A method for testing the data strobe window (DQS) and data valid window (tDV) of a memory device (e.g., a DDR-type memory device) using the window strobe of a testing system....http://www.google.fr/patents/US6708298?utm_source=gb-gplus-shareBrevet US6708298 - Method for guaranteeing a minimum data strobe valid window and a minimum data valid window for DDR memory devices
Method for guaranteeing a minimum data strobe valid window and a minimum ...
