバイス210と、摺動テーブル120が所定の第2停止位置611に一時停止した場合に、摺動テーブル120における第2領域111の直上部に、当該第2領域111内に載置されたワーク510又は511の戴置位置を検出するように配置された第2位置検出デバイス211と、摺動テーブル120が所定の第1停止位置610に一時停止した場合に、摺動テーブル120における第2領域111の直上部であって、当該第2領域111内に載置されたワーク510、511に投影露光でき、且つ、摺動テーブル120が所定の第2停止位置611に一時停止した場合に、摺動テーブル120における第1領域110の直上部であって、当該第1領域110内に載置されたワーク510、511に投影露光できるように配置された光源10、フォトマスク20及び投影光学系50と、摺動テーブル120の摺動および各停止位置610、611での停止と、第1ローダ310による各領域内へのワーク510、511のロード及びアンロード、位置検出デバイス210,211による各領域内のワーク510、511の戴置位置の検出、光源10、フォトマスク20及び投影光学系50による各領域内のワーク510、511への投影露光、の各処理を制御する制御部410と、を有し、制御部410が、第2領域111内に載置されたワーク511に対して光源10、フォトマスク20及び投影光学系50により投影露光する時に、第1領域110内に載置されたワーク510の戴置位置を位置検出デバイス210で検出し、逆に第1領域110内に載置されたワーク510に対して光源10、フォトマスク20及び投影光学系50により投影露光する時に、第2領域111内に載置されたワーク511の戴置位置を位置検出デバイス211で検出する並行処理を実施することができる。 Therefore, the projection exposure apparatus 1 of the present embodiment forms a predetermined pattern on the workpieces 510 and 511 by aligning a predetermined pattern of the photomask 20 with a predetermined position on the workpieces 510 and 511 and performing projection exposure with light from a light source. The projection exposure apparatus 1 has two first areas 110 and 110 so that the two works 510 and 511 can be placed at the same time without overlapping each other on the uppermost surface of the part on which the works 510 and 511 are placed. A sliding table 120 in which a second region 111 is formed and alternately slid in the opposite direction and configured to be capable of temporarily stopping at a predetermined first stop position 610 and second stop position 611 at each direction end; Two first loaders 310 and second loaders 311 capable of individually loading and unloading workpieces 510 and 511 into each area of the sliding table 120, and the sliding table 120 are predetermined. When temporarily stopped at the first stop position 610, the placement position of the workpiece 510 or 511 placed in the first area 110 is detected immediately above the first area 110 of the sliding table 120. When the arranged first position detecting device 210 and the sliding table 120 are temporarily stopped at a predetermined second stop position 611, the second area 111 is placed immediately above the second area 111 of the sliding table 120. When the second position detection device 211 arranged to detect the placement position of the workpiece 510 or 511 placed on the slide table 120 and the slide table 120 temporarily stop at the predetermined first stop position 610, the slide Projection exposure can be performed on the workpieces 510 and 511 placed in the second area 111 directly above the second area 111 in the table 120, and the sliding table 12. Is temporarily stopped at a predetermined second stop position 611, it is possible to perform projection exposure on the workpieces 510 and 511 placed directly in the first area 110 on the sliding table 120 and in the first area 110. The light source 10, the photomask 20 and the projection optical system 50, the sliding of the sliding table 120 and the stop at each stop position 610, 611, the workpiece 510 into each region by the first loader 310, 511 loading and unloading, position detection devices 210 and 211 for detecting the placement position of the workpieces 510 and 511 in each region, and the light source 10, the photomask 20 and the projection optical system 50 to the workpieces 510 and 511 in each region. A control unit 410 that controls each process of projection exposure, and the control unit 410 applies to the workpiece 511 placed in the second region 111. When projection exposure is performed by the light source 10, the photomask 20, and the projection optical system 50, the position of the workpiece 510 placed in the first area 110 is detected by the position detection device 210, and conversely, in the first area 110. The position detection device 211 detects the placement position of the workpiece 511 placed in the second region 111 when the workpiece 510 placed on the workpiece 510 is projected and exposed by the light source 10, the photomask 20 and the projection optical system 50. Parallel processing can be performed.
