A replacement for probe cards includes a full wafer contacter. A first surface of the full wafer contacter is brought into contact with, and the contacter is attached to, a wafer, thereby making electrical connection with at least a portion of the contact pads on each of a plurality of integrated circuits...http://www.google.fr/patents/US7282931?utm_source=gb-gplus-shareBrevet US7282931 - Full wafer contacter and applications thereof
