A cellular array processor chip potentially having an unknown number of defects randomly located thereon includes a machine readable record of each defect location, integrated thereon. The record can be a PROM that is programmed at, or after, the end of manufacturing testing....http://www.google.fr/patents/US4783782?utm_source=gb-gplus-shareBrevet US4783782 - Manufacturing test data storage apparatus for dynamically reconfigurable cellular array processor chip
Manufacturing test data storage apparatus for dynamically reconfigurable ...
