A testing apparatus is able to test a semiconductor integrated circuit with high observability. The testing apparatus includes a test pattern inputting means 14 for inputting a test pattern for activating a path under test of a semiconductor integrated circuit 20 to the semiconductor integrated circuit,...http://www.google.fr/patents/US6593765?utm_source=gb-gplus-shareBrevet US6593765 - Testing apparatus and testing method for semiconductor integrated circuit
Testing apparatus and testing method for semiconductor integrated circuit
