Methods are provided to detect, classify and quantify defects such as chips, pits, scratches and cracks in a polished end surface (31) of optical fiber and specifically in an end face of an optical fiber terminated by a ferrule (34). Images of the end face are acquired at each of three focal positions...http://www.google.fr/patents/US5179419?utm_source=gb-gplus-shareBrevet US5179419 - Methods of detecting, classifying and quantifying defects in optical fiber end faces
Methods of detecting, classifying and quantifying defects in optical fiber ...
