A test signal output circuit comprising a decoder for decoding test-mode signals from test-mode signal input terminals, and selectors each for, in response to the output of this decoder, selecting specified ones of internal signals of the LSI, and outputting them at the test signal output terminals....http://www.google.fr/patents/US5379300?utm_source=gb-gplus-shareBrevet US5379300 - Test signal output circuit for LSI