 また、本実施形態の投影露光装置1は、1個のワーク510又は511に対して、投影露光するパターンを複数ショットでステップ露光する露光装置であることができる。また、上記した各実施形態の投影露光装置1では、位置検出されたワーク510、511の位置に投影露光するパターンの位置を合わせるデバイスが、フォトマスク20を縦(Y)横(X)高さ(Z)方向の少なくとも1方向に直線的に移動させる駆動デバイス60を含むことができ、及び/又は、位置検出されたワーク510、511の位置に投影露光するパターンの位置を合わせるデバイスが、フォトマスク20を露光光に対して直交面から角度を変更するチルト駆動デバイス40、70を含むことができ、及び/又は、位置検出されたワーク510、511の位置に投影露光するパターンの位置を合わせるデバイスが、摺動テーブル120の下に配置されるステージを、縦(Y)横(X)高さ(Z)方向の少なくとも1方向に直線的に移動させる駆動デバイス150を含むことができ、及び/又は、位置検出されたワーク510、511の位置に投影露光するパターンの位置を合わせるデバイスが、投影光学系50を、縦(Y)横(X)高さ(Z)方向の少なくとも1方向に直線的に移動させる駆動デバイスを含むことができる。 Further, the projection exposure apparatus 1 of the present embodiment can be an exposure apparatus that performs step exposure of a pattern to be projected and exposed on a single workpiece 510 or 511 by a plurality of shots. Moreover, in the projection exposure apparatus 1 of each embodiment described above, a device that aligns the position of the pattern to be exposed to projection with the position of the workpieces 510 and 511 whose positions have been detected is the vertical (Y) horizontal (X) height of the photomask 20. A drive device 60 that linearly moves in at least one of the (Z) directions and / or a device that aligns the pattern of the projection exposure to the position of the workpieces 510 and 511 that have been detected can be obtained by a photo Tilt drive devices 40 and 70 that change the angle of the mask 20 from the plane orthogonal to the exposure light may be included, and / or the pattern of the projection exposure is aligned with the position of the workpieces 510 and 511 that have been detected. A stage in which the device is disposed under the sliding table 120 is linearly arranged in at least one of the vertical (Y), horizontal (X), and height (Z) directions. A drive device 150 that can be moved and / or a device that aligns the pattern of the projection exposure to the position of the workpieces 510, 511 whose position has been detected, allows the projection optical system 50 to be vertically (Y) horizontally (X ) A drive device that moves linearly in at least one direction of the height (Z) direction can be included.
 また、本実施形態の投影露光装置11の投影露光方法は、フォトマスク20の所定パターンをワーク510、511上の所定位置に合わせて光源10からの光で投影露光することでワーク510、511上に所定パターンを形成し、ワーク510、511を載置する部位の最上面に、2個のワーク510、511が重ならないで同時に載置が可能なように2個の第1領域110及び第2領域111が形成されて交互に逆方向へ摺動及び各方向端部の所定の第1停止位置610及び第2停止位置611への一時停止が可能に構成された摺動テーブル120を有する投影露光装置1を用いる投影露光方法であって、(A)摺動テーブル120を摺動させて所定の第1停止位置610に第1領域110一時停止させるステップと、(B)摺動テーブル120の第1領域110内にワーク510、511をロードさせるステップと、(C)第1領域110内のワーク510、511の戴置位置を検出するステップと、(D)摺動テーブル120を再摺動させて所定の第2停止位置611に第1領域110一時停止させるステップと、(E)第1領域110内のワーク510、511にフォトマスク20上のパターンを投影露光するステップと、(F)摺動テーブル120の第2領域111内に投影露光が終了したワーク510、511がある場合には、(E)の投影露光処理と並行して、その第2領域111内から投影露光が終了したワーク510、511をアンロードするステップと、(G)前記(A)~(F)の所定の第1停止位置610の第1領域110と所定の第2停止位置611の第2領域111を入れ替えて次のサイクルの処理を行い、以降のサイクルについては、第1領域110と第2領域111を交互に入れ替えて実施するステップと、を有する。 Further, the projection exposure method of the projection exposure apparatus 11 of the present embodiment matches the predetermined pattern of the photomask 20 with a predetermined position on the workpieces 510 and 511, and performs projection exposure with light from the light source 10 to perform the projection exposure on the workpieces 510 and 511. The two first regions 110 and the second region 110 are formed so that the two workpieces 510 and 511 can be placed at the same time on the uppermost surface of the portion on which the workpieces 510 and 511 are placed. Projection exposure having a slide table 120 in which regions 111 are formed and alternately slid in opposite directions and configured to be capable of temporarily stopping at predetermined first stop positions 610 and second stop positions 611 at the end portions in the respective directions. In the projection exposure method using the apparatus 1, (A) sliding the sliding table 120 to temporarily stop the first region 110 at a predetermined first stop position 610, and (B) a sliding table. Loading the workpieces 510 and 511 in the first region 110 of the first column 120, (C) detecting the placement position of the workpieces 510 and 511 in the first region 110, and (D) the sliding table 120. Re-sliding to temporarily stop the first area 110 at a predetermined second stop position 611; and (E) projecting and exposing a pattern on the photomask 20 to the workpieces 510 and 511 in the first area 110; (F) When there are workpieces 510 and 511 for which projection exposure has been completed in the second region 111 of the sliding table 120, projection exposure is performed from within the second region 111 in parallel with the projection exposure processing of (E). A step of unloading the workpieces 510 and 511 that have finished, (G) the first region 110 of the predetermined first stop position 610 and the predetermined second stop position 61 of (A) to (F). Performs the processing of the next cycle interchanged second region 111, for subsequent cycles, has a step of performing interchanged with the first region 110 and the second region 111 are alternately, the.
