An array of circuit elements which when excited produces voltages is analyzed by examining successive voltage images produced by the circuit elements. Specifically, the array of circuit elements is repeatedly excited at high speed while the voltage image produced by the array is electro-optically sampled...http://www.google.fr/patents/US5391985?utm_source=gb-gplus-shareBrevet US5391985 - Method and apparatus for measuring high speed logic states using voltage imaging with burst clocking
Method and apparatus for measuring high speed logic states using voltage ...
