Functional testing of an embedded system is performed by a test control system that implements a peripheral emulation module to interface with an externally accessible port of the embedded system. The test control system implements a test generation processor that operates to autonomously resolve abstracted...http://www.google.fr/patents/US20070011522?utm_source=gb-gplus-shareBrevet US20070011522 - System and methods for functional testing of embedded processor-based systems
System and methods for functional testing of embedded processor-based systems
Numéro de demande: 11/447,181 Numéro de publication: US 2007/0011522 A1 Date de dépôt: 5 juin 2006 Brevet délivré: US7478281 ( Date de délivrance 13 janv. 2009)