 以上のように第1実施形態では、投影光学系50、第1位置検出部210、第2位置検出部211、第1ローダ310及び第2ローダ311は、第1又は第2の各停止位置で一時停止した場合に、ワーク戴置用第1又は第2の異なる領域上の異なるワークに対して、ワークのロード/アンロードと位置検出、又は、投影露光と、異なる処理を同時に並行実施することができる。従って、各処理を同じ場所で連続してシリーズに実施する従来の場合と比較して、本実施形態では並行処理が可能になることから処理時間を短縮することができる。 As described above, in the first embodiment, the projection optical system 50, the first position detection unit 210, the second position detection unit 211, the first loader 310, and the second loader 311 are at the first or second stop positions. When paused, different processes on the first or second different area for placing the work are simultaneously executed in parallel with different processes such as work loading / unloading and position detection or projection exposure. Can do. Therefore, in comparison with the conventional case in which each process is continuously performed in series at the same place, parallel processing is possible in this embodiment, so that the processing time can be shortened.
 1 投影露光装置1
 10 光源部
 20 フォトマスク(レチクル)
 30 マスク用XYθステージ
 40 マスク用チルトステージ
 50 投影光学系
 60 マスク用XYθステージ駆動部
 70 マスク用チルトステージ駆動部
 110 ワーク戴置用第1領域
 111 ワーク戴置用第2領域
 120 ワーク用摺動テーブル
 140 ワーク用ステージ基台
 150 XYZチルト駆動部
 210 第1位置検出部
 211 第2位置検出部
 310 第1ローダ
 311 第2ローダ
 410 制御部
 510 第1ワーク
 511 第2ワーク
 610 第1停止位置
 611 第2停止位置
1 Projection exposure apparatus 1
10 light source 20 photomask (reticle)
DESCRIPTION OF SYMBOLS 30 XY (theta) stage for masks 40 tilt stage for masks 50 projection optical system 60 XY (theta) stage drive part for masks 70 tilt stage drive part for masks 110 1st area | region for workpiece placement 111 2nd area | region for workpiece placement 120 Slide table for workpieces 140 Work stage base 150 XYZ tilt drive unit 210 First position detection unit 211 Second position detection unit 310 First loader 311 Second loader 410 Control unit 510 First work 511 Second work 610 First stop position 611 Second Stop position

Claims (7)

  1.  フォトマスクの所定パターンをワーク上の所定位置に合わせて光源からの光で投影露光することで前記ワーク上に前記所定パターンを形成する投影露光装置であって、
     前記ワークを載置する部位の最上面に、2個のワークが重ならないで同時に載置が可能なように2個の第1領域及び第2領域が形成されて交互に逆方向へ摺動及び前記各方向端部の所定の第1停止位置及び第2停止位置への一時停止が可能に構成された摺動テーブルと、
     前記摺動テーブルの前記各領域内へ前記ワークを各々個別にロード及びアンロードできる2個の第1ローダと、
     前記摺動テーブルが前記所定の第1停止位置に一時停止した場合に、前記摺動テーブルにおける前記第1領域の直上部に、当該第1領域内に載置されたワークの戴置位置を検出するように配置された第1位置検出デバイスと、
     前記摺動テーブルが前記所定の第2停止位置に一時停止した場合に、前記摺動テーブルにおける前記第2領域の直上部に、当該第2領域内に載置されたワークの戴置位置を検出するように配置された第2位置検出デバイスと、
     前記摺動テーブルが前記所定の第1停止位置に一時停止した場合に、前記摺動テーブルにおける前記第2領域の直上部であって、当該第2領域内に載置された前記ワークに投影露光でき、且つ、前記摺動テーブルが前記所定の第2停止位置に一時停止した場合に、前記摺動テーブルにおける前記第1領域の直上部であって、当該第1領域内に載置された前記ワークに投影露光できるように配置された光源、フォトマスク及び投影光学系と、
     前記摺動テーブルの摺動および各停止位置での停止と、第1ローダによる各領域内へのワークのロード及びアンロード、前記位置検出デバイスによる各領域内のワークの戴置位置の検出、前記光源、フォトマスク及び投影光学系による各領域内のワークへの投影露光、の各処理を制御する制御部と、
     を有し、
     前記制御部が、前記第2領域内に載置されたワークに対して前記光源、フォトマスク及び投影光学系により投影露光する時に、前記第1領域内に載置されたワークの戴置位置を前記位置検出デバイスで検出し、逆に前記第1領域内に載置されたワークに対して前記光源、フォトマスク及び投影光学系により投影露光する時に、前記第2領域内に載置されたワークの戴置位置を前記位置検出デバイスで検出する並行処理を実施する
     投影露光装置。
    A projection exposure apparatus that forms a predetermined pattern on the work by aligning a predetermined pattern of a photomask with a predetermined position on the work and performing projection exposure with light from a light source,
