In one aspect, the invention is an integrated circuit (IC) for use in testing a device. The IC includes a pin electronics (PE) driver having an output and a pin. The IC also includes a buffer connected to the output of the PE driver and the pin. The first voltage measured at the pin is greater than a...http://www.google.fr/patents/US7102375?utm_source=gb-gplus-shareBrevet US7102375 - Pin electronics with high voltage functionality
