What is disclosed is a system for testing a plurality of integrated circuit devices under test (DUTs), that includes a tester having at least one set of tester input/output (I/O) lines, the tester providing data values for testing a single DUT on the set of tester I/O lines, and circuitry coupled to...http://www.google.fr/patents/US6480978?utm_source=gb-gplus-shareBrevet US6480978 - Parallel testing of integrated circuit devices using cross-DUT and within-DUT comparisons
Parallel testing of integrated circuit devices using cross-DUT and within ...