    Two first regions and second regions are formed on the uppermost surface of the part where the workpiece is placed so that the two workpieces can be placed simultaneously without sliding, and alternately slide in opposite directions. A sliding table configured to be capable of temporary stop to the predetermined first stop position and second stop position of each direction end;
    Two first loaders capable of individually loading and unloading the workpiece into the respective areas of the sliding table;
    When the slide table is temporarily stopped at the predetermined first stop position, the placement position of the work placed in the first area is detected immediately above the first area of the slide table. A first position detection device arranged to
    When the slide table is temporarily stopped at the predetermined second stop position, the placement position of the work placed in the second area is detected immediately above the second area of the slide table. A second position detection device arranged to
    When the slide table is temporarily stopped at the predetermined first stop position, projection exposure is performed on the work placed directly in the second area of the slide table and in the second area. And when the slide table is temporarily stopped at the predetermined second stop position, the slide table is directly above the first region of the slide table and is placed in the first region. A light source, a photomask, and a projection optical system arranged so that the workpiece can be projected and exposed;
    Sliding of the sliding table and stopping at each stop position, loading and unloading of the workpiece into each region by the first loader, detection of the placement position of the workpiece in each region by the position detection device, A control unit that controls each process of projection exposure to a work in each region by a light source, a photomask, and a projection optical system;
    Have
    When the control unit projects and exposes the work placed in the second area by the light source, the photomask, and the projection optical system, the placement position of the work placed in the first area is determined. The workpiece placed in the second area when the position detection device detects and conversely the workpiece placed in the first area is projected and exposed by the light source, photomask and projection optical system. A projection exposure apparatus that performs parallel processing of detecting the placement position of the projector with the position detection device.
  2.  前記投影露光装置が、1個のワークに対して、投影露光するパターンを複数ショットでステップ露光する露光装置である
     請求項1に記載の投影露光装置。
    The projection exposure apparatus according to claim 1, wherein the projection exposure apparatus is an exposure apparatus that performs step exposure of a pattern to be projected and exposed with a plurality of shots on one workpiece.
  3.  前記位置検出されたワークの位置に投影露光するパターンの位置を合わせるデバイスが、フォトマスクを縦(Y)横(X)高さ(Z)方向の少なくとも1方向に直線的に移動させる駆動デバイスを含む
     請求項1又は2に記載の投影露光装置。
    A device for aligning the position of the pattern to be projected and exposed to the position of the workpiece whose position has been detected is a drive device that linearly moves the photomask in at least one of the vertical (Y), horizontal (X), and height (Z) directions. The projection exposure apparatus according to claim 1 or 2.
