A test access port (TAP) controls monitoring and testing of static current IDDQ in integrated circuit (IC) devices having both a TAP of the type specified in IEEE Standard 1149.1 Test Access Port and Boundary Architecture and built-in current (BIC) monitors. BIC monitors are coupled between MOS or CMOS...http://www.google.fr/patents/US5459737?utm_source=gb-gplus-shareBrevet US5459737 - Test access port controlled built in current monitor for IC devices
Test access port controlled built in current monitor for IC devices
