A method for determining a characteristic of a magnetic head during its fabrication process on the surface of a wafer substrate. The method involves the fabrication of a test magnetic pole artifact in a field area of the substrate surface adjacent to the actual magnetic pole that is being fabricated....http://www.google.fr/patents/US6779249?utm_source=gb-gplus-shareBrevet US6779249 - Method and device for determining in-process characteristics of fabricated magnetic heads
Method and device for determining in-process characteristics of fabricated ...
