A method and apparatus for locating integrated circuit defects associated with different aspects of the integrated circuit industry. The integrated circuit is configured in a known failing mode, with a first power supply providing a constant voltage and variable current. Next, one or more additional...http://www.google.fr/patents/US6617862?utm_source=gb-gplus-shareBrevet US6617862 - Laser intrusive technique for locating specific integrated circuit current paths
Laser intrusive technique for locating specific integrated circuit current paths