  4.  前記位置検出されたワークの位置に投影露光するパターンの位置を合わせるデバイスが、フォトマスクを露光光に対して直交面から角度を変更するチルト駆動デバイスを含む
     請求項1~3何れか1項に記載の投影露光装置。
    The device for aligning the position of the pattern to be projected and exposed to the position of the workpiece whose position is detected includes a tilt driving device that changes the angle of the photomask from a plane orthogonal to the exposure light. The projection exposure apparatus described.
  5.  前記位置検出されたワークの位置に投影露光するパターンの位置を合わせるデバイスが、前記摺動テーブルの下に配置されるステージを、縦(Y)横(X)高さ(Z)方向の少なくとも1方向に直線的に移動させる駆動デバイスを含む
     請求項1~3何れか1項に記載の投影露光装置。
    The device for aligning the position of the pattern to be projected and exposed to the position of the workpiece whose position has been detected moves the stage disposed under the sliding table to at least one in the vertical (Y) horizontal (X) height (Z) direction. The projection exposure apparatus according to any one of claims 1 to 3, further comprising a drive device that moves linearly in the direction.
  6.  前記位置検出されたワークの位置に投影露光するパターンの位置を合わせるデバイスが、前記投影光学系を、縦(Y)横(X)高さ(Z)方向の少なくとも1方向に直線的に移動させる駆動デバイスを含む
     請求項1~3何れか1項に記載の投影露光装置。
    A device for aligning the position of the pattern to be projected and exposed to the position of the workpiece whose position has been detected moves the projection optical system linearly in at least one of the vertical (Y), horizontal (X), and height (Z) directions. The projection exposure apparatus according to any one of claims 1 to 3, further comprising a drive device.
  7.  フォトマスクの所定パターンをワーク上の所定位置に合わせて光源からの光で投影露光することで前記ワーク上に前記所定パターンを形成し、前記ワークを載置する部位の最上面に、2個のワークが重ならないで同時に載置が可能なように2個の第1領域及び第2領域が形成されて交互に逆方向へ摺動及び前記各方向端部の所定の第1停止位置及び第2停止位置への一時停止が可能に構成された摺動テーブルを有する投影露光装置を用いる投影露光方法であって、
     (A)前記摺動テーブルを摺動させて前記所定の第1停止位置に前記第1領域一時停止させるステップと、
     (B)前記摺動テーブルの前記第1領域内に前記ワークをロードさせるステップと、
     (C)前記第1領域内の前記ワークの戴置位置を検出するステップと、
     (D)前記摺動テーブルを再摺動させて前記所定の第2停止位置に前記第1領域一時停止させるステップと、
     (E)前記第1領域内の前記ワークにフォトマスク上のパターンを投影露光するステップと、
     (F)前記摺動テーブルの前記第2領域内に投影露光が終了した前記ワークがある場合には、前記(E)の投影露光処理と並行して、その第2領域内から投影露光が終了した前記ワークをアンロードするステップと、
     (G)前記(A)~(F)の前記所定の第1停止位置の前記第1領域と前記所定の第2停止位置の前記第2領域を入れ替えて次のサイクルの処理を行い、
     以降のサイクルについては、前記第1領域と前記第2領域を交互に入れ替えて実施するステップと、
     を有する投影露光方法。
    A predetermined pattern of the photomask is aligned with a predetermined position on the work, and projection exposure is performed with light from a light source to form the predetermined pattern on the work, and on the uppermost surface of the part on which the work is placed, Two first regions and second regions are formed so that the workpieces can be placed at the same time without overlapping, and alternately slide in opposite directions and a predetermined first stop position and second of each end portion in each direction. A projection exposure method using a projection exposure apparatus having a sliding table configured to be capable of being temporarily stopped at a stop position,
    (A) sliding the slide table to temporarily stop the first region at the predetermined first stop position;
    (B) loading the workpiece into the first region of the sliding table;
    (C) detecting a placement position of the workpiece in the first region;
    (D) re-sliding the sliding table to temporarily stop the first region at the predetermined second stop position;
    (E) projecting and exposing a pattern on a photomask onto the work in the first region;
    (F) If there is the workpiece that has undergone projection exposure in the second area of the slide table, the projection exposure is completed from within the second area in parallel with the projection exposure process of (E). Unloading said workpiece,
    (G) The first region at the predetermined first stop position and the second region at the predetermined second stop position in (A) to (F) are replaced with each other to perform the process of the next cycle.
    For subsequent cycles, the step of alternately exchanging the first region and the second region,
    A projection exposure method comprising:
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