Devices and analytical techniques are disclosed for measuring the spatial profile of permittivity of a material by multiple wavenumber interrogations. Electrode structures are disclosed which define a number of different fundamental wavelengths (or wavenumbers). Spatially periodic interrogation signals...http://www.google.fr/patents/US4814690?utm_source=gb-gplus-shareBrevet US4814690 - Apparatus and methods for measuring permittivity in materials
Apparatus and methods for measuring permittivity in materials
