Disclosed is a process for analyzing the surface characteristics of opaque materials. The method comprises in one embodiment the use of a UV reflectometer to build a calibration matrix of data from a set of control samples and correlating a desired surface characteristic such as rouglness or surface...http://www.google.fr/patents/US6452678?utm_source=gb-gplus-shareBrevet US6452678 - Reflectance method for evaluating the surface characteristics of opaque materials
Reflectance method for evaluating the surface characteristics of opaque ...
